Method and apparatus using non-contact measuring device to determine rail distance traveled
    1.
    发明授权
    Method and apparatus using non-contact measuring device to determine rail distance traveled 有权
    使用非接触测量装置确定行驶距离的方法和装置

    公开(公告)号:US08149160B2

    公开(公告)日:2012-04-03

    申请号:US12913666

    申请日:2010-10-27

    IPC分类号: G01S13/08

    摘要: A non-contact, distance traveled measurement system (DTMS) to calculate speed and distance traveled by a vehicle over rails—more specifically, by trains traveling on standard railroad tracks. Preferably, a pair of short range (near field) microwave-based transmitters/sensors (transceivers) are mounted on the underside of the train and used to key on rail-bed features such as cross ties or tie plates. Preferred embodiments also include infrared sensors as a redundant channel that is less sensitive to moisture in the track bed. Data from the sensors is correlated to determine the time delay between the first and second sensors' passage over objects on the rail bed such as cross-ties or tie-plates. From this time delay, nearly instantaneous velocity can be computed at each given target such as a tie plate (metal target) or a tie (dielectric contrast target). Velocity versus time curves can be integrated over time to derive distance traveled.

    摘要翻译: 一种非接触式距离行驶测量系统(DTMS),用于计算车辆在轨道上行驶的速度和距离,特别是通过在标准铁轨上行驶的列车。 优选地,一对短距离(近场)基于微波的发射器/传感器(收发器)安装在火车的下侧,并用于键入诸如十字架或连接板的轨道床特征。 优选实施例还包括红外传感器作为对轨道床中的水分较不敏感的冗余通道。 来自传感器的数据相关联,以确定第一和第二传感器通过轨道床上的物体(例如交叉连接或连接板)之间的时间延迟。 从该时间延迟,可以在每个给定的目标例如连接板(金属靶)或连接(介电对比目标)处计算几乎瞬时的速度。 速度与时间曲线可以随着时间的推移积分,以得出旅行距离。

    Self-sealing fastener
    2.
    发明授权
    Self-sealing fastener 有权
    自密封紧固件

    公开(公告)号:US09068583B2

    公开(公告)日:2015-06-30

    申请号:US13287791

    申请日:2011-11-02

    IPC分类号: F16B1/00 F16B19/00

    摘要: An apparatus for making and using a fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to a moisture source. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a premature cure indicator that provides a visual indication that the outer moisture resistant layer has been damaged.

    摘要翻译: 一种用于制造和使用适用于飞机制造或修理的紧固件的设备,其被涂覆有预混合的湿固化密封剂。 密封剂层被涂覆有易碎的防潮层,当紧固件安装时将会分裂,从而将密封剂暴露于湿气源。 一旦露出湿气,密封剂就会开始固化。 优选的实施方案还提供了一种过早的固化指示剂,其提供外部防潮层已被损坏的视觉指示。

    Method and Apparatus for Nondestructive Measuring of a Coating Thickness on a Curved Surface
    3.
    发明申请
    Method and Apparatus for Nondestructive Measuring of a Coating Thickness on a Curved Surface 失效
    弯曲表面涂层厚度无损检测方法与装置

    公开(公告)号:US20110050248A1

    公开(公告)日:2011-03-03

    申请号:US12851439

    申请日:2010-08-05

    IPC分类号: G01R27/04 G01N21/55

    CPC分类号: G01B15/02

    摘要: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.

    摘要翻译: 一种改进的方法和装置,用于通过测量从表面反射的微波能量的组分对弯曲表面上的涂层厚度进行非破坏性测量。 本发明的优选实施例提供一种便携式微波厚度检测器,其具有圆形摇杆式底座,允许微波束相对于目标表面移动一定范围的角度。 当测量反射微波能量的分量时,光学对准系统确定微波入射角何时处于所需角度。 本发明的优选实施例还提供一种便携式微波厚度检测器,其在微波检测器和待测量样品之间保持恒定的间隔距离。

    Apparatuses and methods for nondestructive microwave measurement of dry and wet film thickness
    4.
    发明授权
    Apparatuses and methods for nondestructive microwave measurement of dry and wet film thickness 失效
    干膜和湿膜无损微波测量的设备和方法

    公开(公告)号:US07339382B1

    公开(公告)日:2008-03-04

    申请号:US11271461

    申请日:2005-11-10

    IPC分类号: G01R27/32

    CPC分类号: G01B15/02

    摘要: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film. In one embodiment, sensors are associated with a coating applicator, with a first sensor preceding the applicator and a second sensor following the applicator to measure the thickness of the film applied by the applicator by comparing measurements before and after coating.

    摘要翻译: 使用校准的微波传感器可以非结构地测量湿和干膜厚度,例如与船只,飞机和建筑物相关的表面等结构上。 通过将微波能量引向胶片来测量胶片。 微波能量通过膜并被膜下面的反射或半反射的衬底表面反射。 将反射波的性质与通过已知厚度的校准样品的反射波的性质进行比较,以确定膜的未知厚度。 在一些实施例中,一个或多个传感器被保持在用于测量的导电/半导体衬底上方的固定高度处,并且在其他实施例中,一个或多个传感器保持在胶片上方的固定高度。 在一个实施例中,传感器与涂布器相关联,第一传感器位于施用器之前,第二传感器跟随施加器,以通过比较涂覆之前和之后的测量来测量施用器施加的膜的厚度。

    Method and apparatus for nondestructive measuring of a coating thickness on a curved surface
    7.
    发明授权
    Method and apparatus for nondestructive measuring of a coating thickness on a curved surface 失效
    弯曲表面涂层厚度的非破坏性测量方法和装置

    公开(公告)号:US08581602B2

    公开(公告)日:2013-11-12

    申请号:US12851439

    申请日:2010-08-05

    IPC分类号: G01R27/04 G01R27/32

    CPC分类号: G01B15/02

    摘要: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.

    摘要翻译: 一种改进的方法和装置,用于通过测量从表面反射的微波能量的组分对弯曲表面上的涂层厚度进行非破坏性测量。 本发明的优选实施例提供一种便携式微波厚度检测器,其具有圆形摇杆式底座,允许微波束相对于目标表面移动一定范围的角度。 当测量反射微波能量的分量时,光学对准系统确定微波入射角何时处于所需角度。 本发明的优选实施例还提供一种便携式微波厚度检测器,其在微波检测器和待测量样品之间保持恒定的间隔距离。

    Non-conductive coatings for underwater connector backshells
    8.
    发明授权
    Non-conductive coatings for underwater connector backshells 失效
    用于水下连接器后壳的非导电涂层

    公开(公告)号:US5942333A

    公开(公告)日:1999-08-24

    申请号:US410805

    申请日:1995-03-27

    IPC分类号: B05B7/20 B32B9/00

    CPC分类号: B05B7/20 Y10T428/31692

    摘要: Metal surfaces treated with non-conductive metal oxides having enhanced non-conductive characteristics are disclosed. Durability and bond strength to polymer and metal surfaces is improved relative to non-treated metal surfaces. Methods of using metal surfaces with at least one non-conductive metal oxide coating in marine and under water applications are also described wherein cathodic delamination at the metal surface and a polymer is reduced, thus increasing the relative useful life of devices whose metal surfaces have been so treated. Methods for increasing bond strength and adhesiveness between metal surfaces wherein the metal surface is treated to include a metal oxide coat, such as a mixture of aluminum oxide and titanium oxide, are also described. The non-conductive metal oxide, or other non-conductive metal nitrides, carbides, borides or fluorides, coatings include at least about 20% to about 100% of the non-conductive metal oxide.

    摘要翻译: 公开了用具有增强的非导电特性的非导电金属氧化物处理的金属表面。 相对于未经处理的金属表面,聚合物和金属表面的耐久性和粘结强度得到改善。 还描述了在海洋和水中应用中使用具有至少一种非导电金属氧化物涂层的金属表面的方法,其中金属表面和聚合物处的阴极分层减少,从而增加其金属表面已经被器件的相对使用寿命 如此对待 还描述了用于增加金属表面之间的粘合强度和粘合强度的方法,其中金属表面被处理为包括金属氧化物涂层,例如氧化铝和氧化钛的混合物。 非导电金属氧化物或其它非导电金属氮化物,碳化物,硼化物或氟化物涂层包括至少约20%至约100%的非导电金属氧化物。

    APPARATUSES AND METHODS FOR NONDESTRUCTIVE MICROWAVE MEASUREMENT OF DRY AND WET FILM THICKNESS
    10.
    发明申请
    APPARATUSES AND METHODS FOR NONDESTRUCTIVE MICROWAVE MEASUREMENT OF DRY AND WET FILM THICKNESS 失效
    干燥和湿膜厚度非结构微波测量的装置和方法

    公开(公告)号:US20090066344A1

    公开(公告)日:2009-03-12

    申请号:US12041470

    申请日:2008-03-03

    IPC分类号: G01R27/00

    CPC分类号: G01B15/02

    摘要: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film. In one embodiment, sensors are associated with a coating applicator, with a first sensor preceding the applicator and a second sensor following the applicator to measure the thickness of the film applied by the applicator by comparing measurements before and after coating.

    摘要翻译: 使用校准的微波传感器可以非结构地测量湿和干膜厚度,例如与船只,飞机和建筑物相关的表面等结构上。 通过将微波能量引向胶片来测量胶片。 微波能量通过膜并被膜下面的反射或半反射的衬底表面反射。 将反射波的性质与通过已知厚度的校准样品的反射波的性质进行比较,以确定膜的未知厚度。 在一些实施例中,一个或多个传感器被保持在用于测量的导电/半导体衬底上方的固定高度处,并且在其他实施例中,一个或多个传感器保持在胶片上方的固定高度。 在一个实施例中,传感器与涂布器相关联,第一传感器位于施用器之前,第二传感器跟随施加器,以通过比较涂覆之前和之后的测量来测量施用器施加的膜的厚度。