DEVICE AND METHOD FOR BONDING SUBSTRATES

    公开(公告)号:US20210291504A1

    公开(公告)日:2021-09-23

    申请号:US17341509

    申请日:2021-06-08

    IPC分类号: B32B37/00 B32B37/10 B81C1/00

    摘要: A method for bonding a contact surface of a first substrate to a contact surface of a second substrate comprising of the steps of: positioning the first substrate on a first receiving surface of a first receiving apparatus and positioning the second substrate on a second receiving surface of a second receiving apparatus; establishing contact of the contact surfaces at a bond initiation site; and bonding the first substrate to the second substrate along a bonding wave which is travelling from the bond initiation site to the side edges of the substrates, wherein the first substrate and/or the second substrate is/are deformed for alignment of the contact surfaces.

    DEVICE AND METHOD FOR BONDING OF SUBSTRATES
    3.
    发明申请

    公开(公告)号:US20190019678A1

    公开(公告)日:2019-01-17

    申请号:US16080156

    申请日:2016-03-22

    摘要: A method and a corresponding device for bonding a first substrate with a second substrate at mutually facing contact faces of the substrates. The method includes holding of the first substrate to a first holding surface of a first holding device and holding of the second substrate to a second holding surface of a second holding device. A change in curvature of the contact face of the first substrate and/or a change in curvature of the contact face of the second substrate are controlled during the bonding.

    METHOD FOR BONDING OF SUBSTRATES
    4.
    发明申请

    公开(公告)号:US20180076037A1

    公开(公告)日:2018-03-15

    申请号:US15514182

    申请日:2016-02-16

    IPC分类号: H01L21/18 H01L21/66 H01L25/00

    摘要: A method for bonding a first substrate with a second substrate at respective contact faces of the substrates with the following steps: holding the first substrate to a first sample holder surface of a first sample holder with a holding force FH1 and holding the second substrate to a second sample holder surface of a second sample holder with a holding force FH2; contacting the contact faces at a bond initiation point and heating at least the second sample holder surface to a heating temperature TH; bonding of the first substrate with the second substrate along a bonding wave running from the bond initiation point to the side edges of the substrates, wherein the heating temperature TH is reduced at the second sample holder surface during the bonding.

    Method for bonding substrates
    7.
    发明授权

    公开(公告)号:US11315901B2

    公开(公告)日:2022-04-26

    申请号:US16632643

    申请日:2017-09-21

    摘要: A method for bonding a first substrate to a second substrate on mutually facing contact surfaces of the substrates, wherein the first substrate is mounted on a first chuck and the second substrate is mounted on a second chuck, and wherein a plate is arranged between the second substrate and the second chuck, wherein the second substrate with the plate is deformed with respect to the second chuck before and/or during the bonding. Furthermore, the present invention relates to a corresponding device and a corresponding plate.