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公开(公告)号：US10908103B2
公开(公告)日：2021-02-02
申请号：US16182437
申请日：2018-11-06
申请人： Bruker Nano GmbH
IPC分类号： G01N23/223 , G21K1/04 , G21K1/06
摘要： The present invention relates to an X-ray fluorescence, XRF, spectrometer, for measuring X-ray fluorescence emitted by a target, wherein the XRF spectrometer comprises an X-ray tube with an anode to emit a divergent X-ray beam, a capillary lens that is configured to focus the divergent X-ray beam on the target, an aperture system that is positioned between the anode of the X-ray tube and the capillary lens and comprises at least one pinhole, and a detector that is configured for detecting X-ray fluorescence radiation emitted by the target, wherein the at least one pinhole is configured for being inserted into the divergent X-ray beam and for reducing a beam cross section of the divergent X-ray beam between the anode and the capillary lens. The present invention further relates to an aperture system for a spectrometer, to the use of an aperture system for adjusting the focal depth of a spectrometer and to a method for adjusting the focal depth of as spectrometer.
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公开(公告)号：US20190137422A1
公开(公告)日：2019-05-09
申请号：US16182437
申请日：2018-11-06
申请人： Bruker Nano GmbH
IPC分类号： G01N23/223
摘要： The present invention relates to an X-ray fluorescence, XRF, spectrometer, for measuring X-ray fluorescence emitted by a target, wherein the XRF spectrometer comprises an X-ray tube with an anode that is emitting a divergent X-ray beam, a capillary lens that is configured to focus the divergent X-ray beam on the target, an aperture system that is positioned between the anode of the X-ray tube and the capillary lens and comprises at least one pinhole, and a detector that is configured for detecting X-ray fluorescence radiation emitted by the target, wherein the at least one pinhole is configured for being inserted into the divergent X-ray beam and for reducing a beam cross section of the divergent X-ray beam between the anode and the capillary lens.The present invention further relates to an aperture system for a spectrometer, to the use of an aperture system for adjusting the focal depth of a spectrometer and to an method for adjusting the focal depth of as spectrometer.
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3.发明授权公开(公告)号：US12106867B2
公开(公告)日：2024-10-01
申请号：US15325958
申请日：2015-08-13
申请人： BRUKER NANO GMBH
发明人： Ulrich Waldschläger
IPC分类号： G01N23/00 , G01N23/20008 , G01N23/20016 , G21K1/06 , G21K7/00
CPC分类号： G21K1/067 , G01N23/20008 , G01N23/20016 , G01N2223/33 , G21K7/00 , G21K2201/067
摘要： A method for scanning a sample by means of X-ray optics for irradiating the sample with X-rays, comprises the following steps:
(a) displacing a measuring point, defined by an optical exit point of the X-ray optics, in the sample in a first scanning direction by means of swiveling the X-ray optics about a first swivel axis;
(b) detecting radiation emanating from the sample at, at least, two measuring points along the first scanning direction;
(c) combining measured values correlating with the detected radiation to form an overall scan.-
公开(公告)号：US09971121B2
公开(公告)日：2018-05-15
申请号：US14765712
申请日：2014-02-13
申请人： BRUKER NANO GMBH
CPC分类号： G02B7/023 , G01N23/20016 , G01N23/223 , G01N2021/575 , G01N2223/076 , G01N2223/321 , G21K1/06 , H01J2235/167
摘要： The invention relates to a device (98) for the spatial alignment of X-ray optics (100) with an entry point (104) and an exit point (108). The device (98) comprises a parallel displacement mechanism (200) for gauging the entry point (104) of the X-ray optics (100) to a first predetermined point (100) by parallel displacement of the X-ray optics (100). Further, the device (98) comprises a goniometer mechanism (300) for gauging the exit point (108) of the X-ray optics (100) to a second predetermined point (106) by at least approximate pivoting of the X-ray optics (100) around the entry point (104). Further, the invention relates to an apparatus (96) which comprises the device (98) and X-ray optics (100).
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