SEMICONDUCTOR MEMORY DEVICE AND CONTROL SIGNAL GENERATING METHOD THEREOF
    1.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE AND CONTROL SIGNAL GENERATING METHOD THEREOF 有权
    半导体存储器件及其控制信号产生方法

    公开(公告)号:US20080225608A1

    公开(公告)日:2008-09-18

    申请号:US12049160

    申请日:2008-03-14

    Abstract: A semiconductor memory device and a control signal generating method thereof. The semiconductor memory device may include a voltage range detector configured to generate a voltage detecting signal corresponding to a range of a level of an external power voltage. A control signal generating portion may be used to generate a control signal corresponding to the range of the level of the external power voltage responsive to the voltage detecting signal. As a result, the semiconductor memory device can perform an operation for satisfying an access time characteristic according to a specification responsive to the control signal.

    Abstract translation: 半导体存储器件及其控制信号产生方法。 半导体存储器件可以包括电压范围检测器,其被配置为产生对应于外部电源电压的电平的范围的电压检测信号。 可以使用控制信号产生部分来响应于电压检测信号产生对应于外部电源电压的电平的范围的控制信号。 结果,半导体存储器件可以根据控制信号执行根据规格满足访问时间特性的操作。

    METHOD AND DEVICE FOR DETECTING SHAPE OF SHEET ROLL
    2.
    发明申请
    METHOD AND DEVICE FOR DETECTING SHAPE OF SHEET ROLL 审中-公开
    用于检测片材形状的方法和装置

    公开(公告)号:US20100245562A1

    公开(公告)日:2010-09-30

    申请号:US12732499

    申请日:2010-03-26

    Applicant: Chung-Ki LEE

    Inventor: Chung-Ki LEE

    Abstract: Disclosed a method and device for detecting a shape of a sheet roll. The method for detecting a shape of a sheet roll comprises positioning a camera on a cylindrical side surface of the sheet roll; photographing a cylindrical side surface while rotating the camera along the cylindrical side surface of a sheet roll; and determining whether there is a defect in a shape of a winding roll by analyzing a pattern of an image acquired by photographing.

    Abstract translation: 公开了用于检测片材卷的形状的方法和装置。 用于检测片材卷的形状的方法包括将相机定位在片材卷的圆柱形侧表面上; 拍摄圆柱形侧表面,同时沿着片卷的圆柱形侧表面旋转照相机; 以及通过分析通过拍摄获取的图像的图案来确定卷绕辊的形状是否存在缺陷。

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