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    Design-for-test technique for a delay locked loop
    1.
    发明授权
    Design-for-test technique for a delay locked loop 有权
    用于延迟锁定环路的设计测试技术

    公开(公告)号：US06815986B2

    公开(公告)日：2004-11-09

    申请号：US10196622

    申请日：2002-07-16

    申请人： Aninda Roy ,  Claude Gauthier ,  Brian Amick ,  Dean Liu

    发明人： Aninda Roy ,  Claude Gauthier ,  Brian Amick ,  Dean Liu

    IPC分类号： H03L706

    CPC分类号： H03L7/0812 ,  H03L7/07 ,  H03L7/0891

    摘要： A delay locked loop implementing design-for-test features to test for, among other, stuck-at-faults is provided. The delay locked loop uses multiplexers as design-for-test devices for controllability purposes and flip-flops as design-for-test devices for observability purposes. Such implementation of design-for-test features within a delay locked loop allows for pre-packaging delay locked loop verification and testing.

    摘要翻译： 提供了一种实现设计测试功能的延迟锁定环路，用于测试其他故障中的故障。 延迟锁定环使用多路复用器作为可测试性设计的测试设备和作为用于可观测目的的用于测试设备的触发器。 这种延迟锁定环路内的设计测试功能的实现允许预包装延迟锁定环验证和测试。

    Programmable bias-generator for self-biasing a delay locked loop
    2.
    发明授权
    Programmable bias-generator for self-biasing a delay locked loop 有权
    用于自偏置延迟锁定环的可编程偏置发生器

    公开(公告)号：US06597218B1

    公开(公告)日：2003-07-22

    申请号：US10131308

    申请日：2002-04-24

    申请人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    发明人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    IPC分类号： H03L706

    CPC分类号： H03L7/0891 ,  H03L7/0812 ,  Y10S331/02

    摘要： A technique Readjusting a bias-generator in a delay locked loop after fabrication of the delay locked loop. The technique involves use of an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated.

    摘要翻译： 一种技术在制造延迟锁定环路后，在延迟锁定环路中重新调整偏置发生器。 该技术涉及使用可操作地连接到偏置发生器的调节电路，其中调节电路是可控制的，以便于修正偏置发生器的电压输出。 由偏置发生器输出的电压的这种控制允许设计者在制造延迟锁定环路之后实现期望的延迟锁定环路性能特性。

    Quantifying a difference between nodal voltages
    3.
    发明授权
    Quantifying a difference between nodal voltages 有权
    量化节点电压之间的差异

    公开(公告)号：US06806698B2

    公开(公告)日：2004-10-19

    申请号：US10078945

    申请日：2002-02-19

    申请人： Claude Gauthier ,  Brian Amick ,  Spencer Gold ,  Dean Liu ,  Kamran Zarrineh ,  Pradeep Trivedi

    发明人： Claude Gauthier ,  Brian Amick ,  Spencer Gold ,  Dean Liu ,  Kamran Zarrineh ,  Pradeep Trivedi

    IPC分类号： G01R2314

    CPC分类号： H03M1/0621 ,  G01K7/01 ,  G01K7/32 ,  H03M1/60

    摘要： A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference between nodal voltages in an integrated circuit from an analog to a digital quantity on the integrated circuit such that the difference in voltage may be used by an on-chip digital system is provided. Further, a method and apparatus for quantifying a difference in voltage between a first node and a second node of a temperature sensor is provided.

    摘要翻译： 提供了使用两个节点电压之间的差异的方法和装置，例如与温度无关的电压和与温度有关的电压，以确定集成电路上的点处的实际温度。 此外，提供了一种将集成电路中的节点电压与集成电路中的数字量之间的差异转换为使得片上数字系统可以使用电压差的方法和装置。 此外，提供了用于量化温度传感器的第一节点和第二节点之间的电压差的方法和装置。

    Method for decoupling capacitor optimization for a temperature sensor design
    4.
    发明授权
    Method for decoupling capacitor optimization for a temperature sensor design 有权
    电容优化用于温度传感器设计的解耦方法

    公开(公告)号：US06704680B2

    公开(公告)日：2004-03-09

    申请号：US10075205

    申请日：2002-02-14

    申请人： Brian Amick ,  Claude Gauthier ,  Pradeep Trivedi ,  Dean Liu

    发明人： Brian Amick ,  Claude Gauthier ,  Pradeep Trivedi ,  Dean Liu

    IPC分类号： G05F302

    CPC分类号： G06F17/5036 ,  G01K15/00 ,  G06F17/5063

    摘要： A method for optimizing a decoupling capacitance for an on-chip temperature sensor is provided. A representative power supply waveform having noise is input into a simulation of the on-chip temperature sensor; a difference between a temperature representative input and a temperature dependent output of the on-chip temperature sensor is determined; and an amount of the decoupling capacitance is adjusted until the difference falls below a pre-selected value. A computer system for optimizing a decoupling capacitance for an on-chip temperature sensor is also provided. A computer-readable medium having recorded thereon instructions executable by a processor for optimizing a decoupling capacitance for an on-chip temperature sensor is further provided.

    摘要翻译： 提供了一种用于优化片上温度传感器的去耦电容的方法。 将具有噪声的代表性电源波形输入到片上温度传感器的仿真中; 确定温度代表性输入和片上温度传感器的与温度相关的输出之间的差异; 并且调整去耦电容的量，直到差降低到预选值以下。 还提供了一种用于优化片上温度传感器的去耦电容的计算机系统。 还提供了一种其上记录有可由处理器执行以用于优化用于片上温度传感器的去耦电容的指令的计算机可读介质。

    Post-silicon bias-generator control for a differential phase locked loop
    5.
    发明授权
    Post-silicon bias-generator control for a differential phase locked loop 有权
    用于差分锁相环的后硅偏置发生器控制

    公开(公告)号：US06593784B1

    公开(公告)日：2003-07-15

    申请号：US10131299

    申请日：2002-04-24

    申请人： Claude Gauthier ,  Brian Amick ,  Pradeep Trivedi ,  Dean Liu

    发明人： Claude Gauthier ,  Brian Amick ,  Pradeep Trivedi ,  Dean Liu

    IPC分类号： H03L706

    CPC分类号： H03L7/0893 ,  H03L7/18

    摘要： A technique for adjusting a bias-generator in a phase locked loop after fabrication of the phase locked loop is provided. The technique involves use of an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired phase locked loop performance characteristic after the phase locked loop has been fabricated.

    摘要翻译： 提供了一种用于在锁相环制造之后在锁相环中调整偏压发生器的技术。 该技术涉及使用可操作地连接到偏置发生器的调节电路，其中调节电路是可控制的，以便于修正偏置发生器的电压输出。 由偏置发生器输出的电压的这种控制允许设计者在制造了锁相环之后实现期望的锁相环性能特性。

    Jitter estimation for a phase locked loop
    6.
    发明授权
    Jitter estimation for a phase locked loop 有权
    锁相环的抖动估计

    公开(公告)号：US06819192B2

    公开(公告)日：2004-11-16

    申请号：US10075750

    申请日：2002-02-14

    申请人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    发明人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    IPC分类号： H03B100

    CPC分类号： G01R29/26 ,  G06F17/5036 ,  H03L7/18

    摘要： A method for estimating jitter in a phase locked loop is provided. The estimation is determined from a simulation that uses a representative power supply waveform having noise as an input. Further, a computer system for estimating jitter in a phase locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to estimate jitter in a phase locked loop is provided.

    摘要翻译： 提供了一种用于估计锁相环中的抖动的方法。 从使用具有噪声的代表性电源波形作为输入的仿真确定估计。 此外，提供了一种用于估计锁相环中的抖动的计算机系统。 此外，提供了其上记录有适于估计锁相环中的抖动的指令的计算机可读介质。

    Method for simulating power supply noise in an on-chip temperature sensor
    8.
    发明授权
    Method for simulating power supply noise in an on-chip temperature sensor 有权
    模拟片上温度传感器电源噪声的方法

    公开(公告)号：US06748339B2

    公开(公告)日：2004-06-08

    申请号：US10075206

    申请日：2002-02-14

    申请人： Brian Amick ,  Claude Gauthier ,  Dean Liu ,  Pradeep Trivedi

    发明人： Brian Amick ,  Claude Gauthier ,  Dean Liu ,  Pradeep Trivedi

    IPC分类号： G06F1500

    CPC分类号： G06F17/5036

    摘要： A method for estimating accuracy of an on-chip temperature sensor is provided. A representative power supply waveform having noise is input into a simulation of the on-chip temperature sensor and the accuracy of the on-chip temperature sensor is estimated from the simulation. A computer system for estimating accuracy of an on-chip temperature sensor is also provided. A computer-readable medium having instructions adapted to input a representative power supply waveform having noise into a simulation of an on-chip temperature sensor and estimate accuracy of the on-chip temperature sensor from the simulation is provided.

    摘要翻译： 提供了一种用于估计片上温度传感器的精度的方法。 将具有噪声的代表性电源波形输入到片上温度传感器的模拟中，并且从仿真估计片上温度传感器的精度。 还提供了一种用于估计片上温度传感器的精度的计算机系统。 提供了一种具有适于将具有噪声的代表性电源波形输入到片上温度传感器的模拟并且从模拟估计片上温度传感器的精度的指令的计算机可读介质。

    Optimization of loop bandwidth for a phase locked loop
    9.
    发明授权
    Optimization of loop bandwidth for a phase locked loop 有权
    锁相环的环路带宽优化

    公开(公告)号：US06671863B2

    公开(公告)日：2003-12-30

    申请号：US10075339

    申请日：2002-02-14

    申请人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    发明人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    IPC分类号： G06F945

    CPC分类号： G06F17/5036

    摘要： A method for optimizing loop bandwidth in a phase locked loop is provided. A representative power supply waveform having noise is input into a simulation of the phase locked loop; an estimate of jitter is determined; and the loop bandwidth of the phase looked loop is adjusted until the jitter falls below a pre-selected value. Further, a computer system for optimizing loop bandwidth in a phase locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to optimize loop bandwidth in a phase locked loop is provided.

    摘要翻译： 提供了一种优化锁相环路环路带宽的方法。 具有噪声的代表性电源波形被输入到锁相环的仿真中; 确定抖动的估计; 并且调整相位循环的循环带宽，直到抖动低于预选值。 此外，提供了一种用于优化锁相环中的环路带宽的计算机系统。 此外，提供了一种其上记录有适于优化锁相环中的环路带宽的指令的计算机可读介质。

    Method and system for estimating jitter in a delay locked loop
    10.
    发明授权
    Method and system for estimating jitter in a delay locked loop 有权
    估计延迟锁定环路抖动的方法和系统

    公开(公告)号：US06691291B2

    公开(公告)日：2004-02-10

    申请号：US10075320

    申请日：2002-02-14

    申请人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    发明人： Claude Gauthier ,  Brian Amick ,  Dean Liu ,  Pradeep Trivedi

    IPC分类号： G06F1750

    CPC分类号： G06F17/5036

    摘要： A method for estimating jitter in a delay locked loop is provided. The estimation is determined from a simulation that uses a representative power supply waveform having noise as an input. Further, a computer system for estimating jitter in a delay locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to estimate jitter in a delay locked loop is provided.

    摘要翻译： 提供了一种用于估计延迟锁定环路中的抖动的方法。 从使用具有噪声的代表性电源波形作为输入的仿真确定估计。 此外，提供了一种用于估计延迟锁定环路中的抖动的计算机系统。 此外，提供了其上记录有适于估计延迟锁定环路中的抖动的指令的计算机可读介质。