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公开(公告)号：US20210270722A1
公开(公告)日：2021-09-02
申请号：US17268847
申请日：2019-08-28
Applicant: Essenlix Corporation
Inventor： Stephen CHOU , Wei DING , Wu CHOU , Jun TIAN , Yuecheng ZHANG , Mingquan WU , Xing LI
Abstract: One aspect of the present invention is to provide systems and methods that improve the accuracy of an assay that comprise at least one or more parameters each having a random error.
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公开(公告)号：US20220357271A1
公开(公告)日：2022-11-10
申请号：US17621216
申请日：2020-06-22
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Ji QI , Jun TIAN , Wu CHOU , Hongbing LI
Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.
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公开(公告)号：US20240410824A1
公开(公告)日：2024-12-12
申请号：US18442090
申请日：2024-02-14
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Ji QI , Jun TIAN , Wu CHOU , Hongbing LI
Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.
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公开(公告)号：US20240035954A1
公开(公告)日：2024-02-01
申请号：US18141996
申请日：2023-05-01
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Wu CHOU , Jun TIAN , Yuecheng ZHANG , Mingquan WU , Xing LI
CPC classification number: G01N15/1484 , G06N20/00 , G01N1/2813 , G06N3/08 , G06T1/0014 , G01N2001/282
Abstract: The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
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公开(公告)号：US20230350176A1
公开(公告)日：2023-11-02
申请号：US18218698
申请日：2023-07-06
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Wu CHOU , Ji QI , Jun TIAN , Yuecheng ZHANG , Mingquan WU
CPC classification number: G02B21/0008 , G06T7/90 , G06N20/00 , G01J3/524 , G02B21/0032 , H04N23/51 , H04N23/55
Abstract: Disclosed is an apparatus and method for imaging: a side-view of a object on a surface, a Contact Angle of a liquid object, the color of an object, or combinations thereof.
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Patent Agency Ranking
公开(公告)号：US20230341315A1
公开(公告)日：2023-10-26
申请号：US18215302
申请日：2023-06-28
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wu CHOU , Xing LI , Hongbing LI , Yuecheng Zhang , Mingquan WU , Wei DING , Jun TIAN
CPC classification number: G01N15/1475 , G06T7/62 , G06T7/10 , G06N20/00 , G06T7/0012 , G06T7/40 , G06T2207/10056 , G06T2207/30024 , G06T2207/30204 , G06T2207/30004
Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
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公开(公告)号：US20230324278A1
公开(公告)日：2023-10-12
申请号：US18204879
申请日：2023-06-01
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Wu CHOU , Jun TIAN , Yuecheng ZHANG , Mingquan WU , Xing LI
IPC: G01N15/14 , G02B21/34 , G06T7/00 , G06V10/34 , G06V10/44 , G06V20/69 , G06F18/2413 , G06V10/764 , G06V10/82
CPC classification number: G01N15/1475 , G02B21/34 , G06T7/0012 , G06V10/34 , G06V10/454 , G01N2015/1006 , G06F18/24143 , G06V10/764 , G06V10/82 , G06V10/44 , G06V20/69
Abstract: One aspect of the present invention is to provide systems and methods that improve the accuracy of an assay that comprise at least one or more parameters each having a random error.
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公开(公告)号：US20200256856A1
公开(公告)日：2020-08-13
申请号：US16759006
申请日：2018-10-26
Applicant: Essenlix Corporation
Inventor： Stephen CHOU , Wei DING , Jun TIAN , Wu CHOU , Yuecheng ZHANG , Mingquan WU , Li LI , Michael LEONIY
Abstract: Among other things, the present invention is related to devices/apparatus and methods of performing cellular, biological, and chemical assays and procedures.
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公开(公告)号：US20250116593A1
公开(公告)日：2025-04-10
申请号：US18739128
申请日：2024-06-10
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wu CHOU , Xing LI , Hongbing LI , Yuecheng Zhang , Mingquan WU , Wei DING , Jun TIAN
Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
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公开(公告)号：US20220299422A1
公开(公告)日：2022-09-22
申请号：US17565115
申请日：2021-12-29
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Wu CHOU , Jun TIAN , Yuecheng ZHANG , Mingquan WU , Xing LI
Abstract: The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
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