公开(公告)号：US20240203034A1

公开(公告)日：2024-06-20

申请号：US18081422

申请日：2022-12-14

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： David William John Pankratz ,  David Kirk McAllister ,  Daniel James Skinner ,  Michael John Livesley ,  David Ronald Oldcorn

IPC: G06T15/06

CPC classification number: G06T15/06 ,  G06T2210/12

Abstract: A technique for performing ray tracing operations is provided. The technique includes, testing a plurality of bounding boxes for intersection with a ray in parallel, wherein the plurality of bounding boxes are specified by a plurality of box data items of a parent box node of a bounding volume hierarchy; determining that, for a first child node that is pointed to by a two or more node pointers specified by two or more box data items of the plurality of box data items, at least one bounding box specified by the two or more box data items is intersected by the ray; and in response to the determining, traversing to the first child node.

公开(公告)号：US11908065B2

公开(公告)日：2024-02-20

申请号：US17844677

申请日：2022-06-20

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： Daniel James Skinner ,  Michael John Livesley ,  David William John Pankratz

IPC: G06T15/06 ,  G06T17/10 ,  G06T15/08

CPC classification number: G06T15/06 ,  G06T15/08 ,  G06T17/10 ,  G06T2210/21

Abstract: A technique for performing ray tracing operations is provided. The technique includes, in response to detecting that a threshold number of traversal stage work-items of a wavefront have terminated, increasing intersection test parallelization for non-terminated work-items.

公开(公告)号：US20240212259A1

公开(公告)日：2024-06-27

申请号：US18089442

申请日：2022-12-27

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： David William John Pankratz ,  Daniel James Skinner ,  Michael John Livesley

IPC: G06T15/06

CPC classification number: G06T15/06 ,  G06T2210/21 ,  G06T2210/52

Abstract: An implementation comprises traversing a bounding volume hierarchy for each ray of a plurality of rays concurrently using a plurality of execution items. In response to determining that a first execution item of the plurality of execution items is finished traversing the bounding volume hierarchy for a first ray of the plurality rays, the embodiment causes the first execution item to traverse the bounding volume hierarchy for a second ray of the plurality of rays while a second execution item of the plurality of execution items traverses the bounding volume hierarchy for the second ray. And the embodiment comprises initiating side-effects with the first and second execution items in an order indicated by the bounding volume hierarchy.

公开(公告)号：US20240203032A1

公开(公告)日：2024-06-20

申请号：US18081387

申请日：2022-12-14

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： David William John Pankratz ,  David Ronald Oldcorn ,  Daniel James Skinner ,  Michael John Livesley ,  David Kirk McAllister

IPC: G06T15/06

CPC classification number: G06T15/06 ,  G06T2210/12

Abstract: A technique for performing ray tracing operations is provided. The technique includes identifying triangles to include in a compressed triangle block; storing data common to the identified triangles as common data of the compressed triangle block; and storing data unique to the identified triangles as unique data of the compressed triangle block.

公开(公告)号：US20230410426A1

公开(公告)日：2023-12-21

申请号：US17843075

申请日：2022-06-17

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Miikka Kangasluoma ,  Kiia Kallio ,  Daniel James Skinner

IPC: G06T17/10 ,  G06T17/00 ,  G06T15/08

CPC classification number: G06T17/10 ,  G06T17/005 ,  G06T15/08 ,  G06T2210/21

Abstract: One or more rotated bounding volumes are generated for one or more nodes of a bounding volume hierarchy (BVH). Volume intersection ray tracing tests are then be performed using the rotated bounding volumes with the aim of reducing the number of calculations required relative to an original, non-rotated bounding volume. Rotated bounding volumes are selected from a plurality of candidate rotations, and selection of one of the candidate rotations are based on surface areas, such as minimum total surface areas, of bounding volumes corresponding to each of the candidate rotations. In order to minimize data storage and increase performance, a number of candidate rotations may be limited to a predetermined set of rotations.

公开(公告)号：US12190447B2

公开(公告)日：2025-01-07

申请号：US17843075

申请日：2022-06-17

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Miikka Kangasluoma ,  Kiia Kallio ,  Daniel James Skinner

IPC: G06T17/10 ,  G06T15/08 ,  G06T17/00

Abstract: One or more rotated bounding volumes are generated for one or more nodes of a bounding volume hierarchy (BVH). Volume intersection ray tracing tests are then be performed using the rotated bounding volumes with the aim of reducing the number of calculations required relative to an original, non-rotated bounding volume. Rotated bounding volumes are selected from a plurality of candidate rotations, and selection of one of the candidate rotations are based on surface areas, such as minimum total surface areas, of bounding volumes corresponding to each of the candidate rotations. In order to minimize data storage and increase performance, a number of candidate rotations may be limited to a predetermined set of rotations.

公开(公告)号：US20240221284A1

公开(公告)日：2024-07-04

申请号：US18090689

申请日：2022-12-29

Applicant: Advanced Micro Devices, Inc.

Inventor： Sean Keely ,  Daniel James Skinner

IPC: G06T15/06

CPC classification number: G06T15/06 ,  G06T2210/12

Abstract: A technique for performing ray tracing operations is provided. The technique includes determining error bounds for a rotation operation for a ray; selecting a technique for determining whether the ray intersects a bounding box based on the error bounds; and determining whether the ray hits the bounding box based on the selected technique.

公开(公告)号：US20240203033A1

公开(公告)日：2024-06-20

申请号：US18081407

申请日：2022-12-14

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： David William John Pankratz ,  David Kirk McAllister ,  David Ronald Oldcorn ,  Michael John Livesley ,  Daniel James Skinner

IPC: G06T15/06 ,  G06T15/08 ,  G06T15/80

CPC classification number: G06T15/06 ,  G06T15/08 ,  G06T15/80

Abstract: A technique for performing ray tracing operations is provided. The technique includes, in a first iteration of a ray traversal technique, traversing to an instance node of a bounding volume hierarchy; in a second iteration of the ray traversal technique that is subsequent to the first iteration, transforming a ray based on an instance transform of the instance node to generate a transformed ray; and in the second iteration, performing a ray-box intersection test for box node data of the instance node based on the transformed ray.

公开(公告)号：US20230298256A1

公开(公告)日：2023-09-21

申请号：US17844677

申请日：2022-06-20

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： Daniel James Skinner ,  Michael John Livesley ,  David William John Pankratz

IPC: G06T15/06 ,  G06T15/08 ,  G06T17/10

CPC classification number: G06T15/06 ,  G06T15/08 ,  G06T17/10 ,  G06T2210/21

Abstract: A technique for performing ray tracing operations is provided. The technique includes, in response to detecting that a threshold number of traversal stage work-items of a wavefront have terminated, increasing intersection test parallelization for non-terminated work-items.