公开(公告)号：US10410827B2

公开(公告)日：2019-09-10

申请号：US15586194

申请日：2017-05-03

申请人： FEI Company

发明人： Ali Mohammadi-Gheidari ,  Alexander Henstra ,  Peter Christiaan Tiemeijer ,  Kun Liu ,  Pleun Dona ,  Gregory A. Schwind ,  Gerbert Jeroen van de Water

IPC分类号： H01J37/29 ,  H01J37/065 ,  H01J37/067 ,  H01J37/145 ,  G02B21/06 ,  H01J37/244

摘要： A charged particle microscope and a method of operating a charged particle microscope are disclosed. The microscope employs a source for producing charged particles, and a source lens below the source to form a charged particle beam which is directed onto a specimen by a condenser system. A detector collects radiation emanating from the specimen in response to irradiation of the specimen by the beam. The source lens is a compound lens, focusing the beam within a vacuum enclosure using both a magnetic lens having permanent magnets outside the enclosure to produce a magnetic field at the beam, and a variable electrostatic lens within the enclosure.

公开(公告)号：US20180323036A1

公开(公告)日：2018-11-08

申请号：US15586194

申请日：2017-05-03

申请人： FEI Company

发明人： Ali Mohammadi-Gheidari ,  Alexander Henstra ,  Peter Christiaan Tiemeijer ,  Kun Liu ,  Pleun Dona ,  Gregory A. Schwind ,  Gerbert Jeroen van de Water ,  Maarten Bischoff

IPC分类号： H01J37/29 ,  H01J37/244 ,  G02B21/06

CPC分类号： H01J37/29 ,  G02B21/06 ,  H01J37/065 ,  H01J37/067 ,  H01J37/145 ,  H01J37/244 ,  H01J2237/06316 ,  H01J2237/06341 ,  H01J2237/0656 ,  H01J2237/08 ,  H01J2237/1415 ,  H01J2237/28

摘要： A charged particle microscope and a method of operating a charged particle microscope are disclosed. The microscope employs a source for producing charged particles, and a source lens below the source to form a charged particle beam which is directed onto a specimen by a condenser system. A detector collects radiation emanating from the specimen in response to irradiation of the specimen by the beam. The source lens is a compound lens, focusing the beam within a vacuum enclosure using both a magnetic lens having permanent magnets outside the enclosure to produce a magnetic field at the beam, and a variable electrostatic lens within the enclosure.