摘要:
The invention pertains to the field of image processing in digital pathology. It notably proposes a method for processing a first digital image, representing a sample in a region, and which image has been acquired from the sample by means of a microscopic imaging system (1) and is stored in a multi-resolution image data structure (80), comprising the steps of:—retrieving (104) a sub-region of the first digital image at a first resolution, —executing (105) a transform function on the retrieved sub-region, the transform function modifying a content of the sub-region according to at least one metric derived from a second resolution representation of the first digital image.
摘要:
The invention pertains to the field of image processing in digital pathology. It notably proposes a method for processing a first digital image, representing a sample in a region, and which image has been acquired from the sample by means of a microscopic imaging system (1) and is stored in a multi-resolution image data structure (80), comprising the steps of:—retrieving (104) a sub-region of the first digital image at a first resolution, —executing (105) a transform function on the retrieved sub-region, the transform function modifying a content of the sub-region according to at least one metric derived from a second resolution representation of the first digital image.
摘要:
The invention provides a method of determining the distortion of an imaging system (32), the imaging system having an object plane (40) and an image plane (42). The method comprises the steps of determining (204) the positions of the image light spots (46) on a sensitive area (44) of an image sensor (34) by analyzing the image data; and fitting (205) a mapping function such that the mapping function maps the lattice points of an auxiliary lattice (48) into the positions of the image light spots (46), wherein the auxiliary lattice (48) is geometrically similar to the Bravais lattice (8) of the probe light spots (6). The invention also provides a method of imaging a sample, using an imaging system (32) having an object plane (40) and an image plane (42), the method comprising the steps of determining (304) readout points on the sensitive area (44) of an image sensor (34) by applying a mapping function to the lattice points of an auxiliary lattice (48), the auxiliary lattice being geometrically similar to a Bravais lattice (8) of probe light spots (6); and reading (305) image data from the readout points on the sensitive area (44). Also disclosed are a measuring system (10) for determining the distortion of an imaging system, and a multispot optical scanning device (10).
摘要:
The present invention relates to the field of digital pathology and in particular to whole slide scanners. A tilted autofocus image sensor images an oblique cross-section of the slide. For focusing multiple sequential overlapping images, which have been taken by the tilted sensor, are compared. The axial position of the tissue layer can be determined from the polar error signal resulting from this differential measurement.
摘要:
The present invention relates to the field of digital pathology and in particular to whole slide scanners. Autofocus imaging can be performed by sampling a first number of pixels of a primary image sensor and sampling a second number of pixels of an autofocus image sensor, wherein the second number is between one quarter and three quarters of the first number. Thus, continuous autofocus for rapid light scanning may be provided based on an additional image sensor that is tilted with respect to the optical axis.
摘要:
A scanning microscope (10) comprises a stage (18) for holding a sample (20), a scan mechanism, a probing system for probing a region (24) of the sample (20), a position sensor (80, 82), and a controller. The scan mechanism is designed for translating the stage (18) between at least two axial positions. The probing system 10 comprises an optical element and a photosensor having a readout region, wherein the readout region extends in a direction (14), which is transverse to an ideal orientation (72) of the stage (18). The position sensor (80, 82) serves for measuring a transverse position (84, 86) of the stage (18) and/or of an orientation (74) of the stage (18). The controller (30) serves for adapting the probing system as a function of the measured 15 transverse position (84, 86) and/or the measured orientation (74).
摘要:
A method of imaging a sample comprises the steps of: -providing S1 a reference array of spots 104, -illuminating the sample 106 with the reference array of spots 104 and acquiring S2 at least one sample image IMSi comprising a sample related array of spots 107 resulting from the reference array of spots interacting with the sample 106, -determining S3 a spot characterizing parameter for each of a plurality of sample related spots, and -constructing S4 an image of the sample IM, By plotting the spot characterizing parameter for each of the plurality of sample related spots at the respective sample related spot position.
摘要:
The invention relates to a method of imaging a sample with a scanning microscope and an imaging system for a scanning microscope, comprising the steps of: initiating an exposure phase of a detector (34) by a pulsed laser source (12); generating an optical image of the sample on the detector with a lens system (32); and terminating the exposure phase. According to the invention, the step of generating the optical image comprises a step of displacing the optical image on the detector with an image displacement means (40) between two consecutive laser pulses. The image displacement means comprise a rotatable mirror (40) situated on an optical path from the sample (26) to the detector (34).
摘要:
A scanning microscope includes a stage for holding a sample, a scan mechanism, a probing system for probing a region of the sample, a position sensor, and a controller. The scan mechanism is configured to translate the stage between at least two axial positions. The probing system includes an optical element and a photosensor having a readout region, where the readout region extends in a direction which is transverse to an ideal orientation of the stage. The position sensor is configured to measure a transverse position of the stage and/or of an orientation of the stage. The controller is configured to adapt the probing system as a function of the measured transverse position and/or the measured orientation.
摘要:
An autofocus imaging system for a microscope system includes a tilted autofocus image sensor that images an oblique cross-section of a slide. The autofocus imaging system focuses multiple sequential overlapping images, which have been taken by the tilted autofocus image sensor, by making a comparison of the multiple sequential overlapping images. An axial position of a tissue layer on the slide can be determined from a polar error signal resulting from this comparison.