Slurry for Selective Chemical Mechanical Polishing of Copper
    1.
    发明申请
    Slurry for Selective Chemical Mechanical Polishing of Copper 审中-公开
    用于铜的选择性化学机械抛光的浆料

    公开(公告)号:US20160040040A1

    公开(公告)日:2016-02-11

    申请号:US14456356

    申请日:2014-08-11

    CPC classification number: C09G1/02 B24B37/044 H01L21/3212

    Abstract: A slurry for selective chemical mechanical polishing of a copper layer is disclosed. The slurry includes either porous zeolite abrasive particles of substantially homogeneous composition having an average pore diameter of approximately 0.1-6 nanometers or hexagonal boron nitride abrasive particles. The slurry also includes an organic complexing compound that is 0.1-25 wt. % of the slurry, an oxidizer that is 0.1-10 wt. % of the slurry, and a solvent. A chemical mechanical polishing method for using the slurry is also disclosed.

    Abstract translation: 公开了一种用于铜层的选择性化学机械抛光的浆料。 浆料包括具有约0.1-6纳米的平均孔径或六方氮化硼磨料颗粒的基本上均匀组成的多孔沸石磨料颗粒。 该浆料还包括有机配位化合物,其为0.1-25wt。 %的浆料,氧化剂为0.1-10重量% %的浆料和溶剂。 还公开了一种使用该浆料的化学机械抛光方法。

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