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公开(公告)号：US09448125B2
公开(公告)日：2016-09-20
申请号：US13358387
申请日：2012-01-25
CPC分类号： G01K15/00 , G01R19/0084 , G01R35/005
摘要： A method, in one embodiment, can include modeling and calibrating two types of sensors that are part of a semiconductor device. In addition, the method can include determining a temperature and voltage based on data received from the two sensors.
摘要翻译： 在一个实施例中，一种方法可以包括建模和校准作为半导体器件的一部分的两种类型的传感器。 此外，该方法可以包括基于从两个传感器接收的数据来确定温度和电压。
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公开(公告)号：US20130110437A1
公开(公告)日：2013-05-02
申请号：US13358387
申请日：2012-01-25
CPC分类号： G01K15/00 , G01R19/0084 , G01R35/005
摘要： A method, in one embodiment, can include modeling and calibrating two types of sensors that are part of a semiconductor device. In addition, the method can include determining a temperature and voltage based on data received from the two sensors.
摘要翻译： 在一个实施例中，一种方法可以包括建模和校准作为半导体器件的一部分的两种类型的传感器。 此外，该方法可以包括基于从两个传感器接收的数据来确定温度和电压。
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公开(公告)号：US20130027140A1
公开(公告)日：2013-01-31
申请号：US13528725
申请日：2012-06-20
申请人： Wojciech Jakub Poppe , Ilyas Elkin , Puneet Gupta
发明人： Wojciech Jakub Poppe , Ilyas Elkin , Puneet Gupta
CPC分类号： H03K3/0315 , G01R31/2853
摘要： The described systems and methods can facilitate examination of device parameters including analysis of relatively dominant characteristic impacts on delays. In one embodiment, at least some coupling components (e.g., metal layer wires, traces, lines, etc.) have a relatively dominate impact on delays and the delay is in part a function of both capacitance and resistance of the coupling component. In one embodiment, a system comprises a plurality of dominate characteristic oscillating rings, wherein each respective one of the plurality of dominate characteristic oscillating rings includes a respective dominate characteristic. Additional analysis can be performed correlating the dominate characteristic delay impact results with device fabrication and operation.
摘要翻译： 所描述的系统和方法可以便于检查设备参数，包括对延迟的相对主导的特征影响的分析。 在一个实施例中，至少一些耦合部件（例如，金属层导线，迹线，线等）对延迟具有相对主导的影响，延迟部分地是耦合部件的电容和电阻的函数。 在一个实施例中，系统包括多个主要的特征振荡环，其中多个主要特征振荡环中的每一个包括相应的主导特性。 可以进行附加分析，将主导特征延迟影响结果与设备制造和操作相关联。
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公开(公告)号：US20130106524A1
公开(公告)日：2013-05-02
申请号：US13287044
申请日：2011-11-01
申请人： Ilyas Elkin , Wojciech Jakub Poppe
发明人： Ilyas Elkin , Wojciech Jakub Poppe
CPC分类号： H03K3/0315
摘要： Leakage inversion systems and methods are described. A leakage inverter can be configured to transition a signal, wherein a leakage characteristic impacts a transition of the signal. The leakage inverter can be included in an oscillating ring path that outputs an indication of the impacts the leakage characteristic has on a transition of a signal. A leakage inverter can include a leakage transistor coupled in series between a pull up transistor and a pull down transistor, wherein leakage in the leakage transistor impacts at least one transition of the signal. A pull down transition delay can be asymmetric (e.g., fast/slow, short/long, etc.) with respect to a pull up transition delay. Asymmetry can be associated with an effect of the leakage current on a transition of the signal. Results can be utilized in a variety of different analysis (e.g., analyze manufacturing process compliance and defects, leakage current power consumption, etc.).
摘要翻译： 描述了泄漏反演系统和方法。 泄漏逆变器可以被配置为转换信号，其中泄漏特性影响信号的转变。 泄漏逆变器可以包括在振荡环路径中，其输出泄漏特性对信号转变的影响的指示。 泄漏逆变器可以包括串联耦合在上拉晶体管和下拉晶体管之间的泄漏晶体管，其中泄漏晶体管中的泄漏影响信号的至少一个转变。 相对于上拉转换延迟，下拉转换延迟可以是不对称的（例如，快/慢，短/长等）。 不对称性可能与泄漏电流对信号转换的影响相关。 结果可以用于各种不同的分析（例如，分析制造工艺顺应性和缺陷，泄漏电流功率消耗等）。
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公开(公告)号：US09425772B2
公开(公告)日：2016-08-23
申请号：US13528725
申请日：2012-06-20
申请人： Wojciech Jakub Poppe , Ilyas Elkin , Puneet Gupta
发明人： Wojciech Jakub Poppe , Ilyas Elkin , Puneet Gupta
CPC分类号： H03K3/0315 , G01R31/2853
摘要： The described systems and methods can facilitate examination of device parameters including analysis of relatively dominant characteristic impacts on delays. In one embodiment, at least some coupling components (e.g., metal layer wires, traces, lines, etc.) have a relatively dominant impact on delays and the delay is in part a function of both capacitance and resistance of the coupling component. In one embodiment, a system comprises a plurality of dominant characteristic oscillating rings, wherein each respective one of the plurality of dominant characteristic oscillating rings includes a respective dominant characteristic. Additional analysis can be performed correlating the dominant characteristic delay impact results with device fabrication and operation.
摘要翻译： 所描述的系统和方法可以便于检查设备参数，包括对延迟的相对主导的特征影响的分析。 在一个实施例中，至少一些耦合部件（例如，金属层导线，迹线，线等）对延迟具有相对主要的影响，延迟部分地是耦合部件的电容和电阻的函数。 在一个实施例中，系统包括多个主要特征振荡环，其中多个主要特性振荡环中的每个相应的一个包括相应的主要特性。 可以进行附加分析，将主要特征延迟影响结果与器件制造和操作相关联。
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公开(公告)号：US20130021107A1
公开(公告)日：2013-01-24
申请号：US13556129
申请日：2012-07-23
申请人： Wojciech Jakub Poppe , Puneet Gupta , Ilyas Elkin
发明人： Wojciech Jakub Poppe , Puneet Gupta , Ilyas Elkin
IPC分类号： H03K3/03
CPC分类号： H03K3/0315 , G01R31/2831 , G01R31/31725 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Component characteristics analysis systems and methods are described. In one embodiment, a ring oscillator comprises: at least one inversion stage operable to cause a signal transition; a target component that has an increased comparative impact or influence on a signal transition propagation in the ring oscillator; and an output component for outputting an indication of the impact the target component has on the signal transition. The target component can include a plurality of vias from one metal layer to another metal layer. The plurality of vias from one metal layer to another metal layer can be configured in a cell. The vias can correspond to a via layer. In one exemplary implementation, the output is coupled to an analysis component. The analysis component can include correlation of the via resistance into a wafer variations and generate a wafer map. The analysis component can include correlation of the via resistance into a wafer.
摘要翻译： 描述了组件特性分析系统和方法。 在一个实施例中，环形振荡器包括：可操作以引起信号转换的至少一个反转级; 具有对环形振荡器中的信号跃迁传播的增加的比较影响或影响的目标分量; 以及输出部件，用于输出目标部件对信号转换的影响的指示。 目标部件可以包括从一个金属层到另一个金属层的多个通孔。 从一个金属层到另一个金属层的多个通孔可以配置在电池中。 过孔可以对应于通孔层。 在一个示例性实现中，输出耦合到分析组件。 分析组件可以包括通孔电阻与晶片变化的相关性并产生晶片图。 分析组件可以包括通孔电阻与晶片的相关性。
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公开(公告)号：US09496853B2
公开(公告)日：2016-11-15
申请号：US13556129
申请日：2012-07-23
申请人： Wojciech Jakub Poppe , Puneet Gupta , Ilyas Elkin
发明人： Wojciech Jakub Poppe , Puneet Gupta , Ilyas Elkin
IPC分类号： H03K3/03 , G01R31/317 , H01L21/66 , G01R31/28
CPC分类号： H03K3/0315 , G01R31/2831 , G01R31/31725 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Component characteristics analysis systems and methods are described. In one embodiment, a ring oscillator comprises: at least one inversion stage operable to cause a signal transition; a target component that has an increased comparative impact or influence on a signal transition propagation in the ring oscillator; and an output component for outputting an indication of the impact the target component has on the signal transition. The target component can include a plurality of vias from one metal layer to another metal layer, which can be configured in a cell. The vias can correspond to a via layer. In one exemplary implementation, the output is coupled to an analysis component. The analysis component can include correlation of the via resistance into a wafer variations and generate a wafer map and can include correlation of the via resistance into a wafer.
摘要翻译： 描述了组件特性分析系统和方法。 在一个实施例中，环形振荡器包括：可操作以引起信号转换的至少一个反转级; 具有对环形振荡器中的信号跃迁传播的增加的比较影响或影响的目标分量; 以及输出部件，用于输出目标部件对信号转换的影响的指示。 目标部件可以包括从一个金属层到另一个金属层的多个通孔，其可以配置在电池中。 过孔可以对应于通孔层。 在一个示例性实现中，输出耦合到分析组件。 分析组件可以包括通孔电阻与晶片变化的相关性并产生晶片图，并且可以包括通孔电阻与晶片的相关性。
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公开(公告)号：US08952705B2
公开(公告)日：2015-02-10
申请号：US13287053
申请日：2011-11-01
申请人： Ilyas Elkin , Wojciech Jakub Poppe
发明人： Ilyas Elkin , Wojciech Jakub Poppe
CPC分类号： G01R31/2882 , G01R31/3016
摘要： Systems and methods for transition delay measuring are presented. A transition delay measuring method can include oscillating a signal between states and tracking an indication associated with an isolated attribute of the transitions between the states. Oscillations can include asymmetric transitions between the states and the tracked isolated attribute can be a delay in completing transitions between the states in one direction or vice versa. The asymmetric transitions can include transitions between the first state and the second state that are faster than slower transitions between the second state and the first state or vice versa. The tracked indication can be utilized in analysis of the isolated transition delay characteristics. The results can be utilized in analysis of various further features and characteristics (e.g., examination of leakage current related power consumption, timing of asymmetric operation, etc.). The analysis can include examination of fabrication process and operating parameters.
摘要翻译： 提出了用于过渡延迟测量的系统和方法。 转移延迟测量方法可以包括在状态之间振荡信号并且跟踪与状态之间的转换的隔离属性相关联的指示。 振荡可以包括状态之间的不对称转换，跟踪的隔离属性可以是在一个方向上完成状态之间的转换的延迟，反之亦然。 非对称转变可以包括在第一状态和第二状态之间的转变，其比第二状态和第一状态之间的较慢的转变更快，反之亦然。 跟踪的指示可以用于分析过渡延迟特性。 结果可用于分析各种其他特征和特性（例如，检查泄漏电流相关功率消耗，非对称操作的定时等）。 分析可以包括制造工艺和操作参数的检查。
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公开(公告)号：US20130106438A1
公开(公告)日：2013-05-02
申请号：US13287053
申请日：2011-11-01
申请人： Ilyas Elkin , Wojciech Jakub Poppe
发明人： Ilyas Elkin , Wojciech Jakub Poppe
IPC分类号： G01R27/28
CPC分类号： G01R31/2882 , G01R31/3016
摘要： Systems and methods for transition delay measuring are presented. A transition delay measuring method can include oscillating a signal between states and tracking an indication associated with an isolated attribute of the transitions between the states. Oscillations can include asymmetric transitions between the states and the tracked isolated attribute can be a delay in completing transitions between the states in one direction or vice versa. The asymmetric transitions can include transitions between the first state and the second state that are faster than slower transitions between the second state and the first state or vice versa. The tracked indication can be utilized in analysis of the isolated transition delay characteristics. The results can be utilized in analysis of various further features and characteristics (e.g., examination of leakage current related power consumption, timing of asymmetric operation, etc.). The analysis can include examination of fabrication process and operating parameters.
摘要翻译： 提出了用于过渡延迟测量的系统和方法。 转移延迟测量方法可以包括在状态之间振荡信号并且跟踪与状态之间的转换的隔离属性相关联的指示。 振荡可以包括状态之间的不对称转换，跟踪的隔离属性可以是在一个方向上完成状态之间的转换的延迟，反之亦然。 非对称转变可以包括在第一状态和第二状态之间的转变，其比第二状态和第一状态之间的较慢的转变更快，反之亦然。 跟踪的指示可以用于分析过渡延迟特性。 结果可用于分析各种其他特征和特性（例如，检查泄漏电流相关功率消耗，非对称操作的定时等）。 分析可以包括制造工艺和操作参数的检查。
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