公开(公告)号：US20110121331A1

公开(公告)日：2011-05-26

申请号：US12624156

申请日：2009-11-23

Applicant: Dmitri SIMONIAN ,  Grigoriy BASIN

Inventor： Dmitri SIMONIAN ,  Grigoriy BASIN

IPC: H01L33/00

CPC classification number: H01L33/504 ,  H01L25/167 ,  H01L33/56 ,  H01L33/641 ,  H01L33/644 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A device includes a semiconductor structure comprising a light emitting layer disposed between an n-type region and a p-type region. A luminescent material is positioned in a path of light emitted by the light emitting layer. A thermal coupling material is disposed in a transparent material. The thermal coupling material has a thermal conductivity greater than a thermal conductivity of the transparent material. The thermal coupling material is positioned to dissipate heat from the luminescent material.

Abstract translation: 一种器件包括半导体结构，其包括设置在n型区域和p型区域之间的发光层。 发光材料位于由发光层发射的光的路径中。 热耦合材料设置在透明材料中。 热耦合材料的导热率大于透明材料的热导率。 热耦合材料被定位成散发来自发光材料的热量。

公开(公告)号：US20120113433A1

公开(公告)日：2012-05-10

申请号：US13269698

申请日：2011-10-10

Applicant: Sergiy PRYADKIN ,  Dmitri SIMONIAN

Inventor： Sergiy PRYADKIN ,  Dmitri SIMONIAN

IPC: G01B9/02 ,  G01B11/02

CPC classification number: H02N2/025 ,  G01B9/02057 ,  G01B11/03 ,  H02N2/0055 ,  H02N2/028 ,  Y10T29/42

Abstract: We disclose a method for accurate three-dimensional position measurement in the field of nano-positioning using a single light beam and principles of interferometry to measure position.

Abstract translation: 我们公开了使用单个光束进行纳米定位领域的精确三维位置测量的方法和用于测量位置的干涉测量原理。