公开(公告)号：US20240339806A1

公开(公告)日：2024-10-10

申请号：US18579917

申请日：2022-03-16

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masaru SHIMOMAKI ,  Shin KATO ,  Yasutaka SUZUKI

IPC: H01S3/13 ,  G02F1/365 ,  H01S3/00 ,  H01S3/067 ,  H01S3/094 ,  H01S3/0941 ,  H01S3/16

CPC classification number: H01S3/13013 ,  G02F1/365 ,  H01S3/0057 ,  H01S3/0092 ,  H01S3/06708 ,  H01S3/094003 ,  H01S3/094042 ,  H01S3/094053 ,  H01S3/094076 ,  H01S3/09415 ,  H01S3/1608

Abstract: A light source device includes: a fiber laser including an excitation light source and configured to output pulsed light generated according to excitation light from the excitation light source; a fiber amplifier configured to receive the pulsed light output from the fiber laser, amplify the pulsed light, and output the amplified pulsed light, a wavelength shift fiber configured to receive the pulsed light output from the fiber amplifier, shift a wavelength of the pulsed light, and output the pulsed light; an output fiber configured to receive the pulsed light output from the wavelength shift fiber, and output the pulsed light to an outside; a light detection element configured to detect, in the output fiber, the pulsed light having passed through at least the wavelength shift fiber; and a control unit configured to control a drive current of the excitation light source.

公开(公告)号：US20220005737A1

公开(公告)日：2022-01-06

申请号：US17281458

申请日：2019-10-02

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takeshi SAKAMOTO ,  Yasutaka SUZUKI ,  Iku SANO

IPC: H01L21/66 ,  H01L21/268

Abstract: An inspecting device includes a stage configured to support a wafer in which a plurality of rows of modified regions are formed in a semiconductor substrate, a light source configured to output light, an objective lens configured to pass light propagated through the semiconductor substrate, a light detection part configured to detect light passing through the objective lens, and an inspection part configured to inspect whether or not there is a tip of a fracture in an inspection region between a front surface and the modified region closest to the front surface of the semiconductor substrate. The objective lens positions a virtual focus symmetrical with a focus with respect to the front surface in the inspection region. The light detection part detects light propagating from the back surface side of the semiconductor substrate to the back surface side via the front surface.

公开(公告)号：US20210398855A1

公开(公告)日：2021-12-23

申请号：US17281505

申请日：2019-10-02

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takeshi SAKAMOTO ,  Yasutaka SUZUKI ,  Iku SANO

IPC: H01L21/78 ,  H01L21/66 ,  B23K26/53 ,  B23K26/00 ,  B23K26/03

Abstract: An inspecting device includes a stage configured to support a wafer in which a plurality of rows of modified regions are formed in a semiconductor substrate, a light source configured to output, an objective lens configured to pass light propagated through the semiconductor substrate, a light detection part configured to detect light passing through the objective lens, and an inspection part configured to inspect a tip position of a fracture in an inspection region between a back surface and the modified region closest to the back surface of the semiconductor substrate. The objective lens aligns a focus from the back surface side in an inspection region. The light detection part detects light propagating from the front surface side of the semiconductor substrate to the back surface side.