公开(公告)号：US11579189B2

公开(公告)日：2023-02-14

申请号：US17358528

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Yoshinori Arai ,  Yoshitaka Takeuchi ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.

公开(公告)号：US09285393B2

公开(公告)日：2016-03-15

申请号：US13676133

申请日：2012-11-14

Applicant: ADVANTEST CORPORATION

Inventor： Hiroyuki Kikuchi ,  Mitsunori Aizawa

IPC: G01R1/04 ,  G01R31/02 ,  G01R31/01 ,  G01R31/28

CPC classification number: G01R1/0433 ,  G01R1/0466 ,  G01R31/01 ,  G01R31/02 ,  G01R31/2867 ,  G01R31/2874 ,  G01R31/2893

Abstract: Provided is a handler apparatus which can connect devices under test to sockets of a test apparatus quickly and with low power consumption. The handler apparatus for conveying and connecting a plurality of devices under test to a plurality of sockets provided on a test head of a test apparatus, includes a position adjusting section that moves each of the plurality of devices under test on the test tray and adjusts the position thereof to a corresponding one of the plurality of sockets; and a device mounting section that mounts the plurality of devices under test whose positions have been adjusted by the position adjusting section, to the plurality of sockets.

Abstract translation: 提供了一种处理器装置，其能够快速且低功耗地将待测设备连接到测试装置的插座。 用于将被测试的多个设备传送并连接到设置在测试设备的测试头上的多个插座的处理器设备包括：位置调整部件，用于将被测试的多个设备中的每一个移动到测试托盘上并调整 位置到所述多个插座中的对应的一个; 以及装置安装部，其将通过位置调整部调整了位置的多个被测设备安装到多个插座。

公开(公告)号：US11714124B2

公开(公告)日：2023-08-01

申请号：US17358414

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Hiromitsu Horino ,  Yoshitaka Takeuchi ,  Yoshinori Arai ,  Hiroyuki Kikuchi

IPC: G01R31/28

CPC classification number: G01R31/2893 ,  G01R31/2887

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.

公开(公告)号：US20220026487A1

公开(公告)日：2022-01-27

申请号：US17358528

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Yoshinori Arai ,  Yoshitaka Takeuchi ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.

公开(公告)号：US20220026486A1

公开(公告)日：2022-01-27

申请号：US17358414

申请日：2021-06-25

Applicant: ADVANTEST Corporation

Inventor： Hiromitsu Horino ,  Yoshitaka Takeuchi ,  Yoshinori Arai ,  Hiroyuki Kikuchi

IPC: G01R31/28

Abstract: An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: transfer units that each include a DUT transfer part that mounts the DUT on a first tray and removes the DUT from the first tray; contact units that each press the DUT mounted on the first tray against a socket disposed on a test head connected to a tester; and a tray transporter that transports the first tray between the contact units and the transfer units. Either or both of (i) at least one of the contact units and (ii) at least one of the transfer units are removably disposed on the electronic component handling apparatus.

公开(公告)号：US09586760B2

公开(公告)日：2017-03-07

申请号：US14609976

申请日：2015-01-30

Applicant: ADVANTEST CORPORATION

Inventor： Haruki Nakajima ,  Hiroyuki Kikuchi ,  Tsuyoshi Yamashita

IPC: B65G47/00 ,  B65G17/12 ,  G01R31/28 ,  B65G49/06 ,  B65G35/06

CPC classification number: B65G17/12 ,  B65G35/06 ,  G01R31/2893

Abstract: There is provided an electronic device transfer apparatus which has an excellent capacity of transferring DUTs between trays.An electronic device transfer apparatus, which transfers DUTs between trays, includes a device conveying unit. The device conveying unit includes a plurality of shuttles which hold the DUTs, an endless first guide rail which guides the shuttles, and first to third feeders which move the shuttles on the first guide rail. The shuttles are movable on the first guide rail over the entire circumference of the rail.

Abstract translation: 在托盘之间传送DUT的电子设备传送设备包括设备传送单元。 设备传送单元包括多个保持DUT的梭子，引导梭子的环形第一导轨以及在第一导轨上移动梭子的第一至第三馈送器。 梭子可以在轨道的整个圆周上的第一导轨上移动。