公开(公告)号：US09772371B2

公开(公告)日：2017-09-26

申请号：US14659793

申请日：2015-03-17

Applicant: GLOBALFOUNDRIES INC.

Inventor： Charles J. Montrose ,  Ping-Chuan Wang

IPC: G01R31/319 ,  G01R31/28 ,  G01R31/26 ,  G06F11/273 ,  G01R31/3193

CPC classification number: G01R31/2834 ,  G01R31/2607 ,  G01R31/2851 ,  G01R31/31924 ,  G01R31/31935

Abstract: A method, and forming an associated system, for testing semiconductor devices. Driver channels are provided, each driver channel connected to a storage device via a bus and connected to a respective semiconductor device. Each driver channel includes: a first voltage driver connected to the respective semiconductor device and having a first input for the respective semiconductor device, a second voltage driver connected to the respective semiconductor device and having a second input for the respective semiconductor device, first and second sets of optical switches in the first and second voltage driver respectively, and a microcontroller. All connections between the respective semiconductor device and both the first and second voltage drivers, in response to all optical switches of the first and second set of optical switches being closed. The semiconductor devices are tested, using the driver channels and the test parameters. The test results are provided to the storage device.