-
1.
公开(公告)号:US09755396B1
公开(公告)日:2017-09-05
申请号:US15363570
申请日:2016-11-29
Applicant: ASML Netherlands B.V.
Inventor: Paul Frihauf , Andrew Liu , Spencer Rich , Matthew R. Graham , Steven Chang , Wayne J. Dunstan , Daniel Jason Riggs
CPC classification number: H01S3/102 , H01S3/005 , H01S3/10038 , H01S3/1068 , H01S3/107 , H01S3/2232 , H05G2/003 , H05G2/008
Abstract: A method and apparatus for control of a dose of extreme ultraviolet (EUV) radiation generated by a laser produced plasma (LPP) EUV light source that combines pulse control mode and pulse modulation. The EUV energy created by each pulse is measured and total EUV energy created by the fired pulses determined, a desired energy for the next pulse is determined based upon whether the total EUV energy is greater or less than a desired average EUV energy times the number of pulses. If the desired pulse energy for the next droplet is within the range of one or more pulse modulation actuators, the pulse is modulated; otherwise, the pulse is fired to miss the droplet. This provides greater control of the accumulated dose as well as uniformity of the EUV energy over time, greater ability to compensate for pulses that generate EUV energy that is higher or lower than nominal expected values, and ability to provide an average EUV energy per pulse that is less than the nominal minimum EUV energy per pulse of the system.
-
公开(公告)号:US09832853B2
公开(公告)日:2017-11-28
申请号:US14175730
申请日:2014-02-07
Applicant: ASML Netherlands B.V.
Inventor: Matthew R. Graham , William N. Partlo , Steven Chang , Robert A. Bergstedt
CPC classification number: H05G2/008 , G01B11/0608 , G01B11/26 , H05G2/003 , H05G2/005
Abstract: An extreme ultraviolet light system includes a steering system that steers and focuses an amplified light beam traveling along a propagation direction to a focal plane near a target location within an extreme ultraviolet light chamber, a detection system including at least one detector positioned to detect an image of a laser beam reflected from at least a portion of a target material within the chamber, a wavefront modification system in the path of the reflected laser beam and between the target location and the detection system, and a controller. The wavefront modification system is configured to modify the wavefront of the reflected laser beam as a function of a target focal plane position along the propagation direction. The controller includes logic for adjusting a location of the focal plane of the amplified light beam relative to the target material based on the detected image of the reflected laser beam.
-