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1.
公开(公告)号:US20190237013A1
公开(公告)日:2019-08-01
申请号:US16113085
申请日:2018-08-27
发明人: Xiaowei Wang , Guoqing Zhang , Hongxia Yang , Weifeng Wang
IPC分类号: G09G3/3233 , G09G3/3258
CPC分类号: G09G3/3233 , G09G3/3258 , G09G2330/08 , G09G2330/10
摘要: A detecting apparatus and method, repairing apparatus and method, and repairing system of AMOLED display device are provided. The detecting apparatus includes: an illuminating device for sequentially illuminating a plurality of detection regions of a screen of the AMOLED display device, the screen being divided into the plurality of detection regions, each of the detection regions including at least one light-emitting unit; a current detecting device for acquiring a detection current which is a sum of driving currents of the light-emitting unit in the detection region being illuminated; and a judging device for judging whether the detection region corresponding to the detection current is a defective region according to the detection current. The apparatus can detect luminance uniformity of the AMOLED display device. The detection efficiency is high, the detection standard is unified and the detection accuracy is high.
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2.
公开(公告)号:US20180188289A1
公开(公告)日:2018-07-05
申请号:US15515280
申请日:2016-05-13
发明人: Yi Qu , Guoqing Zhang , Zhigang Sun , Hongxia Yang , Shanshan Bao , Jun Wang , Tuan Liang
摘要: A display substrate includes: a display driving signal line; and at least one set of testing pads, wherein each set of the testing pads includes: a plurality of light-on testing pads arranged successively and connected to the display driving signal line; and two pin-miss testing pads electrically connected to one another while not connected to the display driving signal line.
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3.
公开(公告)号:US10670629B2
公开(公告)日:2020-06-02
申请号:US15515280
申请日:2016-05-13
发明人: Yi Qu , Guoqing Zhang , Zhigang Sun , Hongxia Yang , Shanshan Bao , Jun Wang , Tuan Liang
摘要: A display substrate includes: a display driving signal line; and at least one set of testing pads, wherein each set of the testing pads includes: a plurality of light-on testing pads arranged successively and connected to the display driving signal line; and two pin-miss testing pads electrically connected to one another while not connected to the display driving signal line.
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公开(公告)号:US10090831B2
公开(公告)日:2018-10-02
申请号:US15122389
申请日:2015-04-09
发明人: Jun Wang , Xinxin Jin , Liang Sun , Yuebai Han , Guoqing Zhang
IPC分类号: G09G3/3233 , H03K17/16
摘要: The present disclosure relates to a method of electrically aging a PMOS thin film transistor. The method includes applying a first voltage Vg with an amplitude of A volts to a gate of the PMOS thin film transistor; applying a second voltage Vs with an amplitude of (A−40) to (A−8) volts to a source of the PMOS thin film transistor; and applying a third voltage Vd with an amplitude of (A−80) to (A−16) volts to a drain of the PMOS thin film transistor. Application of the first voltage Vg, the second voltage Vs and the third voltage Vd is maintained for a predetermined time period, and Vd−Vs
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公开(公告)号:US11232727B2
公开(公告)日:2022-01-25
申请号:US16466328
申请日:2018-10-31
发明人: Pucha Zhao , Guoqing Zhang , Xiaopeng Bai , Weifeng Wang , Yanbin Dang , Zhixin Guo , Xingliang Wang , Haotian Chen
摘要: A substrate, a panel, a detection device and an alignment detection method are provided. The substrate includes first signal connection pins arranged in parallel side by side and at least one first alignment detection pin, wherein the at least one first alignment detection pin is located on at least one side of the first signal connection pins in an arrangement direction of the first signal connection pins, and arranged in parallel with the first signal connection pins.
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公开(公告)号:US11099226B2
公开(公告)日:2021-08-24
申请号:US16157302
申请日:2018-10-11
发明人: Hongwei Gao , Guoqing Zhang , Hongxia Yang , Pucha Zhao , Xiaopeng Bai , Ke Zhao , Zhihui Jia , Yan Zong , Xiaowei Wang , Yaorong Liu
IPC分类号: G01R31/26
摘要: A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.
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公开(公告)号:US11018167B2
公开(公告)日:2021-05-25
申请号:US16053460
申请日:2018-08-02
发明人: Ke Zhao , Guoqing Zhang , Hongwei Gao , Xiaowei Wang , Zhihui Jia , Yan Zong , Longfei Yang , Hongxia Yang , Meili Guo , Weifeng Wang , Pucha Zhao , Zhixin Guo
IPC分类号: G09G3/3233 , H01L27/32 , H01L51/56 , H01L21/66 , H01L27/12
摘要: The present disclosure relates to a method and system for performing aging process on the transistor in the display panel. A method for performing aging process on a transistor in a display panel, comprising: obtaining an initial characteristic curve of the transistor; determining an initial cutoff voltage range of the transistor according to the obtained initial characteristic curve; determining a gate-source voltage and a drain-source voltage required by the transistor according to the initial cutoff voltage range, so as to increase an cutoff voltage range of the transistor; and performing aging process on the transistor according to the determined required gate-source voltage and drain-source voltage.
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公开(公告)号:US10510278B2
公开(公告)日:2019-12-17
申请号:US16213210
申请日:2018-12-07
发明人: Weifeng Wang , Guoqing Zhang , Hongxia Yang , Yu Fu , Xingliang Wang , Zhixin Guo , Yanbin Dang , Xiaowei Wang , Jie Wu , Feiwen Tian , Pucha Zhao , Chenwei Wang , Xuepeng Ji
摘要: The present disclosure provides a signal loading method and a signal generator. The signal loading method includes: loading a first pair of voltage signals to at least one pair of separate signal channels for a time period, respectively, wherein the first pair of voltage signals have a first voltage difference therebetween; and determining whether a short circuit occurs in the at least one pair of signal channels within the time period, and if it is determined that no short circuit occurs in the at least one pair of signal channels within the time period, loading a second pair of voltage signals having a second voltage difference therebetween to the at least one pair of signal channels at the end of the time period. The second voltage difference is greater than the first voltage difference.
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公开(公告)号:US20190237019A1
公开(公告)日:2019-08-01
申请号:US16138603
申请日:2018-09-21
发明人: Hongwei Gao , Xiaowei Wang , Yaorong Liu , Zhihui Jia , Yan Zong , Ke Zhao , Hongxia Yang , Guoqing Zhang , Pucha Zhao , Xiaopeng Bai
IPC分类号: G09G3/3258 , G09G3/3291
CPC分类号: G09G3/3258 , G09G3/3291 , G09G2300/0426 , G09G2300/043 , G09G2330/12
摘要: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.
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公开(公告)号:US20190236992A1
公开(公告)日:2019-08-01
申请号:US16190406
申请日:2018-11-14
发明人: Xiaowei Wang , Guoqing Zhang , Longfei Yang , Lei Wang , Ke Zhao , Weifeng Wang , Hongxia Yang , Meili Guo , Feiwen Tian
IPC分类号: G09G3/00 , G09G3/3225
摘要: A defect detection circuit and a defect detection method for a light-emitting element, a display driving device, a display device, and a defect detection method for the display device are provided. The defect detection circuit includes a power source signal adjustment sub-circuit, a data signal adjustment sub-circuit, a first initial signal adjustment sub-circuit, a second initial signal adjustment sub-circuit and a storage capacitor connected to a control end of a driving transistor. The storage capacitor is configured to control the driving transistor to be turned off under the effect of a power source signal, a data signal and an initial signal, to enable the second initial signal adjustment sub-circuit to apply the initial signal to a light-emitting sub-circuit, thereby to enable the light-emitting sub-circuit to emit light. The display driving device includes the defect detection circuit.
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