公开(公告)号：US11714124B2

公开(公告)日：2023-08-01

申请号：US17358414

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Hiromitsu Horino ,  Yoshitaka Takeuchi ,  Yoshinori Arai ,  Hiroyuki Kikuchi

IPC: G01R31/28

CPC classification number: G01R31/2893 ,  G01R31/2887

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.

公开(公告)号：US11579189B2

公开(公告)日：2023-02-14

申请号：US17358528

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Yoshinori Arai ,  Yoshitaka Takeuchi ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.

公开(公告)号：US20230341462A1

公开(公告)日：2023-10-26

申请号：US18194138

申请日：2023-03-31

Applicant: ADVANTEST Corporation

Inventor： Akihisa Suda ,  Yoshitaka Takeuchi ,  Takuro Kajihara

IPC: G01R31/28

CPC classification number: G01R31/2893 ,  G01R31/2867

Abstract: An electronic component handling apparatus includes: a pressing device that presses a device under test (DUT) or a carrier containing the DUT against a socket while a test tray having an insert containing the DUT or the carrier is in a vertical state. The pressing device includes: a pusher that contacts the DUT or the carrier; and an abutting part that abuts the insert.

公开(公告)号：US20220026487A1

公开(公告)日：2022-01-27

申请号：US17358528

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Yoshinori Arai ,  Yoshitaka Takeuchi ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.

公开(公告)号：US20220026486A1

公开(公告)日：2022-01-27

申请号：US17358414

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Hiromitsu Horino ,  Yoshitaka Takeuchi ,  Yoshinori Arai ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.