摘要:
A system for computing a block floating point scaling factor by detecting a dynamic range of an input signal in a central processing unit without additional overhead cycles is provided. The system includes a dynamic range monitoring unit that detects the dynamic range of the input signal by snooping outgoing write data and incoming memory read data of the input signal. The dynamic range monitoring unit includes a running maximum count unit that stores a least value of a count of leading zeros and leading ones, and a running minimum count that stores a least value of the count of trailing zeros. The dynamic range is detected based on the least value of the count of leading zeros and leading ones and the count of trailing zeros. The system further includes a scaling factor computation module that computes the block floating point (BFP) scaling factor based on the dynamic range.
摘要:
A Software Defined Radio (SDR) subsystem capable of supporting a multiple communication standards and platforms for modulation, demodulation and trans-modulation of an input signal is provided. The SDR subsystem includes a Signal Conditioning Cluster (SCC) unit that includes a signal conditioning CPU adapted for sample based signal processing, a Signal Processing Cluster (SPC) unit that includes a signal processing CPU adapted for block based signal processing, and a Channel Codec Cluster (CCC) unit that performs a channel encoding or a channel decoding operation.
摘要:
A method for implementing a digital filter is provided. The method includes (a) determining a bit-width of an incoming data sample of an incoming signal by measuring a distance between a leading zero or one of the incoming data sample and a trailing zero of the incoming data sample. The incoming data sample is obtained by sampling the incoming signal at a pre-defined time interval, (b) obtaining bit-width multipliers with variable bit-widths based on a first probability distribution function (PDF) of bit-widths of incoming data samples, (c) allocating the incoming data sample and a filter coefficient based on the bit-width of the incoming data sample and a bit-width of the filter coefficient to one bit-width multiplier of the bit-width multipliers, and (d) performing a multiply operation of a Multiply and Accumulate (MAC) operation on the one bit-width multiplier to generate an output of the digital filter.
摘要:
A vector slot processor that is capable of supporting multiple signal processing operations for multiple demodulation standards is provided. The vector slot processor includes a plurality of micro execution slot (MES) that performs the multiple signal processing operations on the high speed streaming inputs. Each of the MES includes one or more n-way signal registers that receive the high speed streaming inputs, one or more n-way coefficient registers that store filter coefficients for the multiple signal processing, and one or more n-way Multiply and Accumulate (MAC) units that receive the high speed streaming inputs from the one or more n-way signal registers and filter coefficients from one or more n-way coefficient registers. The one or more n-way MAC units perform a vertical MAC operation and a horizontal multiply and add operation on the high speed streaming inputs.
摘要:
Testing of modules (such as Intellectual property (IP) cores) in integrated circuits (such as system on a chip units (SOCs)) in situations when different modules operate with different characteristics of a control signal. In an embodiment, another module (“subsystem module”) may be implemented to be tested with any of a multiple characteristics of a control signal, and a register which is programmable to generate a derived control signal of a desired characteristic from an original control signal, is provided. The derived control signal is provided to test the subsystem module. According to an aspect of the invention the desired characteristic may be determined, for example, to test a path between the two modules at the same speed as at which the path would be operated in a functional mode.
摘要:
A characteristic is measured on multiple portions of an integrated circuit, and the supply voltage adjusted based on the measurements. In an embodiment, the characteristic corresponds to propagation delay which indicates whether the integrated circuit is implemented with a strong, weak or nominal process corner. In general, the supply voltage can be increased in the case of a weak process corner and decreased in the case of a strong process corner.