Abstract:
A spectrometer includes an actuator assembly, a mobile mirror assembly responsive to the actuator assembly, a balancing element responsive to the mobile mirror assembly, and a suspension mechanism operatively connected between the mobile mirror assembly, the balancing element and an optical support element in a relative position that isolates substantially all forces arising out of the actuation by the actuator assembly of the mobile mirror assembly and the balancing element.
Abstract:
Three or more frequency components are used as deformation waveforms to perturb a sample during spectroscopic measurement. Simultaneously measuring more than one frequency allows for multiplexing. Further, many frequencies insure that the optimal perturbation frequencies for a particular measurement are present. The multiplex advantage of a particular spectroscopic instrument may accrue simultaneously with a multiplex advantage in the characterization of the time dependence of the sample response.
Abstract:
A novel variation of Michelson's interferometer uses tilt- and shear-compensation optics to allow various mirror motions to produce variation of path difference. The tilt-compensation mechanism consists of two complementary reflections from a single plane mirror to produce a beam having a constant angle of propagation, typically the same as the input beam. Using a retroreflector to invert the image of the single plane mirror before the second reflection produces the complementary reflections. A particularly efficient embodiment of the present invention uses a balanced disk-shaped mirror to effect very rapid variation of path difference by nutation or precession. Other advantages of tilt-compensation include photometric stability. This interferometer has applications in spectrometry, spectral imaging and metrology.
Abstract:
A novel tilt-compensated interferometer geometry is described. The design uses tilt- and shear-compensation optics to simultaneously maintain high throughput and precise interferometric alignment, even in the presence of non-ideal scanning motions. The tilt-compensation mechanism consists of a novel beamsplitter/reflector assembly that produces two anti-parallel beams. A variety of enhancements to the basic design are described, providing a family of related interferometer designs. These interferometers have applications in spectrometry, spectral imaging and metrology.
Abstract:
The tilt-compensated interferometers of the present invention are novel variations of Michelson's interferometer that use tilt- and shear-compensation to provide excellent photometric accuracy even when there are imperfections in the scanning motion used to produce variation of path difference. The tilt-compensation mechanism of the present invention consists of antiparallel reflections from a beamsplitter element and a roof reflector element, which elements are held rigidly in alignment. Several particularly useful embodiments of the invention are described. Other advantages of the present invention include photometric stability and reduced cost because manual alignment is not required. This interferometer has applications in spectrometry, spectral imaging and metrology.
Abstract:
A novel variation of Michelson's interferometer uses tilt- and shear-compensation optics to allow various mirror motions to produce variation of path difference. The tilt-compensation mechanism consists of two complementary reflections from a single plane mirror and, in some cases, the beamsplitter, to produce a beam having a constant angle of propagation, typically the same as the input beam. Using a retroreflector to invert the image of a single plane mirror or a sequence of plane mirrors before the second reflections produces complementary reflections. A particularly efficient embodiment of the present invention uses one or more balanced disk-shaped mirrors to effect very rapid variation of path difference by nutation or precession. Other advantages of tilt-compensation include photometric stability. This interferometer has applications in spectrometry, spectral imaging and metrology.