Parallel spiral stacked inductor on semiconductor material
    3.
    发明授权
    Parallel spiral stacked inductor on semiconductor material 有权
    半导体材料上的平行螺旋堆叠电感

    公开(公告)号:US06650220B2

    公开(公告)日:2003-11-18

    申请号:US10131334

    申请日:2002-04-23

    IPC分类号: H01F500

    摘要: A parallel spiral stacked inductor and manufacturing method therefore is provided. A substrate has a plurality of turns in a plurality of levels, the plurality of turns having a center proximate and a center distal ends. A first plurality of vias connecting the center proximate ends of the plurality of turns and a second plurality of vias connecting the center distal ends of the plurality of turns. A first connecting portion connects to the center proximate ends of the plurality of turns and a second connecting portion connecting to the center distal end of the plurality of turns. A dielectric material contains the inductor.

    摘要翻译: 因此,提供了一种并联螺旋堆叠电感器及其制造方法。 衬底具有多个级的多个匝,多个匝具有中心邻近和中心远端。 连接多个匝的中心近端的第一多个通孔和连接多个匝的中心远端的第二多个通孔。 第一连接部分连接到多个匝的中心近端,以及连接到多个匝的中心远端的第二连接部分。 电介质材料包含电感器。

    Method to eliminate top metal corner shaping during bottom metal patterning for MIM capacitors
    4.
    发明授权
    Method to eliminate top metal corner shaping during bottom metal patterning for MIM capacitors 有权
    用于MIM电容器的底金属图案化期间消除顶部金属角成形的方法

    公开(公告)号:US06284590B1

    公开(公告)日:2001-09-04

    申请号:US09726655

    申请日:2000-11-30

    IPC分类号: H01L218242

    摘要: A method for fabricating a metal-insulator-metal capacitor wherein top metal corner shaping during patterning is eliminated is described. An insulating layer is provided overlying a semiconductor substrate. A first metal layer is deposited over the insulating layer. A capacitor dielectric layer is deposited overlying the first metal layer. A second metal layer is deposited overlying the capacitor dielectric layer and patterned to form a top metal electrode. A flowable material layer is deposited overlying the capacitor dielectric and the top metal electrode and anisotropically etched away to leave spacers on sidewalls of the top metal electrode. A photoresist mask is formed overlying the capacitor dielectric and the top metal electrode wherein the spacers provide extra photoresist thickness at the sidewalls of the top metal layer. The capacitor dielectric layer and the first metal layer are patterned wherein the patterned first metal layer forms a bottom metal electrode and wherein the spacers protect the top metal layer from etching during the patterning. The photoresist mask is removed, completing fabrication of a metal-insulator-metal capacitor.

    摘要翻译: 描述了一种用于制造金属 - 绝缘体 - 金属电容器的方法,其中消除了图案化期间的顶部金属角成形。 绝缘层设置在半导体衬底上。 第一金属层沉积在绝缘层上。 沉积在第一金属层上的电容器电介质层。 将第二金属层沉积在电容器介电层上并被图案化以形成顶部金属电极。 将可流动材料层沉积在电容器电介质和顶部金属电极上,并各向异性地蚀刻掉,以在顶部金属电极的侧壁上留下间隔物。 形成覆盖电容器电介质和顶部金属电极的光致抗蚀剂掩模,其中间隔物在顶部金属层的侧壁处提供额外的光致抗蚀剂厚度。 电容器电介质层和第一金属层被图案化,其中图案化的第一金属层形成底部金属电极,并且其中间隔件在图案化期间保护顶部金属层不被蚀刻。 去除光致抗蚀剂掩模,完成金属 - 绝缘体 - 金属电容器的制造。