Fault detection and isolation system and method
    1.
    发明授权
    Fault detection and isolation system and method 失效
    故障检测与隔离系统及方法

    公开(公告)号:US06687585B1

    公开(公告)日:2004-02-03

    申请号:US10039636

    申请日:2001-11-09

    IPC分类号: G06F700

    摘要: A model-based Fault Detection and Isolation (FDI) method and system for monitoring the overall performance in a vehicle system based on a hierarchical structure is disclosed. The FDI scheme uses the available sensors in a vehicle system and divides them into subsystems of smaller dimensions containing one or more modules that are related or interconnected. The same module may appear in a different subsystem, but the set of all subsystems does not have to contain all of the modules. For this structure, an FDI scheme comprising several detector units is created. Each detector unit receives information from the sensors and outputs a residual that is sent to a high-level detector unit which processes the data and performs the residual evaluation for the selected subsystem. Finally, each subsystem outputs a decision that is sent to a supervisor hazard detector performing the final diagnosis.

    摘要翻译: 公开了一种基于模型的故障检测和隔离(FDI)方法和系统,用于基于层次结构监测车辆系统的整体性能。 FDI方案使用车辆系统中的可用传感器,并将其划分为较小尺寸的子系统,其中包含一个或多个相关或互连的模块。 相同的模块可能出现在不同的子系统中,但是所有子系统的集合不必包含所有模块。 对于该结构,创建包括若干检测器单元的FDI方案。 每个检测器单元从传感器接收信息并输出发送到高级检测器单元的残差,该单元处理该数据并执行所选子系统的残差评估。 最后,每个子系统输出发送给执行最终诊断的主管危险检测器的决定。

    Model-based fault detection and isolation system and method
    2.
    发明授权
    Model-based fault detection and isolation system and method 有权
    基于模型的故障检测和隔离系统及方法

    公开(公告)号:US06766230B1

    公开(公告)日:2004-07-20

    申请号:US10039634

    申请日:2001-11-09

    IPC分类号: G06F1900

    摘要: A model-based Fault Detection and Isolation (FDI) system and method based on a hierarchical structure for monitoring overall vehicle system performance and diagnosing faults is disclosed. The FDI scheme uses the available sensors in a vehicle system and divides them into subsystems of smaller dimensions containing one or more modules that are related or interconnected. The same module may appear in a different subsystem, but the set of all subsystems does not have to contain all of the modules. For this structure, an FDI scheme comprising several detector units is created. Each detector unit receives information from the sensors and outputs a residual that is sent to a residual evaluation unit which processes the data and performs the residual evaluation for the selected subsystem. Finally, each subsystem outputs a decision that is sent to a supervisor unit performing the final diagnosis.

    摘要翻译: 公开了一种基于模型的故障检测和隔离(FDI)系统和基于层次结构的方法,用于监控整个车辆系统性能和诊断故障。 FDI方案使用车辆系统中的可用传感器,并将其划分为较小尺寸的子系统,其中包含一个或多个相关或互连的模块。 相同的模块可能出现在不同的子系统中,但是所有子系统的集合不必包含所有模块。 对于该结构,创建包括若干检测器单元的FDI方案。 每个检测器单元从传感器接收信息并输出发送到剩余评估单元的残差,该剩余评估单元处理该数据并执行所选子系统的剩余评估。 最后,每个子系统输出发送给执行最终诊断的主管单元的决定。

    Self testing CMOS imager chip
    4.
    发明授权
    Self testing CMOS imager chip 有权
    自检CMOS成像芯片

    公开(公告)号:US07053352B2

    公开(公告)日:2006-05-30

    申请号:US10784490

    申请日:2004-02-23

    IPC分类号: H01L27/00

    摘要: A self testing CMOS imager chip includes a controller which outputs a sewer signal, a dump signal, a collect signal, and a read signal, and a pixel array connected to the controller including a plurality of pixels arranged in an array of rows and columns, each pixel having a collect gate disposed adjacent a collect well for receiving a charge in response to application of the collect signal to the collect gate, a sewer for injecting a charge into the collect well in response to the concurrent application of the sewer signal to the sewer and the collect signal to the collect well, a read gate disposed adjacent a read well for receiving the injected charge from the collect well in response to application of the read signal to the read gate and the absence of the collect signal at the collect gate, and a transistor having a gate coupled to the read well, a source for receiving the read signal, and a drain coupled to an output node connected to the controller. The read signal is modulated by the injected charge at the gate of the transistor, thereby generating an injected output signal at the output node representing the injected charge. The controller, through read-out circuitry, comparing the injected output signal to an expected output signal to test the operation of each pixel of the array.

    摘要翻译: 自检CMOS成像器芯片包括输出下水道信号,转储信号,收集信号和读取信号的控制器,以及连接到控制器的像素阵列,该像素阵列包括排列成行和列的阵列的多个像素, 每个像素具有设置在收集井附近的收集门,用于响应于将收集信号应用于收集门而接收电荷;下水道,用于响应于将下水道信号同时施加到收集井而将电荷注入到收集井中 下水道和收集信号到收集井,读门被布置在读取井附近,以响应于读取信号施加到读取门并且在收集门处不存在收集信号从收集井接收注入的电荷 以及晶体管,其具有耦合到所述读取阱的栅极,用于接收所述读取信号的源极和耦合到连接到所述控制器的输出节点的漏极。 读取信号由晶体管栅极处注入的电荷调制,从而在输出节点处产生一个注入的输出信号,代表注入的电荷。 控制器通过读出电路将注入的输出信号与期望的输出信号进行比较,以测试阵列的每个像素的操作。