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公开(公告)号：US20240312774A1
公开(公告)日：2024-09-19
申请号：US18268438
申请日：2021-09-24
Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Peter Kovarik , Thomas Covey , Gordana Ivosev , Chang Liu
CPC classification number: H01J49/0418 , H01J49/0036
Abstract: Systems and methods are disclosed for timed introduction of samples into a mass spectrometer may include receiving a plurality of sample ion pulses in a mass spectrometer from a sampling interface, where the sample ion pulses are received at a pre-determined time pattern; detecting the received sample ion pulses to generate a signal; isolating an analyte signal by signal conditioning the generated signal based on the pre-determined time pattern; and identifying a presence of an analyte based on the isolated analyte signal. The signal conditioning may include pulse-based averaging based on the pre-determined time pattern or may include converting the generated signal to a frequency-domain signal and calculating a modulus to isolate the analyte signal. The pre-determined time pattern may be periodic where the signal conditioning comprises performing a Fourier Transform on the signal to convert it to a frequency-domain signal.
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公开(公告)号：US20180240658A1
公开(公告)日：2018-08-23
申请号：US15750550
申请日：2016-08-09
Applicant: DH Technologies Development Pte. Ltd.
Inventor： David Michael Cox , Gordana Ivosev
CPC classification number: H01J49/0031 , H01J49/0027 , H01J49/004 , H01J49/0045 , H01J49/04 , H01J49/26
Abstract: An m/z range of an ion beam is divided into two or more precursor ion mass selection windows. A pattern of two or more different window m/z ranges to be used during two or more successive cycles for at least one precursor ion mass selection window is determined. The pattern includes an initial window m/z range and one or more successively different window m/z ranges. Each of the one or more successively different window m/z ranges includes at least a portion of the initial window m/z range. A tandem mass spectrometer is instructed to select and fragment the two or more precursor ion mass selection windows during each cycle of a plurality of cycles and to repeatedly use the pattern for each group of two or more successive cycles of the plurality of cycles for the selection and fragmentation of the at least one precursor ion mass selection window.
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公开(公告)号：US20180166264A1
公开(公告)日：2018-06-14
申请号：US15576875
申请日：2016-05-26
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Lyle Lorrence Burton , Gordana Ivosev
CPC classification number: H01J49/0036 , G06F19/709 , H01J49/0072
Abstract: One or more known compounds of a sample are ionized. At least one precursor ion corresponding to a compound of the one or more known compounds is selected and fragmented, producing a product ion mass spectrum for the precursor ion. An m/z tolerance probability function that varies from 1 to 0 with increasing values of an m/z difference between two mass peaks and that includes one or more values between 1 and 0 is received. A library product ion mass spectrum for the at least one compound is retrieved from a memory. An m/z difference between at least one experimental product ion mass peak in the product ion mass spectrum and at least one library product ion mass peak in the library product ion mass spectrum is calculated. An m/z tolerance probability that determines if the two peaks are corresponding peaks is calculated from the m/z difference using the probability function.
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公开(公告)号：US09991104B2
公开(公告)日：2018-06-05
申请号：US14401030
申请日：2013-04-19
Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Bruce Andrew Collings , Martian Dima , Gordana Ivosev
CPC classification number: H01J49/0027 , G01T1/171 , H01J49/0009 , H01J49/0036 , H01J49/025
Abstract: Systems and methods are provided to perform dead time correction. An observed ion count rate is obtained using a non-paralyzable detection system of a mass spectrometer. The detection system includes an ion detector, a comparator/discriminator, a mono-stable circuit and a counter. The non-paralyzable detection system exhibits dead time extension at high count rates. The extension of the dead time occurs because the mono-stable circuit requires a rising edge to trigger and can only be triggered again after the output pulse from the comparator/discriminator has gone low. This allows a second comparator/discriminator pulse arriving just before the end of the dead time started by a first comparator/discriminator pulse to extend the dead time to the trailing edge of the second comparator/discriminator pulse. A true ion count rate is calculated by performing dead time correction of the observed ion count rate.
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5.发明公开公开(公告)号：US20240331991A1
公开(公告)日：2024-10-03
申请号：US18739836
申请日：2024-06-11
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Nic G. Bloomfield , Gordana Ivosev
CPC classification number: H01J49/0036 , G06F17/16 , G06F17/17 , H01J49/0045
Abstract: A precursor ion transmission window is moved in overlapping steps across a precursor ion mass range. The precursor ions transmitted at each overlapping step by the mass filter are fragmented or transmitted. Intensities or counts are detected for each of the one or more resulting product ions or precursor ions for each overlapping window that form mass spectrum data for each overlapping window. Each unique product ion detected is encoded in real-time during data acquisition. This encoding includes sums of counts or intensities of each unique ion detected the overlapping windows and positions of the windows associated with each sum. The encoding for each unique ion is stored in a memory device rather than the mass spectral data. A deblurring algorithm or numerical method is used to determine a precursor ion of each unique ion from the encoded data.
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Patent Agency Ranking
公开(公告)号：US08560248B2
公开(公告)日：2013-10-15
申请号：US13737236
申请日：2013-01-09
Applicant: DH Technologies Development PTE. LTD.
Inventor： Gordana Ivosev
IPC: G01N31/00
CPC classification number: H01J49/0036 , H01J49/4265
Abstract: Systems and methods are used to predict intensities for points not measured or not measured with a high degree of confidence of a peak using a peak predictor. A set of data is selected from the plurality of intensity measurements that includes a peak. Confidence values are assigned to each data point in the set of data producing a plurality of confidence value weighted data points. A peak predictor is selected. The peak predictor is applied to the plurality of confidence value weighted data points of the peak that have confidence values greater than a first threshold level using the prediction module, producing predicted intensities for data points of the peak not measured and/or measured data points of the peak that have confidence values less than or equal to a second threshold level. The confidence values can include system confidence values, predictor confidence values, or any combination of the two.
Abstract translation: 系统和方法用于使用峰值预测器以峰值的高置信度来预测未测量或未测量的点的强度。 从包括峰值的多个强度测量值中选择一组数据。 将置信度值分配给产生多个置信度值加权数据点的数据集合中的每个数据点。 选择峰值预测器。 使用预测模块将峰值预测器应用于具有大于第一阈值水平的置信度值的峰值的多个置信值加权数据点，产生未测量的峰值和/或测量数据点的数据点的预测强度 具有小于或等于第二阈值水平的置信度值的峰值。 置信度值可以包括系统置信度值，预测器置信度值或两者的任何组合。
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公开(公告)号：US10732156B2
公开(公告)日：2020-08-04
申请号：US15303690
申请日：2015-04-14
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana Ivosev
Abstract: Systems and methods are provided for calculating the area of a peak profile using information from one or more correlated peak profiles. One or more compounds are separated from a mixture over time using a separation device. Traces of the one or more compounds are monitored during the separation using a tandem mass spectrometer. A plurality of intensity measurements are received using a processor. A first peak profile for a compound of interest is detected from the plurality of intensity measurements for a first trace and one or more correlated peak profiles for the compound of interest are detected from the plurality of intensity measurements for one or more other traces using the processor. An area of the first peak profile is calculated based on the one or more correlated peak profiles using the processor.
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8.发明授权公开(公告)号：US10651019B2
公开(公告)日：2020-05-12
申请号：US16320111
申请日：2017-07-19
Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Gordana Ivosev , Nic G. Bloomfield , Michael Murphy , Stephen A. Tate
Abstract: A system is disclosed for identifying a precursor ion of a product ion in a scanning DIA experiment. A precursor ion mass selection window is scanned across a precursor ion mass range of interest, producing a series of overlapping windows across the precursor ion mass range. Each overlapping window is fragmented and mass analyzed, producing a plurality of product ion spectra for the mass range. A product ion is selected from the spectra. Intensities for the selected product ion are retrieved for at least one scan across the mass range producing a trace of intensities versus precursor ion m/z. A matrix multiplication equation is created that describes how one or more precursor ions correspond to the trace for the selected product ion. The matrix multiplication equation is solved for one or more precursor ions corresponding to the selected product ion using a numerical method.
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公开(公告)号：US20170038351A1
公开(公告)日：2017-02-09
申请号：US15303690
申请日：2015-04-14
Applicant: DH Technologies Development Pte. Ltd.
Inventor： Gordana Ivosev
CPC classification number: G01N30/8631 , G01N30/72 , G01N30/8634 , G01N30/8637 , G01N30/96 , H01J49/004
Abstract: Systems and methods are provided for calculating the area of a peak profile using information from one or more correlated peak profiles. One or more compounds are separated from a mixture over time using a separation device. Traces of the one or more compounds are monitored during the separation using a tandem mass spectrometer. A plurality of intensity measurements are received using a processor. A first peak profile for a compound of interest is detected from the plurality of intensity measurements for a first trace and one or more correlated peak profiles for the compound of interest are detected from the plurality of intensity measurements for one or more other traces using the processor. An area of the first peak profile is calculated based on the one or more correlated peak profiles using the processor.
Abstract translation: 提供的系统和方法用于使用来自一个或多个相关峰分布的信息来计算峰分布的面积。 使用分离装置随时间将一种或多种化合物与混合物分离。 使用串联质谱仪在分离期间监测一种或多种化合物的踪迹。 使用处理器接收多个强度测量。 从第一迹线的多个强度测量值中检测感兴趣的化合物的第一峰曲线，并且使用处理器从一个或多个其他迹线的多个强度测量中检测感兴趣的化合物的一个或多个相关峰值曲线 。 基于使用处理器的一个或多个相关峰值曲线来计算第一峰值曲线的面积。
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公开(公告)号：US20150142361A1
公开(公告)日：2015-05-21
申请号：US14401030
申请日：2013-04-19
Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Inventor： Bruce Andrew Collings , Martian Dima , Gordana Ivosev
IPC: H01J49/00
CPC classification number: H01J49/0027 , G01T1/171 , H01J49/0009 , H01J49/0036 , H01J49/025
Abstract: Systems and methods are provided to perform dead time correction. An observed ion count rate is obtained using a non-paralyzable detection system of a mass spectrometer. The detection system includes an ion detector, a comparator/discriminator, a mono-stable circuit and a counter. The non-paralyzable detection system exhibits dead time extension at high count rates. The extension of the dead time occurs because the mono-stable circuit requires a rising edge to trigger and can only be triggered again after the output pulse from the comparator/discriminator has gone low. This allows a second comparator/discriminator pulse arriving just before the end of the dead time started by a first comparator/discriminator pulse to extend the dead time to the trailing edge of the second comparator/discriminator pulse. A true ion count rate is calculated by performing dead time correction of the observed ion count rate.
Abstract translation: 提供系统和方法来执行死区时间校正。 使用质谱仪的非可分离检测系统获得观察到的离子计数率。 检测系统包括离子检测器，比较器/鉴别器，单稳态电路和计数器。 非可分析检测系统以高计数率显示死区时间延长。 由于单稳态电路需要上升沿触发，只能在比较器/鉴位器的输出脉冲变低后再次触发，才会延长死区时间。 这允许在由第一比较器/鉴频器脉冲开始的死区时间结束之前到达第二比较器/鉴频器脉冲，以将死区时间延长到第二比较器/鉴频器脉冲的后沿。 通过对观察到的离子计数率执行死区时间校正来计算真实的离子计数率。
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