Abstract:
A capacitance-sensing circuit may include a channel input associated with measuring a capacitance of a unit cell of a capacitive sense array. The capacitance-sensing circuit may also include a capacitive hardware baseliner that is coupled to the channel input. The capacitive hardware baseliner generates a baseline current based on a time constant of the channel input associated with the measuring of the capacitance of the element of the capacitive sense array using the programmable baseline resistor. The capacitive hardware baseliner provides the baseline current at the channel input to provide a charge for a sense capacitor. A change in the charge of the sense capacitor is provided by the baseline current indicating a presence of a tough object proximate to the element.
Abstract:
A programmable system includes a programmable analog system that is reconfigurable to perform various analog operations, and includes a programmable digital system that is reconfigurable to perform various digital operations. The programmable system also includes a microcontroller capable of reconfiguring and controlling the programmable analog system and the programmable digital system. The programmable digital system is configured to control the programmable analog system autonomously of the microcontroller.
Abstract:
A capacitance-sensing circuit may include a channel input associated with measuring a capacitance of a unit cell of a capacitive sense array. The capacitance-sensing circuit may also include a capacitive hardware baseliner that is coupled to the channel input. The capacitive hardware baseliner may generate a baseline current using a baseline capacitor and may provide the baseline current to the channel input.
Abstract:
A biasing circuit includes cascoded transistors including a first transistor and a second transistor. A first gate of the first transistor is coupled to a second gate of the second transistor at a first node. The circuit also includes a voltage control circuit coupled to at least one of the first transistor or the second transistor. The voltage control circuit is configured to change a voltage level of at least one of the first transistor or the second transistor to allow voltage domain transition of an output signal in view of a change in state of an input signal without ramping a supply signal of the biasing circuit.
Abstract:
A method for compensating for panel capacitance the associated current is proposed, wherein the mutual capacitances of a capacitance sensing array are selectively coupled to drive voltages and to a self capacitance under test.
Abstract:
Over-voltage tolerant circuits and methods are provided. In one embodiment, the circuit includes a pull-up transistor coupled to an I/O pad, a sensing circuit coupled to the I/O pad and to a voltage supply (Vcc), the sensing circuit configured to sense a voltage applied to the pad (Vpad), a latch coupled to the sensing circuit to retain an output of the sensing circuit, and a selection circuit coupled to the sensing circuit through the latch. The selection circuit includes a first bias circuit to apply Vcc to a well and gate of the pull-up transistor, a second bias circuit to apply Vpad to the gate and the well of the pull-up transistor, and a non-overlap circuit configured to ensure the gate and the well of the pull-up transistor is substantially always driven by either the first or the second bias circuit depending on the output of the sensing circuit.
Abstract:
A method for compensating for panel capacitance the associated current is proposed, wherein the mutual capacitances of a capacitance sensing array are selectively coupled to drive voltages and to a self capacitance under test.
Abstract:
A capacitance-sensing circuit may include a channel input associated with measuring a capacitance of a unit cell of a capacitive sense array. The capacitance-sensing circuit may also include a capacitive hardware baseliner that is coupled to the channel input. The capacitive hardware baseliner generates a baseline current based on a time constant of the channel input associated with the measuring of the capacitance of the element of the capacitive sense array using the programmable baseline resistor. The capacitive hardware baseliner provides the baseline current at the channel input to provide a charge for a sense capacitor. A change in the charge of the sense capacitor is provided by the baseline current indicating a presence of a tough object proximate to the element.
Abstract:
A biasing circuit includes cascoded transistors including a first transistor and a second transistor. A first gate of the first transistor is coupled to a second gate of the second transistor at a first node. The circuit also includes a voltage control circuit coupled to at least one of the first transistor or the second transistor. The voltage control circuit is configured to change a voltage level of at least one of the first transistor or the second transistor to allow voltage domain transition of an output signal in view of a change in state of an input signal without ramping a supply signal of the biasing circuit.
Abstract:
A capacitance-sensing circuit may include a channel input associated with measuring a capacitance of a unit cell of a capacitive sense array. The capacitance-sensing circuit may also include a capacitive hardware baseliner that is coupled to the channel input. The capacitive hardware baseliner may generate a baseline current using a baseline capacitor and may provide the baseline current to the channel input.