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公开(公告)号:US11651807B2
公开(公告)日:2023-05-16
申请号:US17113595
申请日:2020-12-07
Applicant: Everspin Technologies, Inc.
Inventor: Syed M. Alam , Yaojun Zhang , Frederick Neumeyer
IPC: G11C11/16
CPC classification number: G11C11/1673 , G11C11/1659 , G11C11/1657
Abstract: The present disclosure is drawn to a magnetoresistive device including an array of memory cells arranged in rows and columns, each memory cell comprising a magnetic tunnel junction, each row comprising a word line, and each column comprising a bit line; a column select device that selects a bit line. The magnetoresistive device also includes a sense amplifier comprising a first input corresponding to a selected bit line, a second input corresponding to a reference bit line, and a data output. The plurality of columns comprise a reference column, the reference column comprising a conductive element coupled to the magnetic tunnel junctions in the reference column.
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公开(公告)号:US12165684B2
公开(公告)日:2024-12-10
申请号:US18297793
申请日:2023-04-10
Applicant: Everspin Technologies, Inc.
Inventor: Syed M. Alam , Yaojun Zhang , Frederick Neumeyer
IPC: G11C11/16
Abstract: The present disclosure is drawn to a magnetoresistive device including an array of memory cells arranged in rows and columns, each memory cell comprising a magnetic tunnel junction, each row comprising a word line, and each column comprising a bit line; a column select device that selects a bit line. The magnetoresistive device also includes a sense amplifier comprising a first input corresponding to a selected bit line, a second input corresponding to a reference bit line, and a data output. The plurality of columns comprise a reference column, the reference column comprising a conductive element coupled to the magnetic tunnel junctions in the reference column.
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公开(公告)号:US10658013B2
公开(公告)日:2020-05-19
申请号:US16252067
申请日:2019-01-18
Applicant: Everspin Technologies, Inc.
Inventor: Thomas Andre , Syed M. Alam , Frederick Neumeyer
Abstract: The present disclosure is drawn to, among other things, a magnetic memory. The magnetic memory comprises a first common line, a second common line, and a memory cell. The magnetic memory further includes a bias voltage generation circuit and a voltage driver. The bias voltage generation circuit and the voltage driver are configured to provide driving voltages to the memory cell during access operations.
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