-
1.发明申请公开(公告)号：US20150034826A1
公开(公告)日：2015-02-05
申请号：US13956156
申请日：2013-07-31
申请人： Craig Prater , Kevin Kjoller , Doug Gotthard , Qichi Hu
发明人： Craig Prater , Kevin Kjoller , Doug Gotthard , Qichi Hu
摘要： Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.
摘要翻译： 描述的是使用探针显微镜从样品的亚微米区域获得光谱信息的技术。 本发明使用AFM悬臂在多个频率下的响应基本上减少背景吸收远离感兴趣的亚微米区域的影响。 该创新大大提高了不适用于现有技术的底部照明的样品的自顶向下照射的光谱质量。
-
2.发明授权公开(公告)号：US08242448B2
公开(公告)日：2012-08-14
申请号：US12927248
申请日：2010-11-09
申请人： Craig Prater , Michael Lo , Doug Gotthard , Anthony Kurtz , Kevin Kjoller
发明人： Craig Prater , Michael Lo , Doug Gotthard , Anthony Kurtz , Kevin Kjoller
IPC分类号： G01J5/00
CPC分类号： G01N21/3563 , G01Q30/02
摘要： Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.
摘要翻译： 动态IR辐射功率控制，光束转向和聚焦调整，用于基于原子力显微镜的纳米级红外光谱系统。 在用来自IR源的光照射期间，监测由于局部IR样品吸收而导致AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率，以使吸收率高的位置/波长处的样品过热度最小化，吸收低的位置/波长增加，以保持信噪比。 自动执行光束对准和聚焦优化作为波长的函数。
-
公开(公告)号：US08177422B2
公开(公告)日：2012-05-15
申请号：US12228877
申请日：2008-08-15
申请人： Kevin Kjoller , Khoren Sahagian , Doug Gotthard , Anthony Kurtz , Craig Prater , Roshan Shetty , Michael Reading
发明人： Kevin Kjoller , Khoren Sahagian , Doug Gotthard , Anthony Kurtz , Craig Prater , Roshan Shetty , Michael Reading
摘要： A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.
摘要翻译： 用于在样品表面的区域上自动分析温度转变数据的系统和方法。 该系统依赖于使用微加工探针，其可以被快速加热和冷却，并且具有尖锐的尖端以提供高的空间分辨率。 该系统还具有快速的x-y-z定位器，数据采集和算法，可以自动分析和可视化温度转换数据。
-
公开(公告)号：US20100042356A1
公开(公告)日：2010-02-18
申请号：US12228877
申请日：2008-08-15
申请人： Kevin Kjoller , Khoren Sahagian , Doug Gotthard , Anthony Kurtz , Craig Prater , Roshan Shetty , Michael Reading
发明人： Kevin Kjoller , Khoren Sahagian , Doug Gotthard , Anthony Kurtz , Craig Prater , Roshan Shetty , Michael Reading
IPC分类号： G01N25/02
摘要： A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.
摘要翻译： 用于在样品表面的区域上自动分析温度转变数据的系统和方法。 该系统依赖于使用微加工探针，其可以被快速加热和冷却，并且具有尖锐的尖端以提供高的空间分辨率。 该系统还具有快速的x-y-z定位器，数据采集和算法，可以自动分析和可视化温度转换数据。
-
5.发明申请公开(公告)号：US20110205527A1
公开(公告)日：2011-08-25
申请号：US12927248
申请日：2010-11-09
申请人： Craig Prater , Michael Lo , Doug Gotthard , Anthony Kurtz , Kevin Kjoller
发明人： Craig Prater , Michael Lo , Doug Gotthard , Anthony Kurtz , Kevin Kjoller
IPC分类号： G01N21/35
CPC分类号： G01N21/3563 , G01Q30/02
摘要： Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.
摘要翻译： 动态IR辐射功率控制，光束转向和聚焦调整，用于基于原子力显微镜的纳米级红外光谱系统。 在用来自IR源的光照射期间，监测由于局部IR样品吸收而导致AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率，以使吸收率高的位置/波长处的样品过热度最小化，吸收低的位置/波长增加，以保持信噪比。 自动执行光束对准和聚焦优化作为波长的函数。
-
6.发明授权High frequency deflection measurement of IR absorption with a modulated IR source 有权用调制IR光源进行红外吸收的高频偏转测量公开(公告)号：US08680467B2
公开(公告)日：2014-03-25
申请号：US13236115
申请日：2011-09-19
申请人： Craig Prater , Kevin Kjoller
发明人： Craig Prater , Kevin Kjoller
摘要： A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.
摘要翻译： 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用，而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制，并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。
-
公开(公告)号：US08402819B2
公开(公告)日：2013-03-26
申请号：US12315859
申请日：2008-12-05
申请人： A. Dazzi Dazzi , Clotilde Policar , Kevin Kjoller , Michael Reading , Konstantin Vodopyanov , Craig Prater
发明人： A. Dazzi Dazzi , Clotilde Policar , Kevin Kjoller , Michael Reading , Konstantin Vodopyanov , Craig Prater
CPC分类号： G01Q30/02 , G01N21/3563 , G01Q60/32
摘要： An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
摘要翻译： 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在技术商业化方面存在关于规模，实施成本和结果的重复性/鲁棒性的重大问题。 本发明解决了许多这些问题，从而产生了一般可用于科学界的分析技术的版本。
-
8.发明授权Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer 有权在与表面和纳米级红外光谱仪接触的同时降低二次谐波的微型悬臂梁公开(公告)号：US08387443B2
公开(公告)日：2013-03-05
申请号：US12558150
申请日：2009-09-11
IPC分类号： G01B5/28
摘要： Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.
摘要翻译： 这里描述了用于感测脉冲力的装置和方法。 所描述的装置和方法中的一些也可用于测量红外吸收和编辑表面的光谱和化学图谱。 还描述了当在接触模式下操作时具有降低的谐波频率的微型悬臂梁。 所描述的微悬臂梁中的一些包括内部谐振器，其构造成当微悬臂操作在接触模式时基本上独立于微悬臂尖端和表面之间的摩擦而振动。 所描述的装置和方法中的许多用于以增强的灵敏度监测脉冲力。
-
9.发明申请High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source 有权用调制红外光源进行红外吸收的高频偏转测量公开(公告)号：US20130036521A1
公开(公告)日：2013-02-07
申请号：US13236115
申请日：2011-09-19
申请人： Craig Prater , Kevin Kjoller
发明人： Craig Prater , Kevin Kjoller
IPC分类号： G01Q70/08
摘要： A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.
摘要翻译： 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用，而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制，并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。
-
公开(公告)号：US08646319B2
公开(公告)日：2014-02-11
申请号：US12660266
申请日：2010-02-23
申请人： Craig Prater , Kevin Kjoller
发明人： Craig Prater , Kevin Kjoller
CPC分类号： G01Q30/02
摘要： Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.
摘要翻译： 动态红外辐射功率控制，用于基于原子力显微镜的纳米级红外光谱系统。 在来自IR源的照射期间，监测由于局部IR样品吸收而导致的AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率，以使吸收率高的位置/波长处的样品过热度最小化，吸收低的位置/波长增加，以保持信噪比。
-
-
-
-
-
-
-
-
-
搜索结果
47 条记录 (耗时 0.024 秒)
