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公开(公告)号：US07123104B2
公开(公告)日：2006-10-17
申请号：US10644542
申请日：2003-08-20
IPC分类号： H03B5/24 , G01R19/00 , H03K17/296
CPC分类号： G01R19/252 , G01R19/0092
摘要： The present invention is directed to a system and method for measuring a current in an integrated circuit comprising measuring a first output count from a first voltage controlled oscillator (VCO) using a first measurement voltage, simultaneously measuring a second output count from a second VCO using a second measurement voltage, and calculating the current in the integrated circuit using a voltage proportional to a difference between the first and second output counts.
摘要翻译： 本发明涉及一种用于测量集成电路中的电流的系统和方法，包括使用第一测量电压测量来自第一压控振荡器（VCO）的第一输出计数，同时使用第二测量电压测量来自第二VCO的第二输出计数 第二测量电压，并且使用与第一和第二输出计数之间的差成比例的电压来计算集成电路中的电流。
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公开(公告)号：US08037445B2
公开(公告)日：2011-10-11
申请号：US10644625
申请日：2003-08-20
CPC分类号： G01R31/2884 , H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： An apparatus comprising an integrated circuit on a VLSI die, and an embedded micro-controller constructed on the VLSI die, the micro-controller adapted to monitor and control the VLSI environment to optimize the integrated circuit operation. Another embodiment of the invention is directed to a method for monitoring and controlling an integrated circuit comprising providing an embedded micro-controller on a same VLSI die as the integrated circuit, monitoring and controlling a VLSI environment of the integrated circuit with the embedded micro-controller.
摘要翻译： 一种包括VLSI管芯上的集成电路和在VLSI管芯上构建的嵌入式微控制器的装置，该微控制器适用于监测和控制VLSI环境以优化集成电路操作。 本发明的另一个实施例涉及一种用于监测和控制集成电路的方法，包括在与集成电路相同的VLSI管芯上提供嵌入式微控制器，利用嵌入式微控制器监视和控制集成电路的VLSI环境 。
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3.发明授权公开(公告)号：US07091796B2
公开(公告)日：2006-08-15
申请号：US10644559
申请日：2003-08-20
IPC分类号： H03B5/04
CPC分类号： G01R35/005 , H03M1/1038 , H03M1/60
摘要： A method for calibrating a voltage controlled oscillator (VCO) comprising applying a plurality of known voltages to the input of a VCO, monitoring, for each of the voltages, an output count from the VCO over a set interval, and storing the output counts for each voltage. Also disclosed is a system for calibrating a voltage controlled oscillator (VCO) comprising a plurality of known voltages, wherein the known voltage are connectable to the VCO, and a controller coupled to the output of the VCO, wherein the controller maintains a calibration table of VCO output counts for selected voltage inputs.
摘要翻译： 一种用于校准压控振荡器（VCO）的方法，包括将多个已知电压施加到VCO的输入端，对于每个电压，在设定的间隔内监视来自VCO的输出计数，并将输出计数存储在 每个电压。 还公开了一种用于校准包括多个已知电压的压控振荡器（VCO）的系统，其中已知电压可连接到VCO，以及耦合到VCO的输出的控制器，其中控制器保持校准表 所选电压输入的VCO输出计数。
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4.发明授权Method for measuring integrated circuit processor power demand and associated system 有权集成电路处理器电力需求和相关系统的测量方法公开(公告)号：US06954706B2
公开(公告)日：2005-10-11
申请号：US10644376
申请日：2003-08-20
IPC分类号： G01R19/00 , G01R21/133 , G01R31/28 , G01R31/317 , G01R35/00 , G06F19/00 , H01L23/34
CPC分类号： G01R31/31721 , H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： A system and method for measuring integrated circuit processor power demand comprises calibrating one or more voltage controlled oscillators for use as ammeters, calibrating a calibration current source, wherein the calibration current source draws current through a inherent resistance, calibrating the inherent resistance, and interleaving said calibrations in time with calculating the processor power demand using a voltage that is measured across the inherent resistance.
摘要翻译： 一种用于测量集成电路处理器功率需求的系统和方法包括校准一个或多个压控振荡器，用作电流表，校准校准电流源，其中校准电流源通过固有电阻来吸取电流，校准固有电阻，并交织所述 使用在固有电阻上测量的电压计算处理器功率需求时，可以及时校准。
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