摘要:
In an I/O card that can be inserted into a slot of an electronic device and supplied with electricity therefrom, a first connector can engage a connector provided in the slot of the electronic device. A second connector can engage an external connector of an interconnection cable used to connect the I/O card to an external device. A circuit notifies the electronic device that the I/O card has been loaded to the slot thereof when the external connector is connected to the second connector of the I/o card inserted into the slot. The I/O card receives a supply of electricity from the electronic device, the supply being started after the electronic device is notified by the circuit.
摘要:
Provided are a semiconductor inspection device and a semiconductor inspection method such that in a specimen image in a single field of view obtained by an electron microscope, it is possible to suppress variations in the edge position measurement error attributable to the materials and structures of the lower layers of measured patterns by a first method, wherein the area in the field of view obtained by electron beam scanning is divided into a plurality of regions on the basis of information regarding the structures and materials of the object to be observed and the electron beam scanning conditions are changed for individual regions (805, 806), a second method, wherein, the image processing conditions are changed for individual regions resulting from division of the obtained images, or a third method, wherein the edge detection conditions are changed for individual regions resulting from the division within the edge inspection regions of the obtained images.
摘要:
A vehicle wheel comprises a rim (172) and a disk section (171) separate from the rim. Since the disk section is separate from the rim, the freedom of designing the disk section is improved. The rim comprises an outer rim (178) and an inner rim (181) separate from the outer rim. The outer and inner rims are attached to the outer periphery of the disk section at the same place by welding.
摘要:
A brake caliper support structure and a brake caliper structure for a saddle-ride type all terrain vehicle can attain a reduction in size and weight of a disc brake and can scrape off mud and snow accumulated within a wheel. A distance from a point which represents the center of a front wheel to each of points which represent the axes of bolts located at the same positions as the caliper support portions or the first and second mounting portions of the caliper bracket is set longer than the distance from the point to a point which represents the center of a piston. A brake hose is to be prevented from undergoing an excessively large deflection during steering or during vehicular vibration.
摘要:
Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays them as indexes. The equipment acquires data of edge roughness over a sufficiently long area, integrates a components corresponding to a spatial frequency region being set on a power spectrum by the operator, and displays them on a length measuring SEM. Alternatively, the equipment divides the edge roughness data of the sufficiently long area, computes long-period roughness and short-period roughness that correspond to an arbitrary inspection area by performing statistical processing and fitting based on theoretical calculation, and displays them on the length measuring SEM.
摘要:
Provided are a semiconductor inspection device and a semiconductor inspection method such that in a specimen image in a single field of view obtained by an electron microscope, it is possible to suppress variations in the edge position measurement error attributable to the materials and structures of the lower layers of measured patterns by a first method, wherein the area in the field of view obtained by electron beam scanning is divided into a plurality of regions on the basis of information regarding the structures and materials of the object to be observed and the electron beam scanning conditions are changed for individual regions (805, 806), a second method, wherein, the image processing conditions are changed for individual regions resulting from division of the obtained images, or a third method, wherein the edge detection conditions are changed for individual regions resulting from the division within the edge inspection regions of the obtained images.
摘要:
A quantity (or dispersion value) of a distribution of edge position due to random noise is expected to be reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with various values of parameter S, and then the edge roughness index is calculated. The S-dependence of the edge roughness index is analyzed and a term of a dispersion value directly proportional to 1/S is determined as being due to noise.
摘要:
A brake caliper support structure and a brake caliper structure for a saddle-ride type all terrain vehicle can attain a reduction in size and weight of a disc brake and can scrape off mud and snow accumulated within a wheel. A distance from a point which represents the center of a front wheel to each of points which represent the axes of bolts located at the same positions as the caliper support portions or the first and second mounting portions of the caliper bracket is set longer than the distance from the point to a point which represents the center of a piston. A brake hose is to be prevented from undergoing an excessively large deflection during steering or during vehicular vibration.