公开(公告)号：US11543349B2

公开(公告)日：2023-01-03

申请号：US17321907

申请日：2021-05-17

Applicant: GEN-PROBE INCORPORATED

Inventor： Norbert D. Hagen ,  David Opalsky ,  George T. Walker ,  Byron J. Knight

IPC: G01N21/64 ,  G01N21/27

Abstract: Method for calibrating or monitoring performance of an optical measurement device that includes using a robotic arm to move a reference device having an optical reference material into a signal-detecting position of the optical measurement device. With the optical measurement device, detecting an emission emitted by the optical reference material of the reference device in the signal-detecting position. Then generating a reference signal representing a characteristic of the emission detected by the optical measurement device and comparing the reference signal to an expected reference signal for the emission to calibrate or monitor the performance of the optical measurement device.

公开(公告)号：US10969336B2

公开(公告)日：2021-04-06

申请号：US15176867

申请日：2016-06-08

Applicant: Gen-Probe Incorporated

Inventor： Norbert D. Hagen ,  David Opalsky ,  George T. Walker ,  Byron J. Knight

IPC: G01N21/64 ,  G01N21/27

Abstract: An optical signal detection module includes an optical measurement device (OMD) configured to detect an optical emission signal from an emission signal source placed in a signal-detecting position of the OMD. The optical signal detection module also includes a cover moveable between a closed position covering the signal-detecting position and an open position not covering the signal-detecting position. The cover includes an optical reference material that emits a reference emission detectable by the OMD. The cover is configured so that, when the cover is in the closed position, the inner surface is in the signal-detecting position of the OMD so that the OMD detects the reference emission. The optical signal detection module can also include a drive assembly coupled to the cover and configured to move the cover between the open position and the closed position. In some embodiments, the OMD can include a fluorometer.

公开(公告)号：US11846644B2

公开(公告)日：2023-12-19

申请号：US15931282

申请日：2020-05-13

Applicant: GEN-PROBE INCORPORATED

Inventor： George T. Walker ,  Matthias Merten ,  Gary D. Lair

IPC: G01N35/10 ,  G01N35/04 ,  C12Q1/6806 ,  G01N35/00

CPC classification number: G01N35/1011 ,  C12Q1/6806 ,  G01N35/00732 ,  G01N35/00871 ,  G01N35/04 ,  G01N35/1065 ,  G01N2035/00742 ,  G01N2035/00782 ,  G01N2035/00801 ,  G01N2035/0406 ,  G01N2035/046 ,  G01N2035/047 ,  G01N2035/0462 ,  G01N2035/0465 ,  G01N2035/0467 ,  G01N2035/0472

Abstract: A conveyor assembly for transporting a carrier coupled to a receptacle to a processing station located within a housing of an instrument. The conveyor assembly includes a spur conveyor subassembly and a buffer conveyor subassembly for transporting the carrier from a host conveyor assembly to the spur conveyor subassembly. The spur conveyor subassembly includes (i) a rotatable diverter having at least one recess for receiving and moving the carrier between the buffer conveyor subassembly and the spur conveyor subassembly and (ii) a gripper configured to grasp the carrier and move it from the diverter to the processing position located within the housing of the instrument.

公开(公告)号：US11009458B2

公开(公告)日：2021-05-18

申请号：US16658482

申请日：2019-10-21

Applicant: Gen-Probe Incorporated

Inventor： Norbert D. Hagen ,  David Opalsky ,  George T. Walker ,  Byron J. Knight

IPC: G01N21/64 ,  G01N21/27

Abstract: Optical reference devices for calibrating or monitoring the performance of an optical measurement device, such as a fluorometer, are made from thermoplastics from the polyaryletherketone (PAEK) family of semi-crystalline thermoplastics, including polyether ether ketone (PEEK). The reference device may be made as a master reference device having a known emission output—as determined by a standard optical measurement device—that is used to calibrate other optical measurement devices against the standard. The reference device may be made in the shape of a receptacle vial so that the reference device can be placed in the receptacle holding structure of an instrument in which the optical measurement device is installed and used to calibrate or monitor the optical measurement device within the instrument. The reference device may be part of the probe of a pipettor or pick and place mechanism or it may be a cap that can be secured to the end of such a probe.

公开(公告)号：US10451550B2

公开(公告)日：2019-10-22

申请号：US15176861

申请日：2016-06-08

Applicant: Gen-Probe Incorporated

Inventor： Norbert D. Hagen ,  David Opalsky ,  George T. Walker ,  Byron J. Knight

IPC: G01N21/64 ,  G01N21/27

Abstract: Optical reference devices for calibrating or monitoring the performance of an optical measurement device, such as a fluorometer, are made from thermoplastics from the polyaryletherketone (PAEK) family of semi-crystalline thermoplastics, including polyether ether ketone (PEEK). The reference device may be made as a master reference device having a known emission output—as determined by a standard optical measurement device—that is used to calibrate other optical measurement devices against the standard. The reference device may be made in the shape of a receptacle vial so that the reference device can be placed in the receptacle holding structure of an instrument in which the optical measurement device is installed and used to calibrate or monitor the optical measurement device within the instrument. The reference device may be part of the probe of a pipettor or pick and place mechanism or it may be a cap that can be secured to the end of such a probe.