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1.
公开(公告)号:US10688599B2
公开(公告)日:2020-06-23
申请号:US15874004
申请日:2018-01-18
Applicant: Corning Incorporated
Inventor: Anping Liu , Matthew Ryan Ross
IPC: B23K26/53 , B23K26/364 , B23K26/0622 , B23K26/067 , B23K26/073 , C03B9/12 , C03C14/00 , C03B33/02 , C03C3/093 , B23K26/06 , B23K26/064 , B23K103/00
Abstract: A method for laser processing a transparent workpiece includes forming a contour line having defects in the transparent workpiece, which includes directing a pulsed laser beam oriented along a beam pathway through a beam converting element and through a phase modifying optical element such that the portion of the pulsed laser beam directed into the transparent workpiece includes a phase shifted focal line having a cross-sectional phase contour that includes phase contour ridges induced by the phase modifying optical element and extending along phase ridge lines. Moreover, the phase shifted focal line generates an induced absorption within the transparent workpiece to produce a defect within the transparent workpiece including a central defect region and a radial arm that extends outward from the central defect region in a radial defect direction oriented within 20° of the phase ridge lines of the phase shifted focal line.
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2.
公开(公告)号:US20180221988A1
公开(公告)日:2018-08-09
申请号:US15874004
申请日:2018-01-18
Applicant: Corning Incorporated
Inventor: Anping Liu , Matthew Ryan Ross
IPC: B23K26/00 , B23K26/364 , B23K26/0622 , B23K26/067 , B23K26/073 , B23K26/06 , C03C14/00 , C03B33/02 , C03C3/093 , C03B9/12
Abstract: A method for laser processing a transparent workpiece includes forming a contour line having defects in the transparent workpiece, which includes directing a pulsed laser beam oriented along a beam pathway through a beam converting element and through a phase modifying optical element such that the portion of the pulsed laser beam directed into the transparent workpiece includes a phase shifted focal line having a cross-sectional phase contour that includes phase contour ridges induced by the phase modifying optical element and extending along phase ridge lines. Moreover, the phase shifted focal line generates an induced absorption within the transparent workpiece to produce a defect within the transparent workpiece including a central defect region and a radial arm that extends outward from the central defect region in a radial defect direction oriented within 20° of the phase ridge lines of the phase shifted focal line.
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公开(公告)号:US12296408B2
公开(公告)日:2025-05-13
申请号:US17440364
申请日:2020-03-02
Applicant: CORNING INCORPORATED
Inventor: Anping Liu , Matthew Ryan Ross , Craig John Mancusi Ungaro , Erin Kathleen Watkins
IPC: B23K26/402 , B23K26/064 , B23K26/073 , B23K26/382 , B23K26/386 , B23K26/53 , C03C15/00 , C03C23/00 , G02B5/00 , G02B27/09 , B23K103/00
Abstract: The systems and methods disclosed herein utilize a beam-forming system configured to convert a Gaussian laser beam into an annular vortex laser beam having a relatively large depth of focus, which enables the processing of thick or stacked glass-based objects annular laser beam is defined in part by a topological charge m that defines an amount of rotation of the annular vortex beam around its central axis as it propagates annular vortex beam is used to form micro-holes in a glass-based object using either a one-step or a two-step method micro-holes formed by either process can be in the form of recesses or through-holes, depending on the application size of the micro-holes can be controlled by controlling the size of the annular vortex beam over the depth of focus range.
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公开(公告)号:US20220347796A1
公开(公告)日:2022-11-03
申请号:US17440364
申请日:2020-03-02
Applicant: CORNING INCORPORATED
Inventor: Anping Liu , Matthew Ryan Ross , Craig John Mancusi Ungaro , Erin Kathleen Watkins
IPC: B23K26/402 , G02B5/00 , G02B27/09 , B23K26/073 , B23K26/064 , B23K26/382 , B23K26/386 , B23K26/53 , C03C15/00 , C03C23/00
Abstract: The systems and methods disclosed herein utilize a beam-forming system configured to convert a Gaussian laser beam into an annular vortex laser beam having a relatively large depth of focus, which enables the processing of thick or stacked glass-based objects annular laser beam is defined in part by a topological charge m that defines an amount of rotation of the annular vortex beam around its central axis as it propagates annular vortex beam is used to form micro-holes in a glass-based object using either a one-step or a two-step method micro-holes formed by either process can be in the form of recesses or through-holes, depending on the application size of the micro-holes can be controlled by controlling the size of the annular vortex beam over the depth of focus range.
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