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公开(公告)号:US20240077079A1
公开(公告)日:2024-03-07
申请号:US18508671
申请日:2023-11-14
申请人: EBARA CORPORATION
发明人: Keiji MAISHIGI , Tetsuro SUGIURA , Katsuaki USUI , Masahiro HATAKEYAMA , Chikako HONMA , Toru OSUGA , Koichi IWASAKI , Jie Yuan LIN
CPC分类号: F04C28/28 , F04D27/001 , G06F9/542 , G06F17/18
摘要: An information processing apparatus detecting presence or absence of abnormality of a vacuum pump derived from a product produced within a target vacuum pump, including: a determination unit configured to determine a normal variation range or a normal time variation behavior of a target state quantity which is a state quantity varying depending on a load of gas flowing into the vacuum pump, based on at least one of past target state quantities of the target vacuum pump or another vacuum pump; and a comparison unit configured to compare a current target state quantity of the target vacuum pump with the normal variation range or the normal time variation behavior and output the comparison result.
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公开(公告)号:US20170200622A1
公开(公告)日:2017-07-13
申请号:US15313990
申请日:2015-05-28
申请人: EBARA CORPORATION
发明人: Atsushi SHIOKAWA , Tetsuro SUGIURA , Shinichi SEKIGUCHI , Takashi KYOTANI , Tetsuo KOMAI , Norio KIMURA , Keiichi ISHIKAWA , Toru OSUGA
CPC分类号: H01L21/67017 , C23C14/22 , C23C16/4412 , C23C16/52 , F04B37/14 , F04B37/16 , F04B41/00 , G05D16/2013 , H01J37/32834 , H01J37/32844 , H01L21/205 , H01L21/3065 , H01L21/31 , H01L21/67276 , Y02C20/30 , Y02P70/605
摘要: The present invention relates to a vacuum evacuation system used to evacuate a processing gas from one or more process chambers for use in, for example, a semiconductor-device manufacturing apparatus. The vacuum evacuation system is a vacuum apparatus for evacuating a gas from a plurality of process chambers (1). The vacuum evacuation system includes a plurality of first vacuum pumps (5) coupled to the plurality of process chambers (1) respectively, a collecting pipe (7) coupled to the plurality of first vacuum pumps (5), and a second vacuum pump (8) coupled to the collecting pipe (7).
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