Device for cleaning cvd device and method of cleaning cvd device
    2.
    发明申请
    Device for cleaning cvd device and method of cleaning cvd device 有权
    cvd设备的清洁设备和清洁cvd设备的方法

    公开(公告)号:US20060207630A1

    公开(公告)日:2006-09-21

    申请号:US10548874

    申请日:2004-03-12

    CPC分类号: C23C16/52 C23C16/4405

    摘要: An apparatus for cleaning a CVD apparatus that can efficiently remove a by-product such as SiO2 or Si3N4 stuck and deposited onto the surface of an internal wall, an electrode, or the like in a reaction chamber in a film forming process, and a method for cleaning a CVD apparatus. A control monitors luminous intensity data of an F radical in a reaction chamber by optical emission spectroscopy and compares the data with calibrated prestored luminous intensity data, and ends cleaning after a predetermined time passes from reaching a luminous intensity saturation point. Furthermore, concentration data of SiF4 in a gas discharged from the reaction chamber are monitored by a Fourier transform infrared spectrometry and compared with prestored concentration data of SiF4 to decide that the predetermined time has passed when a predetermined cleaning end point concentration is reached, thereby ending the cleaning.

    摘要翻译: 一种用于清洁可以有效地除去诸如SiO 2或Si 3 N 4 N 3的副产物的CVD装置的装置,其被粘附并沉积到 在成膜工艺中的反应室中的内壁,电极等的表面,以及CVD装置的清洗方法。 控制器通过光发射光谱监测反应室中F自由基的发光强度数据,并将该数据与校准的预存的发光强度数据进行比较,并且在经过预定时间从达到发光强度饱和点之后结束清洁。 此外,通过傅里叶变换红外光谱法监测从反应室排出的气体中SiF 4的浓度数据,并与SiF 4的预先存储的浓度数据进行比较,以确定 当达到预定的清洁终点浓度时已经过了预定的时间,从而结束清洁。

    Cvd apparatus and method for cleaning cvd apparatus
    3.
    发明申请
    Cvd apparatus and method for cleaning cvd apparatus 审中-公开
    Cvd设备和清洁cvd设备的方法

    公开(公告)号:US20060201533A1

    公开(公告)日:2006-09-14

    申请号:US10548873

    申请日:2004-03-12

    摘要: There is provided a CVD apparatus capable of efficiently removing a by-product such as SiO2 or Si3N4 which is stuck and deposited onto the surface of an internal wall, an electrode or the like in a CVD chamber in a film forming process, and furthermore, executing cleaning having a small damage over an upper electrode and a counter electrode stage (a lower electrode) and manufacturing a thin film of high quality, and a CVD apparatus cleaning method using the same. In a CVD apparatus cleaning method of introducing a cleaning gas to carry out plasma cleaning over an inside of a CVD chamber after forming a deposited film on a surface of a substrate, a frequency of an RF to be applied to an RF electrode is switched into a first frequency to be applied for forming a film and a second frequency to be applied when executing the plasma cleaning.

    摘要翻译: 提供了一种CVD装置,其能够有效地除去被粘附并沉积到其上的副产物如SiO 2或Si 3 N 4 N 4 在成膜工艺中在CVD室中的内壁,电极等的表面,此外,执行在上电极和对电极台(下电极)上具有小损伤的清洁并制造薄膜 的高质量的CVD装置清洗方法。 在CVD基板的表面形成沉积膜之后,在CVD装置的清洗方法中,在CVD室内引入清洗气体进行等离子体清洗,将施加到RF电极的RF的频率切换成 用于形成膜的第一频率和在执行等离子体清洗时要施加的第二频率。

    Device for cleaning CVD device and method of cleaning CVD device
    5.
    发明授权
    Device for cleaning CVD device and method of cleaning CVD device 有权
    CVD装置的清洗装置及清洗CVD装置的方法

    公开(公告)号:US08043438B2

    公开(公告)日:2011-10-25

    申请号:US10548874

    申请日:2004-03-12

    IPC分类号: B08B9/00

    CPC分类号: C23C16/52 C23C16/4405

    摘要: An apparatus for cleaning a CVD apparatus that can efficiently remove a by-product such as SiO2 or Si3N4 stuck and deposited onto the surface of an internal wall, an electrode, or the like in a reaction chamber in a film forming process, and a method for cleaning a CVD apparatus. A control monitors luminous intensity data of an F radical in a reaction chamber by optical emission spectroscopy and compares the data with calibrated prestored luminous intensity data, and ends cleaning after a predetermined time passes from reaching a luminous intensity saturation point. Furthermore, concentration data of SiF4 in a gas discharged from the reaction chamber are monitored by a Fourier transform infrared spectrometry and compared with prestored concentration data of SiF4 to decide that the predetermined time has passed when a predetermined cleaning end point concentration is reached, thereby ending the cleaning.

    摘要翻译: 一种用于清洁CVD装置的装置,其可以有效地除去在成膜过程中在反应室中粘附并沉积到反应室内的表面上的诸如SiO 2或Si 3 N 4的副产物,以及方法 用于清洁CVD装置。 控制器通过光发射光谱监测反应室中F自由基的发光强度数据,并将该数据与校准的预存的发光强度数据进行比较,并且在经过预定时间从达到发光强度饱和点之后结束清洁。 此外,通过傅里叶变换红外光谱法监测从反应室排出的气体中SiF 4的浓度数据,并与SiF 4的预先存储的浓度数据进行比较,以确定在达到预定清洗终点浓度时经过了预定时间,从而结束 清洁。

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    7.
    发明申请
    DISPLAY 审中-公开
    显示

    公开(公告)号:US20120280614A1

    公开(公告)日:2012-11-08

    申请号:US13551713

    申请日:2012-07-18

    IPC分类号: H05B33/12

    CPC分类号: H01L51/5256

    摘要: A display device including an organic electroluminescence device provided on a substrate and protected by a protective film characterized in that the protective film is composed of silicon nitride films formed in layers by a chemical vapor deposition method using an ammonia gas, a high-density silicon nitride film being provided in a surface layer of the protective film, and a low-density silicon nitride film having a lower density than that of the high-density silicon nitride film being provided below it.

    摘要翻译: 一种显示装置,包括设置在基板上并被保护膜保护的有机电致发光元件,其特征在于,所述保护膜由通过使用氨气的化学气相沉积法形成的氮化硅膜构成,高密度氮化硅 膜设置在保护膜的表面层中,并且在其下方设置密度低于高密度氮化硅膜的密度的低密度氮化硅膜。

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    10.
    发明申请
    DISPLAY 失效
    显示

    公开(公告)号:US20090309486A1

    公开(公告)日:2009-12-17

    申请号:US12096487

    申请日:2006-12-07

    IPC分类号: H01L51/50

    CPC分类号: H01L51/5256

    摘要: There is provided a display capable of protecting a light-emitting device by a protective film having good sealing characteristics and sidewall step coverage and preventing deterioration of the light-emitting device, thereby maintaining good display characteristics. A display device 1 including an organic electroluminescence device 3 provided on a substrate 2 and protected by a protective film 4 is characterized in that the protective film 4 is composed of silicon nitride films 4a, 4b, and 4c formed in layers by a chemical vapor deposition method using an ammonia gas, the high-density silicon nitride film 4c is provided in a surface layer of the protective film 4, and the low-density silicon nitride film 4b having a lower density than that of the high-density silicon nitride film 4c is provided below it.

    摘要翻译: 提供一种能够通过具有良好的密封特性和侧壁台阶覆盖的保护膜来保护发光装置并防止发光装置的劣化的显示器,从而保持良好的显示特性。 包括设置在基板2上并被保护膜4保护的有机电致发光器件3的显示装置1的特征在于,保护膜4由通过化学气相沉积形成的氮化硅膜4a,4b和4c构成 使用氨气的方法,在保护膜4的表面层上设置高密度氮化硅膜4c,密度低于高密度氮化硅膜4c的低密度氮化硅膜4b 在它下方提供。