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公开(公告)号：US10983322B2
公开(公告)日：2021-04-20
申请号：US16342387
申请日：2017-10-20
摘要： A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface. At least one corrective element in the illumination beam path and/or the detection beam path allows those aberrations to be reduced which are created when light to be detected or light for illuminating the sample penetrates interfaces of the barrier layer system at an angle. The microscope has means, which are independent of the generation of the light sheet, for applying, via at least one manipulation beam path, light intensity to the sample in substantially point-shaped regions of the light sheet plane or in a given volume that at least temporarily encompasses the light sheet plane.
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公开(公告)号：US10775601B2
公开(公告)日：2020-09-15
申请号：US16103013
申请日：2018-08-14
摘要： A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.
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公开(公告)号：US10712553B2
公开(公告)日：2020-07-14
申请号：US14904067
申请日：2014-07-08
IPC分类号： G02B27/00 , G02B21/16 , G02B21/36 , G02B21/00 , G02B21/34 , G01N21/15 , G02B21/02 , G02B21/33 , G01N21/03
摘要： An arrangement, for light sheet microscopy, including: a sample vessel, for receiving a medium containing a sample, oriented with respect to a plane reference surface; illumination optics with an illumination objective for illuminating the sample with a light sheet; and detection optics with a detection objective. The optical axis of the illumination objective and the light sheet lies in a plane which forms a nonzero illumination angle with the normal of the reference surface. The detection objective has an optical axis that forms a nonzero detection angle with the normal of the reference surface. The arrangement also includes a separating-layer system for separating the sample-containing medium from the illumination and detection objectives. The separating-layer system contacts the medium with an interface parallel to the reference surface. The illumination angle and detection angle are predetermined based on numerical apertures of the detection objective and of the illumination objective, respectively.
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公开(公告)号：US10261300B2
公开(公告)日：2019-04-16
申请号：US14390165
申请日：2013-05-16
发明人： Helmut Lippert , Ralf Netz , Tiemo Anhut , Nils Langholz , Matthias Langhorst
IPC分类号： G01B9/02 , G01B9/04 , G01N21/64 , G02B21/00 , G02B21/08 , G02B21/14 , G02B21/18 , G02B21/24 , G02B21/36
摘要： The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.
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公开(公告)号：US20190056579A1
公开(公告)日：2019-02-21
申请号：US16103013
申请日：2018-08-14
摘要： A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.
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6.发明授权Device and method for microscopy using light with differing physical properties 有权使用具有不同物理性质的光的显微镜的装置和方法公开(公告)号：US09494782B2
公开(公告)日：2016-11-15
申请号：US14389744
申请日：2013-04-05
发明人： Nils Langholz , Viktor Drescher , Helmut Lippert
CPC分类号： G02B21/06 , G02B21/0032 , G02B21/0044 , G02B21/0092 , G02B21/36 , G02B21/365 , G02B26/0833
摘要： The invention relates to a device for microscopy, with at least one light source for providing illumination light, with a detection unit for detecting light radiated back from a sample, with a microscopy optical unit for guiding illumination light onto the sample and for guiding light radiated back from the sample in the direction of the detection unit and with, arranged in an illumination beam path, an excitation mask (40) for providing structured illumination. The device is characterized in that the excitation mask is a spatially structured filter, which is transparent to light with a first physical property and which impresses spatial structure onto light with a second physical property that is different from the first physical property. The invention moreover relates to a method for microscopy.
摘要翻译： 本发明涉及一种用于显微镜的装置，具有用于提供照明光的至少一个光源，具有用于检测从样品辐射回来的光的检测单元，用于将照明光引导到样品上并用于引导照射光的光学单元 在检测单元的方向上从样品返回，并且布置在照明光束路径中，用于提供结构化照明的激励掩模（40）。 该装置的特征在于，激发掩模是空间结构的滤光器，其对具有第一物理特性的光是透明的，并且将空间结构印在具有不同于第一物理性质的第二物理性质的光上。 本发明还涉及一种显微镜方法。
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公开(公告)号：USRE45575E1
公开(公告)日：2015-06-23
申请号：US13932475
申请日：2013-07-01
发明人： Helmut Lippert , Matthias Wald , Benno Radt
CPC分类号： G02B21/06 , G02B21/0032 , G02B21/0076
摘要： The invention is directed to an optical arrangement with a light source for emitting a light bundle and with optical elements for transforming this light bundle into the shape of a light sheet, particularly suitable for illuminating individual planes of a three-dimensional specimen in selective plane illumination microscopy (SPIM). According to the invention, means are provided for varying the cross section of the light sheet, for varying the length of the light sheet and/or for influencing the direction in which individual beam components extending within the light sheet are directed to the specimen substance. This makes it possible to adapt the geometry of the light sheet to the illumination requirements for observing one and the same specimen plane with a plurality of different objectives and, if required, to reduce shadows occurring within the observed specimen plane as a result of the illumination.
摘要翻译： 本发明涉及一种光学装置，其具有用于发射光束的光源和用于将该光束变换为光片的形状的光学元件，特别适用于在选择性平面照明中照射三维样本的各个平面 显微镜（SPIM）。 根据本发明，提供了用于改变光片的横截面的装置，用于改变光片的长度和/或用于影响在光片内延伸的各个光束分量被引导到样本物质的方向。 这使得可以使光片的几何尺寸适应于用于观察具有多个不同物镜的同一样本平面的照明要求，并且如果需要，可以减少作为照明的结果在观察到的样本平面内发生的阴影 。
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8.发明申请METHOD FOR DETERMINING ROUGHNESS DATA AND/OR TOPOGRAPHY DATA OF SURFACES IN MATERIAL MICROSCOPY 有权用于确定材料微观结构中粗糙度数据和/或表面数据的方法公开(公告)号：US20140285814A1
公开(公告)日：2014-09-25
申请号：US14208690
申请日：2014-03-13
发明人： Matthias Vaupel , Helmut Lippert
IPC分类号： G01B11/30
CPC分类号： G01B11/303 , G02B21/0016 , G02B21/0092 , G02B21/18
摘要： A method for determining roughness data and/or topography data of surfaces in material microscopy, particularly from flat samples, based on a shearing polarization interferometrical sequence with a microscopic “TIC” module (“Total Interference Contrast Module”) of a microscope, wherein the method can be carried out both polychromatically and monochromatically. At least two tilted wave fronts are generated, which after reflection or transmission on a sample generate two images of said sample in the form of fringe patterns, said images being offset relative to one another and interfering with one another, from which roughness values and height topographies of the surface of the sample are determined by application of image evaluation.
摘要翻译： 基于具有微观“TIC”模块（“全干涉对比度模块”）的显微镜的剪切偏振干涉程序，确定材料显微镜中特别是平面样品表面的粗糙度数据和/或表面形态数据的方法，其中 方法可以进行多色和单色。 产生至少两个倾斜波阵面，其在样本上反射或透射之后以条纹图案的形式产生所述样本的两个图像，所述图像相对于彼此偏移并彼此干涉，粗糙度值和高度 通过应用图像评估来确定样品表面的形貌。
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公开(公告)号：US10754136B2
公开(公告)日：2020-08-25
申请号：US15127101
申请日：2015-03-19
摘要： A confocal microscope and an associated method for determining a topography of a sample by implementing a correlative spinning disk microscopy is provided. The method includes placing a sample on an object stage of the microscope. Either the object stage is moved vertically to determine the topography of the sample, while first and second images of the sample are captured in an alternating manner. A vertical focus position is stored as metadata for each image. Two first or second images are interpolated to give an intermediate image. A confocal image for a defined vertical position is generated by calculating the intermediate image with the second or first image at the position.
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公开(公告)号：US10247934B2
公开(公告)日：2019-04-02
申请号：US15537424
申请日：2015-11-18
摘要： A method for examining a specimen via light sheet microscopy includes selecting several illumination wavelengths for the specimen. To structure the illumination light, a predefined phase distribution is impressed on the phase-selective element and a predefined aperture structure is impressed on an aperture in the aperture plane. The phase-selective element is then illuminated in an intermediate image plane in an illumination beam path with illumination light, which is structured by the phase-selective element. The structured illumination light is imaged into an aperture plane arranged downstream of the phase-selective element. The aperture structure is adapted such that the zero orders of the structured illumination light in the aperture plane are substantially removed. The specimen is illuminated with the structured light sheet in the light sheet plane. Light emitted by the specimen is detected in a detection direction which forms an angle different from zero with the light sheet plane.
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