摘要:
A delay locked loop implementing design-for-test features to test for, among other, stuck-at-faults is provided. The delay locked loop uses multiplexers as design-for-test devices for controllability purposes and flip-flops as design-for-test devices for observability purposes. Such implementation of design-for-test features within a delay locked loop allows for pre-packaging delay locked loop verification and testing.
摘要:
A method and apparatus for regulating resonance in a computer system I/O interface is provided. A shunting impedance/resistance is arranged across a power supply of the I/O interface. The shunting impedance/resistance is controlled by circuitry that is arranged to detect voltage overshoot conditions in the I/O interface. The circuitry has (1) an analog front end that is arranged to detect power supply oscillations relative to a grounded terminal, (2) an amplifier (or logic conversion circuit) that is arranged to convert an output signal from the analog front end to a digital signal, and (3) a shunting apparatus arranged to modify power supply behavior in the I/O interface dependent on the digital signal.
摘要:
A technique Readjusting a bias-generator in a delay locked loop after fabrication of the delay locked loop. The technique involves use of an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated.
摘要:
A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference between nodal voltages in an integrated circuit from an analog to a digital quantity on the integrated circuit such that the difference in voltage may be used by an on-chip digital system is provided. Further, a method and apparatus for quantifying a difference in voltage between a first node and a second node of a temperature sensor is provided.
摘要:
A method for optimizing a decoupling capacitance for an on-chip temperature sensor is provided. A representative power supply waveform having noise is input into a simulation of the on-chip temperature sensor; a difference between a temperature representative input and a temperature dependent output of the on-chip temperature sensor is determined; and an amount of the decoupling capacitance is adjusted until the difference falls below a pre-selected value. A computer system for optimizing a decoupling capacitance for an on-chip temperature sensor is also provided. A computer-readable medium having recorded thereon instructions executable by a processor for optimizing a decoupling capacitance for an on-chip temperature sensor is further provided.
摘要:
A technique for adjusting a bias-generator in a phase locked loop after fabrication of the phase locked loop is provided. The technique involves use of an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired phase locked loop performance characteristic after the phase locked loop has been fabricated.
摘要:
A method for estimating jitter in a delay locked loop is provided. The estimation is determined from a simulation that uses a representative power supply waveform having noise as an input. Further, a computer system for estimating jitter in a delay locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to estimate jitter in a delay locked loop is provided.
摘要:
A phase locked loop that includes a receiver that is adjustable to substantially match delay of a system clock and a feedback clock at an input of the phase locked loop is provided. The receiver employs system clock path circuitry to input the system clock and feedback clock path circuitry to input the feedback clock, where current flow and load resistances associated with the system clock path circuitry and current flow and load resistances associated with the feedback clock path circuitry are responsive to one or more bias signals that are adjustable using one or more adjustment circuits that are operatively connected to the receiver. The control of the one or more bias signals via the one or more adjustment circuits facilitates the generation of substantially delay matched system and feedback clocks.
摘要:
A method for optimizing loop bandwidth in a delay locked loop is provided. A representative power supply waveform having noise is input into a simulation of the delay locked loop; an estimate of jitter is determined; and the loop bandwidth of the delay looked loop is adjusted until the jitter falls below a pre-selected value. Further, a computer system for optimizing loop bandwidth in a delay locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to optimize loop bandwidth in a delay locked loop is provided.
摘要:
A charge pump design that facilitates post-fabrication control of delay locked loop charge pump current is provided. The charge pump includes an adjustment device responsive to user controlled signals that are varied to achieve a desired amount of charge pump current. Such control of the charge pump current in a delay locked loop allows a designer to achieve a desired DLL performance characteristic after the DLL has been fabricated.