摘要:
A method of increasing ion throughput within an accumulator, an energy lift and a pulsed ion extractor, operated in that order upon a batch of ions, comprising the steps of: firstly loading a batch of ions into the accumulator; secondly changing the electrical potential of the energy lift to raise the energy of the batch of ions contained therein; and thirdly ejecting the batch of ions from the pulsed ion extractor; and wherein: the energy lift is a separate device from the accumulator and the pulsed ion extractor, and whilst changing the electrical potential in the second step a fresh batch of ions is loaded into the accumulator and/or a previous batch of ions is prepared for ejection in the pulsed ion extractor; or the energy lift is incorporated into the pulsed ion extractor and whilst changing the electrical potential in the second step a fresh batch of ions is loaded into the accumulator; or the energy lift is incorporated into the accumulator and whilst changing the electrical potential in the second step a previous batch of ions is prepared for ejection in the pulsed ion extractor. A charged particle analyzer system is also provided.
摘要:
A method of increasing ion throughput within an accumulator, an energy lift and a pulsed ion extractor, operated in that order upon a batch of ions, comprising the steps of: firstly loading a batch of ions into the accumulator; secondly changing the electrical potential of the energy lift to raise the energy of the batch of ions contained therein; and thirdly ejecting the batch of ions from the pulsed ion extractor; and wherein: the energy lift is a separate device from the accumulator and the pulsed ion extractor, and whilst changing the electrical potential in the second step a fresh batch of ions is loaded into the accumulator and/or a previous batch of ions is prepared for ejection in the pulsed ion extractor; or the energy lift is incorporated into the pulsed ion extractor and whilst changing the electrical potential in the second step a fresh batch of ions is loaded into the accumulator; or the energy lift is incorporated into the accumulator and whilst changing the electrical potential in the second step a previous batch of ions is prepared for ejection in the pulsed ion extractor. A charged particle analyzer system is also provided.
摘要:
Methods and analyzers useful for time of flight mass spectrometry are provided. A method of determining properties of ions within a time of flight or electrostatic trap mass analyzer comprises the steps of: injecting ions into the mass analyzer; causing the ions to follow a portion of a main flight path within the mass analyzer, the main flight path comprising multiple changes of direction; applying a beam deflection to deflect at least some of the ions from the main flight path so that they impinge upon a detection surface located within the mass analyzer, the detection surface comprising part of an active field-sustaining electrode of the mass analyzer; measuring a quantity representative of the charge arriving at the detection surface caused by the impinging ions; determining, from the deflection applied, properties of a trajectory upon which the ions were travelling immediately prior to deflection, and/or determining, from the quantity measured, a value representative of the number of the ions that impinged upon the detector surface; and wherein the analyzer utilises an analyzer field, the detection surface sustains the analyzer field in its vicinity, and the analyzer field in the vicinity of the detection surface is substantially non-zero.
摘要:
Methods and analyzers useful for time of flight mass spectrometry are provided. A method of determining properties of ions within a time of flight or electrostatic trap mass analyzer comprises the steps of: injecting ions into the mass analyzer; causing the ions to follow a portion of a main flight path within the mass analyzer, the main flight path comprising multiple changes of direction; applying a beam deflection to deflect at least some of the ions from the main flight path so that they impinge upon a detection surface located within the mass analyzer, the detection surface comprising part of an active field-sustaining electrode of the mass analyzer; measuring a quantity representative of the charge arriving at the detection surface caused by the impinging ions; determining, from the deflection applied, properties of a trajectory upon which the ions were travelling immediately prior to deflection, and/or determining, from the quantity measured, a value representative of the number of the ions that impinged upon the detector surface; and wherein the analyzer utilises an analyzer field, the detection surface sustains the analyzer field in its vicinity, and the analyzer field in the vicinity of the detection surface is substantially non-zero.
摘要:
Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X|/2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m/z from the analyser or detecting the at least some of charged particles having a plurality of m/z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
摘要:
A method of separating charged particles using an analyser is provided, the method comprising: causing a beam of charged particles to fly through the analyser and undergo within the analyser at least one full oscillation in the direction of an analyser axis (z) of the analyser whilst orbiting about the axis (z) along a main flight path; constraining the arcuate divergence of the beam as it flies through the analyser; and separating the charged particles according to their flight time. An analyser for performing the method is also provided. At least one arcuate focusing lens is preferably used to constrain the divergence, which may comprise a pair of opposed electrodes located either side of the beam. An array of arcuate focusing lenses may be used which are located at substantially the same z coordinate, the arcuate focusing lenses in the array being spaced apart in the arcuate direction and the array extending at least partially around the z axis, thereby constraining the arcuate divergence of the beam a plurality of times as it flies through the analyser.
摘要:
This invention relates to a method of operating a charged particle trap in which ions undergo multiple reflections back and forth and/or follow a closed orbit around, usually, a set of electrodes. The invention allows high-performance isolation of multiple ion species for subsequent detection or fragmentation by deflecting ions out of the ion trap according to a timing scheme calculated with reference to the ions' periods of oscillation within the ion trap.
摘要:
Mass spectrometry apparatus 105 comprises a serial arrangement of an ion source 110, first time of flight means, a field free region 120, means to fragment the molecules, a second time of flight means and a large area detector 160. The second time of flight means includes an ion mirror 150, the ion mirror 150 being arranged to produce a reflecting substantially quadratic field. The first time of flight means is arranged to provide spatial focusing concomitant with time focusing of ions at or near the entrance to the ion mirror 150. The means provided to fragment the ions front the first time of flight means can be a collision cell 140 or in the field free region 220 or in the first time of flight means. The means to fragment the molecules has a potential which is different from the potential at the entrance to the ion mirror 150, and the detecting surface of the detector 160 is mounted in the time focal surface of the ion mirror 150.
摘要:
The invention provides a data acquisition system and method for detecting ions in a mass spectrometer, comprising: a detection system for detecting ions comprising two or more detectors for outputting two or more detection signals in separate channels in response to ions arriving at the detection system; and a data processing system for receiving and processing the detection signals in separate channels of the data processing system and for merging the processed detection signals to construct a mass spectrum; wherein the processing in separate channels comprises removing noise from the detection signals by applying a threshold to the detection signals. The detection signals are preferably produced in response to the same ions, the signals being shifted in time relative to each other. The invention is suitable for a TOF mass spectrometer.
摘要:
An ion focusing and conveying device 10 comprises a plurality of electrodes 12 in series. Means is provided to apply a first alternating voltage waveform to each electrode 12, the phase of the alternating voltage in the first waveform is applied to each electrode 12 in the series being ahead of the phase of the first alternating voltage waveform applied to the preceding electrode 12 in the series by less than 180°, preferably by 90° or less, such that ions are focused onto an axis of travel and impelled along the series of electrodes 12.