Optical Sources for SPR Applications
    1.
    发明申请
    Optical Sources for SPR Applications 有权
    光源用于SPR应用

    公开(公告)号:US20080030736A1

    公开(公告)日:2008-02-07

    申请号:US11462681

    申请日:2006-08-04

    IPC分类号: G01N21/41

    CPC分类号: G01N21/553

    摘要: The use of a high power and an incoherent light source to reduce noise associated when investigating unknown molecules in Surface Plasmon Resonance (SPR) systems. High power and incoherent light sources can improve resolution and accuracy of SPR system measurements.

    摘要翻译: 使用高功率和非相干光源来减少在研究表面等离子体共振(SPR)系统中未知分子时相关的噪声。 大功率和非相干光源可以提高SPR系统测量的分辨率和精度。

    Optical sources for SPR applications
    2.
    发明授权
    Optical sources for SPR applications 有权
    SPR应用的光源

    公开(公告)号:US07705990B2

    公开(公告)日:2010-04-27

    申请号:US11462681

    申请日:2006-08-04

    IPC分类号: G01N21/55

    CPC分类号: G01N21/553

    摘要: The use of a high power and an incoherent light source to reduce noise associated when investigating unknown molecules in Surface Plasmon Resonance (SPR) systems. High power and incoherent light sources can improve resolution and accuracy of SPR system measurements.

    摘要翻译: 使用高功率和非相干光源来减少在研究表面等离子体共振(SPR)系统中未知分子时相关的噪声。 大功率和非相干光源可以提高SPR系统测量的分辨率和精度。

    Swept-Angle SPR Measurement System
    3.
    发明申请
    Swept-Angle SPR Measurement System 有权
    扫频角SPR测量系统

    公开(公告)号:US20090180105A1

    公开(公告)日:2009-07-16

    申请号:US11941769

    申请日:2007-11-16

    IPC分类号: G01N21/41 G01N21/55

    CPC分类号: G01N21/553

    摘要: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

    摘要翻译: 扫掠角SPR测量系统根据控制信号在一定范围的偏转角度偏转光束,并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。

    Parallel interferometric measurements using an expanded local oscillator signal
    4.
    发明授权
    Parallel interferometric measurements using an expanded local oscillator signal 有权
    使用扩展的本地振荡器信号的并行干涉测量

    公开(公告)号:US07023557B2

    公开(公告)日:2006-04-04

    申请号:US10634358

    申请日:2003-08-05

    IPC分类号: G01B9/02 G01N21/00

    CPC分类号: G01M11/331 G01M11/31

    摘要: A system for characterizing optical properties of a device under test (DUT) uses an expanded local oscillator signal to perform multiple parallel interferometric measurements. In one system, the expanded local oscillator signal is optically connected to a lens array. The lens array focuses the expanded swept local oscillator signal into multiple beams. The multiple beams are then used in multiple parallel interferometric measurements. The multiple beams may be used as the reference beams or applied to the DUT and used as the test beams depending on the application. The test beams and reference beams are combined to perform the interferometric measurements. In another system, a portion of the expanded local oscillator signal is applied directly to a DUT as the test beam while another portion of the expanded local oscillator signal is used for the reference beam.

    摘要翻译: 用于表征被测器件(DUT)的光学特性的系统使用扩展的本地振荡器信号来执行多个并行干涉测量。 在一个系统中,扩展的本地振荡器信号被光学连接到透镜阵列。 透镜阵列将扩展的扫频本地振荡器信号聚焦成多个波束。 然后将多个光束用于多个并行干涉测量。 可以将多个光束用作参考光束或施加到DUT并且根据应用用作测试光束。 测试光束和参考光束被组合以执行干涉测量。 在另一个系统中,扩展的本地振荡器信号的一部分被直接施加到DUT作为测试波束,而扩展的本地振荡器信号的另一部分被用于参考波束。

    Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser
    5.
    发明授权
    Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser 失效
    光学分析仪和使用连续可调激光器在干涉光学测量中降低相对强度噪声的方法

    公开(公告)号:US06882428B2

    公开(公告)日:2005-04-19

    申请号:US10305597

    申请日:2002-11-27

    CPC分类号: G01M11/331 G01N21/21

    摘要: A heterodyne optical network analyzer and method for device characterization reduces the effect of relative intensity noise (RIN) in interferometric optical measurements by subtracting the measured intensities of first and second interference signals derived from an optical interferometer. The first and second interference signals are produced by combining a first lightwave transmitted to an optical device being characterized with a second lightwave, which is a delayed version of the first lightwave. The first and second lightwaves are derived by splitting an input lightwave having a continuously swept optical frequency generated by a light source, such as a continuously tunable laser.

    摘要翻译: 外差光网络分析仪和设备表征方法通过减去从光干涉仪得到的第一和第二干涉信号的测量强度来减少干涉光学测量中的相对强度噪声(RIN)的影响。 第一和第二干扰信号是通过组合传输到第一光波的第二光波的第二光波组合而产生的第一和第二干涉信号。第二光波是第一光波的延迟版本。 第一和第二光波通过分离由诸如连续可调谐激光器的光源产生的具有连续扫掠的光学频率的输入光波导出。

    Swept-angle SPR measurement system
    7.
    发明授权
    Swept-angle SPR measurement system 有权
    扫频SPR测量系统

    公开(公告)号:US07317519B2

    公开(公告)日:2008-01-08

    申请号:US10977669

    申请日:2004-10-29

    IPC分类号: G01N21/41 G01N21/55

    CPC分类号: G01N21/553

    摘要: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

    摘要翻译: 扫掠角SPR测量系统根据控制信号使光束偏转在偏转角范围上,并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。

    Characterization of active and passive optical properties of an optical device
    8.
    发明授权
    Characterization of active and passive optical properties of an optical device 失效
    光学器件的有源和无源光学特性的表征

    公开(公告)号:US06977720B2

    公开(公告)日:2005-12-20

    申请号:US10634952

    申请日:2003-08-05

    摘要: Characterizing active and passive properties of an optical device involves applying a local oscillator signal to a device under test (DUT) and providing a portion of the local oscillator signal (referred to as the reference local oscillator signal) directly to the an optical analyzer. Providing the reference local oscillator signal to the optical analyzer enables interferometric measurements associated with the DUT to be obtained along with direct measurements, where the interferometric measurements result from combining the portion of the local oscillator signal that is applied to the DUT with the reference local oscillator signal. The interferometric measurements are used to characterize passive properties of the DUT while the direct measurements are used to characterize active properties of the DUT.

    摘要翻译: 表征光学器件的有源和无源特性包括将本地振荡器信号施加到被测器件(DUT),并将本地振荡器信号(称为参考本地振荡器信号)的一部分直接提供给光学分析器。 将参考本地振荡器信号提供给光学分析器,可以实现与DUT直接测量相关联的干涉测量,其中干涉测量结果是将施加到DUT的本地振荡器信号的部分与参考本地振荡器 信号。 干涉测量用于表征DUT的被动特性,而直接测量用于表征DUT的有源特性。

    Optical navigation based on laser feedback or laser interferometry
    9.
    发明授权
    Optical navigation based on laser feedback or laser interferometry 有权
    基于激光反馈或激光干涉测量的光学导航

    公开(公告)号:US07492351B2

    公开(公告)日:2009-02-17

    申请号:US10741952

    申请日:2003-12-18

    IPC分类号: G06F3/033

    摘要: A computer cursor control device includes (1) a light source generating light directed toward a stationary surface, (2) an optional phase modulator, (3) an optional function generator causing the phase modulator to periodically phase shift the light, and (4) a signal processor determining a direction in which the device is moving from a beat frequency or an asymmetry in the light intensity. Another computer cursor control device includes (1) an optical element combining reference and measurement beams to form a heterodyned beam, (2) a phase modulator located in an optical path of the reference beam or the measurement beam, (3) a function generator causing the phase modulator to phase shift the reference beam, and (4) a signal processor determining a direction in which the device is moving from a beat frequency of the heterodyned beam.

    摘要翻译: 计算机光标控制装置包括:(1)产生朝向静止面的光的光源,(2)任选的相位调制器,(3)使所述相位调制器周期性地相移所述光的可选函数发生器,以及(4) 信号处理器确定设备从拍频或光强度的不对称性移动的方向。 另一个计算机光标控制装置包括(1)组合参考和测量光束以形成外差光束的光学元件,(2)位于参考光束或测量光束的光路中的相位调制器,(3)功能发生器, 所述相位调制器使所述参考光束相移,以及(4)信号处理器确定所述装置从所述外差束的拍频开始移动的方向。

    Swept-angle SPR measurement system
    10.
    发明授权
    Swept-angle SPR measurement system 有权
    扫频SPR测量系统

    公开(公告)号:US07684024B2

    公开(公告)日:2010-03-23

    申请号:US11941769

    申请日:2007-11-16

    IPC分类号: G01N21/41 G01N21/55

    CPC分类号: G01N21/553

    摘要: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

    摘要翻译: 扫掠角SPR测量系统根据控制信号使光束偏转在偏转角范围上,并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。