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公开(公告)号：US20150187555A1
公开(公告)日：2015-07-02
申请号：US14571858
申请日：2014-12-16
发明人： Kazushi Hirano , Jun Kitamoto
CPC分类号： H01J49/061 , H01J49/42
摘要： A mass spectrometer includes: a plasma generation device for generating plasma for ionizing an introduced sample; an interface device for drawing the plasma into vacuum; an ion lens device for extracting and inducing ions as an ion beam from the plasma; a collision/reaction cell for removing an interference ion from the ion beam; a mass analyzer or filter for allowing a predetermined ion in the ion beam from the collision/reaction cell to pass along a first axis based on a mass-to-charge ratio; an ion detector for detecting the ion; an ion deflection device before the mass analyzer, and also an ion deflection device between the mass analyzer and the ion detector. The mass spectrometer reduces background noises in a mass analyzer by removing neutral particles from the ion beam without reducing the measurement sensitivity on ions to be analyzed as much as possible.
摘要翻译： 质谱仪包括：等离子体产生装置，用于产生用于离子化引入的样品的等离子体; 用于将等离子体吸入真空的接口装置; 离子透镜装置，用于从等离子体中提取和诱导离子作为离子束; 用于从离子束去除干扰离子的碰撞/反应池; 质量分析器或过滤器，用于允许来自碰撞/反应池的离子束中的预定离子基于质荷比沿着第一轴线通过; 用于检测离子的离子检测器; 质量分析仪之前的离子偏转装置，以及质量分析器和离子检测器之间的离子偏转装置。 质谱仪通过从离子束中除去中性粒子而降低质量分析仪背景噪声，而不会尽可能降低对待分析的离子的测量灵敏度。
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公开(公告)号：US09418826B2
公开(公告)日：2016-08-16
申请号：US14571858
申请日：2014-12-16
发明人： Kazushi Hirano , Jun Kitamoto
CPC分类号： H01J49/061 , H01J49/42
摘要： A mass spectrometer includes: a plasma generation device for generating plasma for ionizing an introduced sample; an interface device for drawing the plasma into vacuum; an ion lens device for extracting and inducing ions as an ion beam from the plasma; a collision/reaction cell for removing an interference ion from the ion beam; a mass analyzer or filter for allowing a predetermined ion in the ion beam from the collision/reaction cell to pass along a first axis based on a mass-to-charge ratio; an ion detector for detecting the ion; an ion deflection device before the mass analyzer, and also an ion deflection device between the mass analyzer and the ion detector. The mass spectrometer reduces background noises in a mass analyzer by removing neutral particles from the ion beam without reducing the measurement sensitivity on ions to be analyzed as much as possible.
摘要翻译： 质谱仪包括：等离子体产生装置，用于产生用于离子化引入的样品的等离子体; 用于将等离子体吸入真空的接口装置; 离子透镜装置，用于从等离子体中提取和诱导离子作为离子束; 用于从离子束去除干扰离子的碰撞/反应池; 质量分析器或过滤器，用于允许来自碰撞/反应池的离子束中的预定离子基于质荷比沿着第一轴线通过; 用于检测离子的离子检测器; 质量分析仪之前的离子偏转装置，以及质量分析器和离子检测器之间的离子偏转装置。 质谱仪通过从离子束中除去中性粒子而降低质量分析仪背景噪声，而不会尽可能降低对待分析的离子的测量灵敏度。
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公开(公告)号：US20150187550A1
公开(公告)日：2015-07-02
申请号：US14571701
申请日：2014-12-16
发明人： Kazushi Hirano
CPC分类号： H01J49/025 , H01J43/26 , H01J43/30
摘要： A secondary electron multiplier includes: a conversion dynode for emitting a secondary electron in response to an incident ion; a plurality of dynodes configured to have multi-stages from second to final stages for receiving the secondary electron; and a first voltage applying device for applying a first negative voltage to the conversion dynode and sequentially dividing the first negative voltage to apply to each of the second-stage and subsequent dynodes, wherein the secondary electron multiplier is configured to sequentially multiply the emitted secondary electron by the second-stage and subsequent dynodes. In the secondary electron multiplier, any of the second-stage and subsequent dynodes have a second voltage applying device for applying a second negative voltage. The secondary electron multiplier has an improved ion detection efficiency without a large reduction of a usable period thereof, thereby enhancing the sensitivity of a mass spectrometer.
摘要翻译： 二次电子倍增器包括：用于响应于入射离子发射二次电子的转换倍增电极; 多个倍增电极被配置为具有从第二级到第二级的多级，用于接收二次电子; 以及第一电压施加装置，用于将第一负电压施加到转换倍增电极，并且顺序地分割第一负电压以施加到每个第二级和随后的倍增电极，其中二次电子倍增器被配置为顺序地将发射的二次电子 通过第二级和后续的倍增极。 在二次电子倍增器中，任何第二级和随后的倍增电极都具有用于施加第二负电压的第二电压施加装置。 二次电子倍增器具有改善的离子检测效率，而不会大大降低可用的周期，从而提高了质谱仪的灵敏度。
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