MEASURING AND CORRECTING LENS DISTORTION IN A MULTISPOT SCANNING DEVICE
    1.
    发明申请
    MEASURING AND CORRECTING LENS DISTORTION IN A MULTISPOT SCANNING DEVICE 审中-公开
    测量和校正多个扫描设备中的镜头失真

    公开(公告)号:US20110134254A1

    公开(公告)日:2011-06-09

    申请号:US13058066

    申请日:2009-08-07

    IPC分类号: H04N17/00

    摘要: The invention provides a method of determining the distortion of an imaging system (32), the imaging system having an object plane (40) and an image plane (42). The method comprises the steps of determining (204) the positions of the image light spots (46) on a sensitive area (44) of an image sensor (34) by analyzing the image data; and fitting (205) a mapping function such that the mapping function maps the lattice points of an auxiliary lattice (48) into the positions of the image light spots (46), wherein the auxiliary lattice (48) is geometrically similar to the Bravais lattice (8) of the probe light spots (6). The invention also provides a method of imaging a sample, using an imaging system (32) having an object plane (40) and an image plane (42), the method comprising the steps of determining (304) readout points on the sensitive area (44) of an image sensor (34) by applying a mapping function to the lattice points of an auxiliary lattice (48), the auxiliary lattice being geometrically similar to a Bravais lattice (8) of probe light spots (6); and reading (305) image data from the readout points on the sensitive area (44). Also disclosed are a measuring system (10) for determining the distortion of an imaging system, and a multispot optical scanning device (10).

    摘要翻译: 本发明提供了一种确定成像系统(32)的失真的方法,该成像系统具有物体平面(40)和图像平面(42)。 该方法包括以下步骤:通过分析图像数据来确定(204)图像光点(46)在图像传感器(34)的敏感区域(44)上的位置; 以及拟合(205)映射函数,使得所述映射函数将辅助格子(48)的格点映射到所述图像光点(46)的位置,其中所述辅格(48)几何地类似于所述布拉维点阵 (8)的探针光斑(6)。 本发明还提供了一种使用具有物平面(40)和图像平面(42)的成像系统(32)对样本进行成像的方法,所述方法包括以下步骤:确定(304)敏感区域上的读出点 44)通过对辅助晶格(48)的格点施加映射函数,辅助晶格在几何上类似于探针光点(6)的布拉维点阵(8); 以及从敏感区域(44)上的读出点读取(305)图像数据。 还公开了一种用于确定成像系统的失真的测量系统(10)和多光学光学扫描装置(10)。

    Image processing method in microscopy
    2.
    发明授权
    Image processing method in microscopy 有权
    显微镜图像处理方法

    公开(公告)号:US08995790B2

    公开(公告)日:2015-03-31

    申请号:US13703513

    申请日:2011-06-10

    IPC分类号: G06K9/32 G06K9/00 G06T3/00

    摘要: The invention pertains to the field of image processing in digital pathology. It notably proposes a method for processing a first digital image, representing a sample in a region, and which image has been acquired from the sample by means of a microscopic imaging system (1) and is stored in a multi-resolution image data structure (80), comprising the steps of:—retrieving (104) a sub-region of the first digital image at a first resolution, —executing (105) a transform function on the retrieved sub-region, the transform function modifying a content of the sub-region according to at least one metric derived from a second resolution representation of the first digital image.

    摘要翻译: 本发明涉及数字病理学中的图像处理领域。 特别提出了一种用于处理第一数字图像的方法,其表示区域中的样本,并且已经通过显微镜成像系统(1)从样本获取了哪个图像,并且被存储在多分辨率图像数据结构中 80),包括以下步骤:以第一分辨率恢复(104)第一数字图像的子区域, - 对所检索的子区域执行(105)变换函数,所述变换函数修改所述第一数字图像的内容 根据从第一数字图像的第二分辨率表示导出的至少一个量度的子区域。

    AUTOFOCUS BASED ON DIFFERENTIAL MEASUREMENTS
    3.
    发明申请
    AUTOFOCUS BASED ON DIFFERENTIAL MEASUREMENTS 有权
    基于差异测量的自动对焦

    公开(公告)号:US20130093874A1

    公开(公告)日:2013-04-18

    申请号:US13805555

    申请日:2011-06-17

    申请人: Bas Hulsken

    发明人: Bas Hulsken

    IPC分类号: H04N5/232

    摘要: The present invention relates to the field of digital pathology and in particular to whole slide scanners. A tilted autofocus image sensor images an oblique cross-section of the slide. For focusing multiple sequential overlapping images, which have been taken by the tilted sensor, are compared. The axial position of the tissue layer can be determined from the polar error signal resulting from this differential measurement.

    摘要翻译: 本发明涉及数字病理学领域,特别涉及整个幻灯片扫描器。 倾斜的自动对焦图像传感器成像幻灯片的斜横截面。 对于聚焦由倾斜传感器拍摄的多个顺序重叠图像进行对比。 组织层的轴向位置可以由该差分测量得到的极性误差信号确定。

    SCANNING MICROSCOPE
    5.
    发明申请
    SCANNING MICROSCOPE 有权
    扫描显微镜

    公开(公告)号:US20110292200A1

    公开(公告)日:2011-12-01

    申请号:US13139551

    申请日:2009-12-10

    IPC分类号: H04N7/18

    摘要: A scanning microscope (10) comprises a stage (18) for holding a sample (20), a scan mechanism, a probing system for probing a region (24) of the sample (20), a position sensor (80, 82), and a controller. The scan mechanism is designed for translating the stage (18) between at least two axial positions. The probing system 10 comprises an optical element and a photosensor having a readout region, wherein the readout region extends in a direction (14), which is transverse to an ideal orientation (72) of the stage (18). The position sensor (80, 82) serves for measuring a transverse position (84, 86) of the stage (18) and/or of an orientation (74) of the stage (18). The controller (30) serves for adapting the probing system as a function of the measured 15 transverse position (84, 86) and/or the measured orientation (74).

    摘要翻译: 扫描显微镜(10)包括用于保持样品(20)的台(18),扫描机构,用于探测样品(20)的区域(24)的探测系统,位置传感器(80,82) 和控制器。 扫描机构设计用于在至少两个轴向位置之间平移台架(18)。 探测系统10包括光学元件和具有读出区域的光电传感器,其中读出区域沿横向于平台(18)的理想取向(72)的方向(14)延伸。 位置传感器(80,82)用于测量载物台(18)的横向位置(84,86)和/或台架(18)的取向(74)。 控制器(30)用于根据测量的15横向位置(84,86)和/或所测量的取向(74)来调整探测系统。

    METHOD OF IMAGING A SAMPLE
    6.
    发明申请
    METHOD OF IMAGING A SAMPLE 审中-公开
    成像方法

    公开(公告)号:US20110025837A1

    公开(公告)日:2011-02-03

    申请号:US12672551

    申请日:2008-08-12

    IPC分类号: G06K9/60 H04N7/18

    摘要: A method of imaging a sample comprises the steps of: -providing S1 a reference array of spots 104, -illuminating the sample 106 with the reference array of spots 104 and acquiring S2 at least one sample image IMSi comprising a sample related array of spots 107 resulting from the reference array of spots interacting with the sample 106, -determining S3 a spot characterizing parameter for each of a plurality of sample related spots, and -constructing S4 an image of the sample IM, By plotting the spot characterizing parameter for each of the plurality of sample related spots at the respective sample related spot position.

    摘要翻译: 一种对样本进行成像的方法包括以下步骤: - 提供斑点104的参考阵列, - 用点104的参考阵列照亮样本106,并且获取S2至少一个样本图像IMSi,其包括样本相关的点阵列107 由与样本106相互作用的点的参考阵列产生, - 确定S3是多个样本相关斑点中的每一个的斑点特征参数,以及 - 构造样本IM的图像,通过绘制样本IM的图像 在相应样品相关点位置处的多个样品相关斑点。

    SCANNING MICROSCOPE AND METHOD OF IMAGING A SAMPLE
    7.
    发明申请
    SCANNING MICROSCOPE AND METHOD OF IMAGING A SAMPLE 审中-公开
    扫描显微镜和成像方法

    公开(公告)号:US20100314533A1

    公开(公告)日:2010-12-16

    申请号:US12809355

    申请日:2008-12-18

    IPC分类号: G02B21/36

    摘要: The invention relates to a method of imaging a sample with a scanning microscope and an imaging system for a scanning microscope, comprising the steps of: initiating an exposure phase of a detector (34) by a pulsed laser source (12); generating an optical image of the sample on the detector with a lens system (32); and terminating the exposure phase. According to the invention, the step of generating the optical image comprises a step of displacing the optical image on the detector with an image displacement means (40) between two consecutive laser pulses. The image displacement means comprise a rotatable mirror (40) situated on an optical path from the sample (26) to the detector (34).

    摘要翻译: 本发明涉及一种利用扫描显微镜和用于扫描显微镜的成像系统对样品进行成像的方法,包括以下步骤:通过脉冲激光源(12)启动检测器(34)的曝光阶段; 用透镜系统(32)在检测器上产生样品的光学图像; 并终止曝光阶段。 根据本发明,产生光学图像的步骤包括用两个连续激光脉冲之间的图像位移装置(40)移动检测器上的光学图像的步骤。 图像位移装置包括位于从样品(26)到检测器(34)的光路上的可旋转镜(40)。

    Determining a polar error signal of a focus position of an autofocus imaging system
    9.
    发明授权
    Determining a polar error signal of a focus position of an autofocus imaging system 有权
    确定自动对焦成像系统的焦点位置的极性误差信号

    公开(公告)号:US09578227B2

    公开(公告)日:2017-02-21

    申请号:US13805555

    申请日:2011-06-17

    申请人: Bas Hulsken

    发明人: Bas Hulsken

    摘要: An autofocus imaging system for a microscope system includes a tilted autofocus image sensor that images an oblique cross-section of a slide. The autofocus imaging system focuses multiple sequential overlapping images, which have been taken by the tilted autofocus image sensor, by making a comparison of the multiple sequential overlapping images. An axial position of a tissue layer on the slide can be determined from a polar error signal resulting from this comparison.

    摘要翻译: 用于显微镜系统的自动对焦成像系统包括倾斜的自动对焦图像传感器,其对幻灯片的斜横截面进行成像。 自动对焦成像系统通过对多个顺序重叠图像进行比较来聚焦由倾斜的自动聚焦图像传感器拍摄的多个顺序重叠图像。 载玻片上的组织层的轴向位置可以由该比较产生的极性误差信号确定。

    Up-concentration of organic microobjects for microscopic imaging
    10.
    发明授权
    Up-concentration of organic microobjects for microscopic imaging 有权
    用于显微镜成像的有机微量物质的上调

    公开(公告)号:US09128016B2

    公开(公告)日:2015-09-08

    申请号:US13263997

    申请日:2010-04-14

    IPC分类号: G01N15/06 G01N1/40

    摘要: A method of analyzing a sample fluid containing organic microobjects is proposed. The method comprises the steps of: up-concentrating (S1) the microobjects by removing, in a total time T1, a volume V1 of the sample fluid from the upconcentrate sample microobjects; immersing (S2) the microobjects in a transfer fluid, or leaving the microobjects in a remaining portion of the sample fluid, the remaining portion of the sample fluid then providing the transfer fluid; filtering (S3), in a total time T3, a volume V3 of the transfer fluid by a filter, thereby accumulating the microobjects on the filter; and generating (S4) an image of the microobjects accumulated on the filter; wherein the throughput V1/T1 of the step of up-concentrating (S1) is greater than the throughput V1/T1, of the step of filtering (S3). The filter may be a second filter, and the step of up-concentrating (S1) may involve: filtering the sample fluid by a first filter, thereby accumulating the microobjects on the first filter. An apparatus or system for analyzing a sample fluid containing organic microobjects is also disclosed.

    摘要翻译: 提出了一种分析含有机微物体样品液的方法。 该方法包括以下步骤:通过在总时间T1中去除来自上升浓度样品微物体的样品流体的体积V1来上升(S1)微观对象; 将微量物体浸入(S2)到转移流体中,或将微量物体留在样品流体的剩余部分中,然后将样品流体的剩余部分提供转移流体; 在总时间T3中过滤(S3)通过过滤器传送流体的体积V3,从而将微物体累积在过滤器上; 以及生成(S4)累积在所述过滤器上的所述微物体的图像; 其特征在于,上述浓缩步骤(S1)的吞吐量V1 / T1大于滤波步骤的吞吐量V1 / T1(S3)。 过滤器可以是第二过滤器,并且上集中(S1)的步骤可以包括:通过第一过滤器过滤样品流体,从而将微物体累积在第一过滤器上。 还公开了一种用于分析含有机微物体的样品流体的装置或系统。