Particle interaction characterization using overlapping scattering and concentration measurements

    公开(公告)号:US10203271B1

    公开(公告)日:2019-02-12

    申请号:US15201542

    申请日:2016-07-04

    申请人: John McCaffrey

    发明人: John McCaffrey

    摘要: Disclosed in one general aspect is a particle interaction characterization instrument that comprises a flow cell for a liquid sample that includes suspended particles and a light source positioned to illuminate the suspended particles in the liquid sample fluid in the sample vessel. A first scattering detector is positioned to receive light from the light source that has been scattered by the particles suspended in sample fluid in the sample vessel at at least one predetermined scattering angle. An ultraviolet transmittance detector is positioned to receive a portion of the light from the source that passes through the suspended particles without being absorbed or scattered. Interaction analysis logic is responsive to both the scattering detector and the ultraviolet detector, and is operative to derive at least one interaction property for the suspended particles.

    Charging system utilizing grid elements with differentiated patterns
    8.
    发明申请
    Charging system utilizing grid elements with differentiated patterns 失效
    充电系统利用不同模式的网格元素

    公开(公告)号:US20050053397A1

    公开(公告)日:2005-03-10

    申请号:US10654785

    申请日:2003-09-04

    IPC分类号: G03G15/02

    摘要: A charging system for uniform charging of charge retentive surfaces such as photoreceptors in imaging systems. The charging system includes corona producing elements and grid elements such as scorotron screens wherein the grid elements are arranged generally parallel to each other and have differentiated grid feature patterns. The differentiated grid feature patterns enable more uniform charging.

    摘要翻译: 一种充电系统,用于均匀充电成像系统中的电荷保持表面,如光感受器。 充电系统包括电晕产生元件和栅极元件,例如电晕屏幕,其中栅格元件大体上彼此平行地排列并且具有不同的栅格特征图案。 差异化的网格特征模式可实现更均匀的充电。

    SUSPENDED PARTICLE CHARACTERIZATION SYSTEM
    9.
    发明申请

    公开(公告)号:US20170241894A1

    公开(公告)日:2017-08-24

    申请号:US15523394

    申请日:2015-10-13

    IPC分类号: G01N15/14 B01L3/00 G01N21/65

    摘要: An apparatus (10) for characterizing particles, comprising: a microscope objective with an optical axis and a depth of field; a holder cell (22) configured to position the particles in a generally planar volume below the microscope objective, the planar volume being substantially normal to the optical axis and having a depth that is less than or equal to the depth of field, wherein a portion of the cell holder (22) for positioning in the optical axis of the microscope objective is substantially free of significant spectral features in a Raman spectral range; an x-y stage (20) to move the microscope objective relative to the holder cell (22) in x and y directions to align particles with the optical axis of the microscope objective while the particles are held by the holder cell (22), a detector (18) for acquiring an image of a particle through the microscope objective, a laser operable to illuminate a particle held by the holder cell (22), a Raman spectrometer (16) arranged to obtain a spectrum including the Raman spectral range from the illuminated particle, and characterizing logic operative to characterize the particle based on image processing operations performed on the acquired image and based on the Raman spectrum. The holder cell (22) comprises a first plate (34) and a second plate (36) that are separated by a predetermined distance defining the planar volume depth.