Precision alignment feature using a rod with controlled diameter in a silicon V-groove array
    1.
    发明申请
    Precision alignment feature using a rod with controlled diameter in a silicon V-groove array 有权
    精密对准特征使用在硅V形槽阵列中具有受控直径的杆

    公开(公告)号:US20020176688A1

    公开(公告)日:2002-11-28

    申请号:US09864659

    申请日:2001-05-24

    Inventor: Xiaomei Wang

    Abstract: An bench assembly alignment apparatus and method provides for precision alignment of the assembly with an alignment feature on a substrate. The bench assembly may comprise, for example, a fiber array to be mounted to, and aligned with, an opto-electronic device within a device package. Passive alignment of the bench position and orientation is achieved in a manner that affords improved device yield and increased precision in an economical process that eliminates the need to fabricate an additional alignment surface on the side wall of the bench.

    Abstract translation: 台式组件对准装置和方法提供了组件与衬底上的对准特征的精确对准。 台架组件可以包括例如要安装到设备封装内的光电器件并与其对准的光纤阵列。 实现了台座位置和取向的被动对准,其方式是提供了改进的装置产量并且在经济过程中提高了精度,从而消除了在工作台的侧壁上制造附加对准表面的需要。

    Stray light insensitive detector system and amplifier
    2.
    发明申请
    Stray light insensitive detector system and amplifier 有权
    杂散光不敏感探测器系统和放大器

    公开(公告)号:US20040100686A1

    公开(公告)日:2004-05-27

    申请号:US10392353

    申请日:2003-03-19

    CPC classification number: H01S5/02216 H01S5/02248 H01S5/02284 H01S5/0683

    Abstract: A detector system for a fiber optic component is insensitive to stray light. Specifically, the invention comprises a detector chip, which converts received light into an electric signal. A baffle substrate is positioned over the detector chip. This baffle substrate has a transmission port through which an optical signal is transmitted to the detector chip. As a result, light that is not directed to be transmitted through the port is blocked by the baffle substrate. In this way, it rejects stray light that may be present in the hermetic package. A detector substrate is provided on which the detector chip is mounted. This detector substrate preferably comprises electrical traces to which the detector chip is electrically connected. The detector substrate can further comprise bond pads for wire bonding to make electrical connections to the electrical traces.

    Abstract translation: 用于光纤部件的检测器系统对杂散光不敏感。 具体地,本发明包括将接收的光转换成电信号的检测器芯片。 挡板基板位于检测器芯片上。 该挡板基板具有传输端口,通过该传输端口将光信号传输到检测器芯片。 结果,不被透射通过端口的光被挡板衬底阻挡。 以这种方式,它拒绝可能存在于密封包装中的杂散光。 设置有检测器芯片安装在其上的检测器基板。 该检测器基板优选地包括检测器芯片电连接到的电迹线。 检测器基板还可以包括用于引线键合的接合焊盘以与电迹线进行电连接。

    System and method for tilt mirror calibration due to capacitive sensor drift
    3.
    发明申请
    System and method for tilt mirror calibration due to capacitive sensor drift 有权
    由于电容式传感器漂移,用于倾斜镜校准的系统和方法

    公开(公告)号:US20030025982A1

    公开(公告)日:2003-02-06

    申请号:US09919119

    申请日:2001-07-31

    CPC classification number: G02B26/0841

    Abstract: A movable MEMS mirror system with a mirror position detection system, such as a capacitive sensor, is calibrated using a physical stop with a range of movement of the mirror structure. Thus, drift in the position detection system can be compensated without the need for a separate reference signal source as used in conventional systems.

    Abstract translation: 具有反射镜位置检测系统(诸如电容传感器)的可移动的MEMS镜系统使用具有镜面结构的移动范围的物理停止来校准。 因此,可以补偿位置检测系统中的漂移,而不需要在常规系统中使用的单独的参考信号源。

    Reentrant-walled optical system template and process for optical system fabrication using same
    4.
    发明申请
    Reentrant-walled optical system template and process for optical system fabrication using same 有权
    可重入壁光学系统模板和使用其的光学系统制造工艺

    公开(公告)号:US20020186477A1

    公开(公告)日:2002-12-12

    申请号:US09878800

    申请日:2001-06-11

    CPC classification number: G02B6/423

    Abstract: An optical system assembly technique utilizes a templating system for locating optical components 200 on optical benches 150. Specifically, the template system comprises a template substrate 102 that is placed over the optical bench. The substrate 102 has at least one alignment slot 104 that is formed through the substrate. This alignment slot 104 has an alignment feature 120, against which an optical component 200 is registered. In order to improve the accuracy of the alignment of the optical component on the optical bench, the slot 104 has a reentrant, such as a smooth or step, sidewall 106 extending from the alignment feature 120 into the template substrate 102. This way, there is a single point or near single point of contact between the optical component 200 and the template 102, to thereby improve the placement precision for the optical component on the optical bench 150.

    Abstract translation: 光学系统组装技术利用模板系统来定位光学台架150上的光学组件200.具体地,模板系统包括放置在光学台上的模板衬底102。 衬底102具有通过衬底形成的至少一个对准槽104。 该对准狭槽104具有对准特征120,光学部件200对准该对准特征120。 为了提高光学部件在光学工作台上的对准精度,狭槽104具有从对准特征120延伸到模板衬底102中的凹槽,例如平滑或台阶侧壁106。这样,那里 是光学部件200和模板102之间的单点或近点接触点,从而提高光学部件150上的光学部件的放置精度。

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