公开(公告)号：US20230341315A1

公开(公告)日：2023-10-26

申请号：US18215302

申请日：2023-06-28

Applicant: Essenlix Corporation

Inventor： Stephen Y. CHOU ,  Wu CHOU ,  Xing LI ,  Hongbing LI ,  Yuecheng Zhang ,  Mingquan WU ,  Wei DING ,  Jun TIAN

IPC: G01N15/14 ,  G06T7/62 ,  G06T7/10 ,  G06N20/00 ,  G06T7/00 ,  G06T7/40

CPC classification number: G01N15/1475 ,  G06T7/62 ,  G06T7/10 ,  G06N20/00 ,  G06T7/0012 ,  G06T7/40 ,  G06T2207/10056 ,  G06T2207/30024 ,  G06T2207/30204 ,  G06T2207/30004

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.

公开(公告)号：US20240410824A1

公开(公告)日：2024-12-12

申请号：US18442090

申请日：2024-02-14

Applicant: Essenlix Corporation

Inventor： Stephen Y. CHOU ,  Wei DING ,  Ji QI ,  Jun TIAN ,  Wu CHOU ,  Hongbing LI

IPC: G01N21/31 ,  G01N21/03

Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.

公开(公告)号：US20220357271A1

公开(公告)日：2022-11-10

申请号：US17621216

申请日：2020-06-22

Applicant: Essenlix Corporation

Inventor： Stephen Y. CHOU ,  Wei DING ,  Ji QI ,  Jun TIAN ,  Wu CHOU ,  Hongbing LI

IPC: G01N21/31 ,  G01N21/03

Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.

公开(公告)号：US20250116593A1

公开(公告)日：2025-04-10

申请号：US18739128

申请日：2024-06-10

Applicant: Essenlix Corporation

Inventor： Stephen Y. CHOU ,  Wu CHOU ,  Xing LI ,  Hongbing LI ,  Yuecheng Zhang ,  Mingquan WU ,  Wei DING ,  Jun TIAN

IPC: G01N15/1433 ,  G06N20/00 ,  G06T7/00 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.

公开(公告)号：US20210312621A1

公开(公告)日：2021-10-07

申请号：US17284083

申请日：2020-04-06

Applicant: Essenlix Corporation

Inventor： Stephen CHOU ,  Wu CHOU ,  Xing LI ,  Hongbing LI ,  Yuechang Zhang ,  Mingquan WU ,  Wei DING ,  Jun TIAN

IPC: G06T7/00 ,  G06T7/10 ,  G06T7/62 ,  G06T7/40 ,  G06N20/00

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.