Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.
Abstract translation:一个设备包括一个存储器和一个读/写(R / W)单元。 存储器包括耦合到公共电荷陷阱层的多个门。 R / W单元被配置为通过在公共电荷陷阱层中创建和读取一组充电区域来对存储器进行编程和读取,其中集合中的至少一个给定区域不是唯一地与 大门。
Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.
Abstract translation:一个设备包括一个存储器和一个读/写(R / W)单元。 存储器包括耦合到公共电荷陷阱层的多个门。 R / W单元被配置为通过在公共电荷陷阱层中创建和读取一组充电区域来对存储器进行编程和读取,其中集合中的至少一个给定区域不是唯一地与 大门。
Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.
Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.