公开(公告)号：US20020186477A1

公开(公告)日：2002-12-12

申请号：US09878800

申请日：2001-06-11

Applicant: AXSUN Technologies, Inc.

Inventor： Xiaomei Wang ,  Peter S. Whitney ,  Steven F. Nagle ,  Dale C. Flanders

IPC: G02B007/02

CPC classification number: G02B6/423

Abstract: An optical system assembly technique utilizes a templating system for locating optical components 200 on optical benches 150. Specifically, the template system comprises a template substrate 102 that is placed over the optical bench. The substrate 102 has at least one alignment slot 104 that is formed through the substrate. This alignment slot 104 has an alignment feature 120, against which an optical component 200 is registered. In order to improve the accuracy of the alignment of the optical component on the optical bench, the slot 104 has a reentrant, such as a smooth or step, sidewall 106 extending from the alignment feature 120 into the template substrate 102. This way, there is a single point or near single point of contact between the optical component 200 and the template 102, to thereby improve the placement precision for the optical component on the optical bench 150.

Abstract translation: 光学系统组装技术利用模板系统来定位光学台架150上的光学组件200.具体地，模板系统包括放置在光学台上的模板衬底102。 衬底102具有通过衬底形成的至少一个对准槽104。 该对准狭槽104具有对准特征120，光学部件200对准该对准特征120。 为了提高光学部件在光学工作台上的对准精度，狭槽104具有从对准特征120延伸到模板衬底102中的凹槽，例如平滑或台阶侧壁106。这样，那里 是光学部件200和模板102之间的单点或近点接触点，从而提高光学部件150上的光学部件的放置精度。

公开(公告)号：US20040227946A1

公开(公告)日：2004-11-18

申请号：US10868319

申请日：2004-06-15

Applicant: Axsun Technologies, Inc.

Inventor： Yu Li ,  Peter S. Whitney ,  Jeffrey A. Korn

IPC: G01J003/51 ,  G01N021/25

CPC classification number: G01J3/26 ,  G01J3/02 ,  G01J3/0264 ,  G01J3/28

Abstract: A system and method for fast peak finding in an optical spectrum prioritizes the information it first generates and how the information is then forwarded from the system to a host computer, for example. A spectrum detection subsystem generates a spectrum of an optical signal. An analog-to-digital converter converts the spectrum into sample data. Finally, a data processing subsystem first detects the spectral locations of peaks in the spectrum using the sample data and then uploads the peak information to a host computer before performing processing to determine the shapes of the peaks and/or noise information for the optical signal, for example. The system is thus able to quickly find some information, such as whether or not channels or carriers are present, at what frequency the carriers are operating, and the carriers' power level, and send this information to the host computer. In contrast, information concerning spectral shape or the noise floor sent later in time.

公开(公告)号：US20030108306A1

公开(公告)日：2003-06-12

申请号：US10021765

申请日：2001-12-12

Applicant: AXSUN Technologies, Inc.

Inventor： Peter S. Whitney ,  Jeffrey A. Korn ,  Michael F. Miller ,  Raymond V. Pourmand

IPC: G02B006/42

CPC classification number: G02B6/29362 ,  G02B6/29395 ,  G02B6/4215 ,  G02B6/4251 ,  G02B6/4265 ,  G02B6/4271 ,  G02B6/4285 ,  G02B6/4286

Abstract: In optoelectronic systems, package moisture can affect stress levels in dielectric coatings on MEMS devices. Specifically, as the moisture content in these dielectric coatings changes, there are concomitant changes in the material stress. These changes in material stress can affect the operation of the overall MEMS device. Specifically, in the context of tunable filters, moisture can lead to a drift in the size of the optical resonant cavity over time as changes in material stress affect the MEMS structures. According to the invention, a getter is added to the package to absorb moisture, and thereby stabilize the operation of the optical filter, and specifically prevent uncontrolled drift in the size of its optical cavity.

Abstract translation: 在光电子系统中，封装湿度可以影响MEMS器件上的介电涂层中的应力水平。 具体来说，随着这些电介质涂层中的水分含量发生变化，材料应力随之发生变化。 材料应力的这些变化可能会影响整个MEMS器件的运行。 具体地说，在可调滤波器的上下文中，随着材料应力的变化影响MEMS结构，水分会随着时间的推移导致光学谐振腔的尺寸的漂移。 根据本发明，将吸气剂添加到包装中以吸收水分，从而稳定滤光器的操作，并且特别地防止其光腔的尺寸的不受控制的漂移。

公开(公告)号：US20040022283A1

公开(公告)日：2004-02-05

申请号：US10392357

申请日：2003-03-19

Applicant: Axsun Technologies, Inc.

Inventor： Mark E. Kuznetsov ,  Peter S. Whitney ,  Dale C. Flanders

IPC: H01S003/13

CPC classification number: H01S5/0687 ,  G01J9/0246 ,  H01S5/0617 ,  H01S5/141

Abstract: A wavelength measurement system uses birefringent material waveplate, thereby producing a substantially sinusoidal spectral response. As a result, the responses of multiple birefringent filters can be combined to yield a filter system with a periodic frequency response that has an additive wavelength resolution that is spectrally stable. That is, the wavelength measurement system does not have regions where wavelength resolution is degraded. In one implementation, a waveplate system 112 is used, placed between two blocks of birefringent material 110 and 114. A quadrant detector 116 is used to detect the intensities of the resulting four beams.

Abstract translation: 波长测量系统使用双折射材料波片，从而产生基本上正弦的光谱响应。 结果，可以组合多个双折射滤波器的响应以产生具有频谱稳定的附加波长分辨率的周期性频率响应的滤波器系统。 也就是说，波长测量系统不具有波长分辨率降低的区域。 在一个实现中，使用波片系统112，放置在双折射材料110和114的两个块之间。象限检测器116用于检测所得到的四个光束的强度。