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公开(公告)号：US09330324B2
公开(公告)日：2016-05-03
申请号：US13541775
申请日：2012-07-05
申请人： Daniel Cohen , Dmitri Rais , Erez Sali , Niv Galezer , Alexander Shpunt
发明人： Daniel Cohen , Dmitri Rais , Erez Sali , Niv Galezer , Alexander Shpunt
CPC分类号： G06K9/2036 , G06K2209/40 , G06T7/521 , G06T2207/30196 , H04N13/254 , H04N13/271
摘要： A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern using an array of detector elements, and processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets including at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array. The method further includes computing a correction factor in response to the first offset, applying the correction factor to the second offset so as to find a corrected offset, and computing depth coordinates of the object in response to the corrected offset.
摘要翻译： 一种用于形成物体的三维（3D）地图的方法，包括从光源照射物体以将图案投射到物体上，使用检测器元件的阵列捕获图案的图像，并且处理 拍摄图像，以便相对于参考图案测量所捕获的图像中的图案的元素的相应偏移，所述偏移包括图案的第一元素的第一偏移和图案的第二元素的第二偏移的至少第一偏移， 分别在阵列的平面中的第一和第二，相互垂直的方向测量。 所述方法还包括：响应于所述第一偏移来计算校正因子，将所述校正因子应用于所述第二偏移，以便找到校正的偏移量，以及响应于校正的偏移来计算所述物体的深度坐标。
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公开(公告)号：US20120281240A1
公开(公告)日：2012-11-08
申请号：US13541775
申请日：2012-07-05
申请人： Daniel Cohen , Dmitri Rais , Erez Sali , Niv Galezer , Alexander Shpunt
发明人： Daniel Cohen , Dmitri Rais , Erez Sali , Niv Galezer , Alexander Shpunt
IPC分类号： G01B11/25
CPC分类号： G06K9/2036 , G06K2209/40 , G06T7/521 , G06T2207/30196 , H04N13/254 , H04N13/271
摘要： A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern using an array of detector elements, and processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets including at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array. The method further includes computing a correction factor in response to the first offset, applying the correction factor to the second offset so as to find a corrected offset, and computing depth coordinates of the object in response to the corrected offset.
摘要翻译： 一种用于形成物体的三维（3D）地图的方法，包括从光源照射物体以将图案投射到物体上，使用检测器元件的阵列捕获图案的图像，并且处理 拍摄图像，以便相对于参考图案测量所捕获的图像中的图案的元素的相应偏移，所述偏移包括图案的第一元素的第一偏移和图案的第二元素的第二偏移的至少第一偏移， 分别在阵列的平面中的第一和第二，相互垂直的方向测量。 所述方法还包括：响应于所述第一偏移来计算校正因子，将所述校正因子应用于所述第二偏移，以便找到校正的偏移量，以及响应于校正的偏移来计算所述物体的深度坐标。
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公开(公告)号：US20110096182A1
公开(公告)日：2011-04-28
申请号：US12605340
申请日：2009-10-25
申请人： Daniel Cohen , Dmitri Rais , Erez Sali , Niv Galezer , Alexander Shpunt
发明人： Daniel Cohen , Dmitri Rais , Erez Sali , Niv Galezer , Alexander Shpunt
CPC分类号： G06K9/2036 , G06K2209/40 , G06T7/521 , G06T2207/30196 , H04N13/254 , H04N13/271
摘要： A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern using an array of detector elements, and processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets including at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array. The method further includes computing a correction factor in response to the first offset, applying the correction factor to the second offset so as to find a corrected offset, and computing depth coordinates of the object in response to the corrected offset.
摘要翻译： 一种用于形成物体的三维（3D）地图的方法，包括从光源照射物体以将图案投射到物体上，使用检测器元件的阵列捕获图案的图像，并且处理 拍摄图像，以便相对于参考图案测量所捕获的图像中的图案的元素的相应偏移，所述偏移包括图案的第一元素的第一偏移和图案的第二元素的第二偏移的至少第一偏移， 分别在阵列的平面中的第一和第二，相互垂直的方向测量。 所述方法还包括：响应于所述第一偏移来计算校正因子，将所述校正因子应用于所述第二偏移，以便找到校正的偏移量，以及响应于校正的偏移来计算所述物体的深度坐标。
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公开(公告)号：US08786682B2
公开(公告)日：2014-07-22
申请号：US12707678
申请日：2010-02-18
申请人： Alexander Shpunt , Dmitri Rais , Niv Galezer
发明人： Alexander Shpunt , Dmitri Rais , Niv Galezer
CPC分类号： H04N13/218 , G01B11/2518 , G01B11/2545 , G06K9/2036 , G06T1/0007 , G06T7/521 , H04N13/254
摘要： A method including providing a device that projects a pattern of coherent radiation. The method further includes capturing a reference image of the pattern using an image sensor by projecting the pattern of the coherent radiation onto a reference surface and engendering a relative motion between the reference surface and the image sensor while capturing the reference image. The method also includes storing the reference image in a memory associated with the device.
摘要翻译： 一种方法，包括提供投影相干辐射图案的装置。 该方法还包括通过将相干辐射的图案投影到参考表面上并使用图像传感器捕获图案的参考图像，并在捕获参考图像的同时产生参考表面和图像传感器之间的相对运动。 该方法还包括将参考图像存储在与该设备相关联的存储器中。
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公开(公告)号：US20100225746A1
公开(公告)日：2010-09-09
申请号：US12707678
申请日：2010-02-18
申请人： Alexander Shpunt , Dmitri Rais , Niv Galezer
发明人： Alexander Shpunt , Dmitri Rais , Niv Galezer
CPC分类号： H04N13/218 , G01B11/2518 , G01B11/2545 , G06K9/2036 , G06T1/0007 , G06T7/521 , H04N13/254
摘要： A method including providing a device that projects a pattern of coherent radiation. The method further includes capturing a reference image of the pattern using an image sensor by projecting the pattern of the coherent radiation onto a reference surface and engendering a relative motion between the reference surface and the image sensor while capturing the reference image. The method also includes storing the reference image in a memory associated with the device.
摘要翻译： 一种方法，包括提供投影相干辐射图案的装置。 该方法还包括通过将相干辐射的图案投影到参考表面上并使用图像传感器捕获图案的参考图像，并在捕获参考图像的同时产生参考表面和图像传感器之间的相对运动。 该方法还包括将参考图像存储在与该设备相关联的存储器中。
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6.发明授权Optical projector with beam monitor including mapping apparatus capturing image of pattern projected onto an object 有权具有光束监视器的光学投影仪，包括捕获投影到对象上的图案的映射设备公开(公告)号：US08492696B2
公开(公告)日：2013-07-23
申请号：US12945908
申请日：2010-11-15
申请人： Ronen Akerman , Dudu Voschina , Niv Galezer , Yoed Arieli , Tomer Segev , Zafrir Mor , Alexander Shpunt
发明人： Ronen Akerman , Dudu Voschina , Niv Galezer , Yoed Arieli , Tomer Segev , Zafrir Mor , Alexander Shpunt
IPC分类号： H01L27/00
CPC分类号： H01L31/14 , G02B5/1842 , H01L31/0203 , H01L31/0232 , H01L31/02325
摘要： Optical apparatus includes a device package, with a radiation source contained in the package and configured to emit a beam of coherent radiation. A diffractive optical element (DOE) is mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders. An optical detector is positioned in the package so as to receive and sense an intensity of a selected diffraction order of the DOE.
摘要翻译： 光学设备包括器件封装，其中包含在封装中的辐射源并且被配置为发射相干辐射束。 衍射光学元件（DOE）安装在封装中，以将辐射源的辐射接收并衍射成包括多个衍射级的预定图案。 光学检测器位于封装中，以便接收和感测DOE的选定衍射级的强度。
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公开(公告)号：US20110114857A1
公开(公告)日：2011-05-19
申请号：US12945908
申请日：2010-11-15
申请人： Ronen Akerman , Dudu Voschina , Niv Galezer , Yoed Arieli , Tomer Segev , Zafrir Mor , Alexander Shpunt
发明人： Ronen Akerman , Dudu Voschina , Niv Galezer , Yoed Arieli , Tomer Segev , Zafrir Mor , Alexander Shpunt
CPC分类号： H01L31/14 , G02B5/1842 , H01L31/0203 , H01L31/0232 , H01L31/02325
摘要： Optical apparatus includes a device package, with a radiation source contained in the package and configured to emit a beam of coherent radiation. A diffractive optical element (DOE) is mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders. An optical detector is positioned in the package so as to receive and sense an intensity of a selected diffraction order of the DOE.
摘要翻译： 光学设备包括器件封装，其中包含在封装中的辐射源并且被配置为发射相干辐射束。 衍射光学元件（DOE）安装在封装中，以将辐射源的辐射接收并衍射成包括多个衍射级的预定图案。 光学检测器位于封装中，以便接收和感测DOE的选定衍射级的强度。
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