Group III-Nitride Semiconductor Schottky Diode and Its Fabrication Method
    1.
    发明申请
    Group III-Nitride Semiconductor Schottky Diode and Its Fabrication Method 审中-公开
    第III族 - 氮化物半导体肖特基二极管及其制备方法

    公开(公告)号:US20110006307A1

    公开(公告)日:2011-01-13

    申请号:US12828447

    申请日:2010-07-01

    CPC classification number: H01L29/872 H01L29/0692 H01L29/2003 H01L29/66212

    Abstract: A group III-nitride semiconductor Schottky diode comprises a conducting substrate having a first surface, a stack of multiple layers including a buffer layer and a semiconductor layer sequentially formed on the first surface, wherein the semiconductor layer comprises a group III nitride compound, a first electrode on the semiconductor layer, and a second electrode formed in contact with the first surface at a position adjacent to the stack of multiple layers. In other embodiments, the application also describes a method of fabricating the group III-nitride semiconductor Schottky diode.

    Abstract translation: III族氮化物半导体肖特基二极管包括具有第一表面的导电衬底,包括缓冲层的多层叠层和顺序地形成在第一表面上的半导体层,其中半导体层包括III族氮化物化合物,第一 电极,以及在与多层叠层相邻的位置形成为与第一表面接触的第二电极。 在其它实施例中,本申请还描述了制造III族氮化物半导体肖特基二极管的方法。

    ELECTROCHEMICAL TEST STRIP, ELECTROCHEMICAL TEST SYSTEM, AND MEASUREMENT METHOD USING THE SAME
    2.
    发明申请
    ELECTROCHEMICAL TEST STRIP, ELECTROCHEMICAL TEST SYSTEM, AND MEASUREMENT METHOD USING THE SAME 有权
    电化学测试条,电化学测试系统及其测量方法

    公开(公告)号:US20100089775A1

    公开(公告)日:2010-04-15

    申请号:US12641406

    申请日:2009-12-18

    CPC classification number: G01N27/3274

    Abstract: An electrochemical test strip, an electrochemical test system, and a measurement method using the same are provided. The electrochemical test strip includes an insulating substrate, an electrode system formed on the insulating substrate, and an insulating layer formed on the electrode system. The electrode system includes a set of measurement electrodes, a set of identifying electrodes, and a resistive path having a predetermined resistance value. The set of identifying electrodes is made of metal material, and the resistive path is made of non-metal material. The set of measurement electrodes includes a reference electrode and a working electrode insulated from each other, and the set of identifying electrodes includes a first identifying electrode and a second identifying electrode connected with each other through the resistive path. The insulating layer covers a part of the electrode system, wherein a part of the electrode system not covered by the insulating layer forms a reaction region with a supply port. When a sample is injected into the supply port of the reaction region, the injected sample reaches the set of measurement electrodes and the set of identifying electrodes in sequence.

    Abstract translation: 提供电化学测试条,电化学测试系统以及使用其的测量方法。 电化学测试条包括绝缘基板,形成在绝缘基板上的电极系统和形成在电极系统上的绝缘层。 电极系统包括一组测量电极,一组识别电极和具有预定电阻值的电阻路径。 该组识别电极由金属材料制成,电阻路径由非金属材料制成。 该组测量电极包括彼此绝缘的参考电极和工作电极,并且该组识别电极包括通过电阻路径彼此连接的第一识别电极和第二识别电极。 绝缘层覆盖电极系统的一部分,其中未被绝缘层覆盖的电极系统的一部分与供给端口形成反应区域。 当将样品注入反应区域的供给口时,注入的样品依次到达测量电极组和识别电极组。

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