摘要:
Various embodiments include apparatuses, stacked devices and methods of forming dice stacks on an interface die. In one such apparatus, a dice stack includes at least a first die and a second die, and conductive paths coupling the first die and the second die to the common control die. In some embodiments, the conductive paths may be arranged to connect with circuitry on alternating dice of the stack. In other embodiments, a plurality of dice stacks may be arranged on a single interface die, and some or all of the dice may have interleaving conductive paths.
摘要:
Various embodiments include apparatuses, stacked devices and methods of forming dice stacks on an interface die. In one such apparatus, a dice stack includes at least a first die and a second die, and conductive paths coupling the first die and the second die to the common control die. In some embodiments, the conductive paths may be arranged to connect with circuitry on alternating dice of the stack. In other embodiments, a plurality of dice stacks may be arranged on a single interface die, and some or all of the dice may have interleaving conductive paths.
摘要:
An off chip driver impedance adjustment circuit includes a storage circuit adapted to receive and store a drive strength adjustment word. A counter circuit is coupled to the storage circuit to receive the drive strength adjustment word and develops a drive strength count responsive to the drive strength adjustment word. A programmable fuse code to preset the counter. An output driver circuit is coupled to the counter circuit to receive the drive strength count and is adapted to receive a data signal. The output driver circuit develops an output signal on an output responsive to the data signal and adjusts a drive strength as a function of the drive strength count.
摘要:
An off chip driver impedance adjustment circuit includes a storage circuit adapted to receive and store a drive strength adjustment word. A counter circuit is coupled to the storage circuit to receive the drive strength adjustment word and develops a drive strength count responsive to the drive strength adjustment word. A programmable fuse code to preset the counter. An output driver circuit is coupled to the counter circuit to receive the drive strength count and is adapted to receive a data signal. The output driver circuit develops an output signal on an output responsive to the data signal and adjusts a drive strength as a function of the drive strength count.
摘要:
A calibration circuit for calibrating the input data path of a digital circuit is disclosed. A simple string of a repeating data pattern such as, e.g., “1100,” is sent on the data path. The digital circuit captures the data using a clock signal, examines the data signal for the predetermined pattern and adjusts a delay applied to the data signal until the predetermined pattern is recognized. Then the delay is further adjusted until the predetermined pattern is no longer recognized indicating that an edge of the eye of the data is near a clocking edge of the clocking signal. The delay applied to the data signal is then further adjusted by a predetermined amount to position the clock edge near the center of the data eye.
摘要:
A compression test mode, independent of redundancy, for a memory device is disclosed. In one embodiment, a method for testing a memory array of a memory device includes outputting individually the output bits of a predetermined number of memory cells, upon failure of a compression mode. The cells may then be checked for errors and replaced if necessary on an individual basis. In another embodiment, a memory device includes an array of memory cells, and a compression test mode circuit such that only those cells that are defective are replaced with redundant cells. The circuit checks a number of memory cells at one time, however, in a compression test mode.
摘要:
A method and circuit for testing cells in a memory device is disclosed. Data is written to the cells and then the cells are read in groups. For example, groups of four cells are read together. Output bits of the four cells are compressed in a compression circuit to generate compressed data, and the compressed data is checked to determine if one or more of the four cells was defective and produced an incorrect output bit. If one of the cells was defective, each cell is read in a sequence and its output bit is tested to determine which of the four cells is defective. The defective cell is replaced with a redundant cell.
摘要:
A multiport switch buffers and transfers cells of digital data. It provides the ability to control the synchronization of the ports in a distributed manner. Each port is associated with a counter that starts counting when transmission by either the port it is associated with is transferring a cell, or when another port is transferring a cell on a channel that conflicts with the channel attached to the port. The counter counts the appropriate number of digits corresponding to the length of the cell whereupon the port is provided with a signal indicating that the transmission has ended. In association with other control signals, the port may then begin transmitting a new cell. When multiple switches are attached to the same channel, the counter serves as a self-queuing mechanism that relieves a central controller from having to keep track of the transmission of bits by each port, and from having to select the next port for transmission.
摘要:
An off chip driver impedance adjustment circuit includes a storage circuit adapted to receive and store a drive strength adjustment word. A counter circuit is coupled to the storage circuit to receive the drive strength adjustment word and develops a drive strength count responsive to the drive strength adjustment word. A programmable fuse code to preset the counter. An output driver circuit is coupled to the counter circuit to receive the drive strength count and is adapted to receive a data signal. The output driver circuit develops an output signal on an output responsive to the data signal and adjusts a drive strength as a function of the drive strength count.
摘要:
A data strobe synchronization circuit includes first and second logic circuits receiving global data strobe pulses and respective enable signal. A control circuit initially applies an enable signal to the first logic circuit so that the first logic circuit generates a first data strobe pulse responsive to each global data strobe pulse. The control circuit receives a write control signal. When the write control signal becomes active, the control circuit terminates the enable signal applied to the first logic circuit and applies an enable signal to the second logic circuit. The second logic circuit then generates a second data strobe pulse responsive to the next global data strobe pulse. The first and second data strobe pulses are used to latch a data signal in respective flip-flops. The data strobe pulses may latch the data signal in pairs of flip-flops on the leading and trailing edges of the data strobe pulses.