Bit error rate tester implemented in a programmable logic device
    3.
    发明授权
    Bit error rate tester implemented in a programmable logic device 有权
    位错误率测试仪在可编程逻辑器件中实现

    公开(公告)号:US07194666B1

    公开(公告)日:2007-03-20

    申请号:US10725898

    申请日:2003-12-01

    申请人: San Wong Kaiyu Ren

    发明人: San Wong Kaiyu Ren

    IPC分类号: G06F11/00 G01R31/28

    摘要: The present invention provides a bit error rate tester implemented in a programmable logic device. Any or all of the components of the bit error rate tester may be implemented through software by programming the programmable logic circuitry of the programmable logic device to implement the components of the bit error rate tester. The bit error tester may determine the bit error rate of any suitable interface either within the programmable logic device or external to the programmable logic device. In order to allow a user to interact with the bit error rate tester, user equipment, such as a personal computer, may be coupled to the bit error rate tester.

    摘要翻译: 本发明提供了一种在可编程逻辑器件中实现的误码率测试仪。 误码率测试器的任何或所有组件可以通过软件通过编程可编程逻辑器件的可编程逻辑电路来实施,以实现误码率测试器的组件。 位错误测试器可以确定可编程逻辑器件内的任何合适的接口或可编程逻辑器件外部的误码率。 为了允许用户与误码率测试器交互,诸如个人计算机的用户设备可以耦合到误码率测试器。