ABNORMALITY DIAGNOSIS SYSTEM
    1.
    发明申请

    公开(公告)号:US20190354456A1

    公开(公告)日:2019-11-21

    申请号:US16476123

    申请日:2017-02-24

    Applicant: Hitachi, Ltd.

    Abstract: The abnormality diagnosis system detects a failure sign of a device to be diagnosed. The abnormality diagnosis system includes: a diagnosis process search unit which searches for a suitable diagnosis processing procedure by comparing a plurality of diagnosis processing procedures, and outputs reconfiguration information corresponding to the suitable diagnosis processing procedure; and a diagnosis processing unit which has a reconfigurable processing unit and which uses the suitable diagnosis processing procedure found by the diagnosis process search unit to detect a failure sign of the device to be diagnosed by reconfiguring the processing unit on the basis of the reconfiguration information.

    Abnormality Diagnosis Method and Device Therefor
    2.
    发明申请
    Abnormality Diagnosis Method and Device Therefor 审中-公开
    异常诊断方法及其设备

    公开(公告)号:US20160209838A1

    公开(公告)日:2016-07-21

    申请号:US14914381

    申请日:2013-09-13

    Applicant: Hitachi, Ltd.

    Abstract: In industrial machine abnormality diagnosis, if the machine is diagnosed to have abnormality, then sensor data from the machine needs to be sent to a management center for causal analysis. However, since machines operated at a remote site cannot always communicate with a management center, it has been found that, in some cases, sensor data that has failed to be sent from a machine remains in the memory of the machine, resulting in lack of available memory capacity. In view of this, the present invention determines beforehand whether the diagnosed machine will run out of available memory capacity before the completion of sending the amount of sensor data required for causal analysis for the machine, and instructs a maintenance person to recover memory. This determination as to whether the machine will run out of available memory capacity before the completion of sending the amount of sensor data required for the causal analysis for the machine, is made as follows: (1) first, the machine predicts the run-out date on which the machine will run out of memory capacity for storing sensor data generated in the machine, and sends a notification of the predicted run-out date to the management center for the machine; and (2) next, from the amount of sensor data required for the causal analysis and the reception rate of sensor data, the management center calculates the number of days required to retrieve the necessary data for the causal analysis and determines whether the management center can retrieve the data by the predicted run-out date.

    Abstract translation: 在工业机器异常诊断中,如果机器被诊断为异常,则需要将来自机器的传感器数据发送到管理中心进行因果分析。 然而,由于在远程站点运行的机器不能总是与管理中心通信,所以已经发现,在某些情况下,未能从机器发送的传感器数据保留在机器的存储器中,导致缺少 可用内存容量。 鉴于此,本发明在完成发送机器的因果分析所需的传感器数据的量完成之前,事先确定诊断出的机器是否将耗尽可用存储容量,并指示维护人员恢复存储器。 在完成发送机器的因果分析所需的传感器数据量的完成之前,关于机器是否将耗尽可用存储容量的确定如下:(1)首先,机器预测耗尽 机器将用尽存储机器中生成的传感器数据的存储器容量的日期,并将预测的耗尽日期的通知发送到机器的管理中心; 和(2)接下来,根据因果分析所需的传感器数据量和传感器数据的接收率,管理中心计算检索因果分析所需数据所需的天数,并确定管理中心是否可以 通过预测的使用日期检索数据。

    Damage Estimation Device
    3.
    发明申请

    公开(公告)号:US20180024544A1

    公开(公告)日:2018-01-25

    申请号:US15540275

    申请日:2015-01-21

    Applicant: Hitachi, Ltd.

    Abstract: According to the present invention, the work status at an actual site is represented using a combination of component statuses. A degree of damage that takes into account the manner of use at the actual site is predicted by associating test data collected in a component status test. The objective of the present invention is to estimate, with high accuracy, the degree of damage to a device operating in an actual environment. In order to achieve this objective, this damage estimation device is provided with: a component status classification processing unit that classifies the operating status of a device; a component status characteristic amount storage unit that stores a characteristic amount for classification processing by the component status classification processing unit; and a damage degree storage unit for each component status, said damage degree storage unit storing the degree of damage to various regions of a device for each component status, wherein the degree of damage is measured in advance for each component status or is calculated using a simulation. The damage estimation device is characterized by collecting sensor/control data required for device status classification, classifying component status using the component status classification processing unit, calculating the classified result and the degree of damage corresponding to said result using the damage degree storage unit for each component status, and outputting the degree of damage.

    Feature Value Extraction Apparatus, Predicted-Failure-Evidence Diagnosis Apparatus, Design Assistance Apparatus, and Predicted-Failure-Evidence Diagnosis Operation Method

    公开(公告)号:US20210018906A1

    公开(公告)日:2021-01-21

    申请号:US17043209

    申请日:2019-05-10

    Applicant: Hitachi, Ltd.

    Abstract: Provided are a feature amount extraction device, a failure sign diagnosis device, a design assistance device, and a failure sign diagnosis operation method which are suitable for predictively diagnosing equipment failure. The feature amount extraction device is for acquiring data from a sensor attached to a piece of equipment to be diagnosed and outputting a feature amount after pre-processing is executed, and is characterized by being provided with: a reconfigurable circuit to which the data from the sensor is inputted; an arithmetic unit; a reconfigured information database that stores reconfigured information; and a communication module for external connection, wherein the arithmetic unit outputs, through the communication module, the feature amount acquired by executing a feature amount extraction process and the pre-processing using the reconfigurable circuit performed with respect to the data from the sensor, stores the reconfigured information acquired from the outside in the reconfigured information database, and configures the reconfigurable circuit in accordance with the reconfigured information.

    FAILURE DIAGNOSIS SYSTEM
    5.
    发明申请

    公开(公告)号:US20200089207A1

    公开(公告)日:2020-03-19

    申请号:US16617084

    申请日:2018-02-22

    Applicant: Hitachi, Ltd.

    Abstract: A failure diagnosis system flexibly responds to a change in a diagnosis target by using a difference in measurement data before and after maintenance in predictive failure diagnosis. A pre-maintenance data DB stores measurement data before maintenance, and a post-maintenance data DB stores measurement data after maintenance. A feature detection algorithm group DB is provided where a plurality of feature detection algorithms are stored. A first feature is detected based on the measurement data by using each of the plurality of feature detection algorithms read from the feature detection algorithm group DB. An algorithm search unit selects one of the plurality of algorithms based on the feature thus detected. A second feature is detected from the measurement data by using the feature detection algorithm, and a sign predictive of failure of diagnosis of target equipment is diagnosed using the detected second feature.

    DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND DIAGNOSTIC PROGRAM

    公开(公告)号:US20190171199A1

    公开(公告)日:2019-06-06

    申请号:US16325292

    申请日:2016-09-02

    Applicant: HITACHI, LTD.

    Abstract: A diagnostic apparatus determines, at a reference time, whether a device is normal or abnormal, and in which operation state the device is at the time. A reference data creation unit repeats a process of storing sensor values acquired from the device while changing the operation state at the reference time in association with each of the determined operation states until there is no non-corresponding operation state with which the acquired sensor value is not yet associated. At a diagnosis time at which it is not known whether the device is normal or abnormal, an operation state and a sensor value of the device at the time is acquired. The stored sensor value associated with the acquired operation state is read to compare the sensor value acquired at the diagnosis time with the read sensor value to display a result of determination on whether the device is normal or abnormal.

    DEVICE DEGRADATION CAUSE ESTIMATION METHOD AND DEVICE

    公开(公告)号:US20170212012A1

    公开(公告)日:2017-07-27

    申请号:US15328676

    申请日:2014-07-30

    Applicant: HITACHI, LTD.

    Abstract: A degradation cause estimation device is provided with a degradation detector for detecting the amount of degradation undergone by a device, a state observation device for detecting observation values for internal portions, values observed from outside, or device control and operation information, a degradation section detector for detecting a section undergoing degradation using the output values of the degradation detector, and a cause estimator for estimating the cause of the degradation using the device state observations for the degradation section, and outputs the cause for the degradation section.

    Analysis Method for Time Series Data and Device Therefor
    8.
    发明申请
    Analysis Method for Time Series Data and Device Therefor 审中-公开
    时间序列数据及其设备分析方法

    公开(公告)号:US20160217398A1

    公开(公告)日:2016-07-28

    申请号:US14915351

    申请日:2013-09-11

    Applicant: HITACHI, LTD.

    CPC classification number: G06Q10/06 G06Q50/30

    Abstract: An analysis device for time series data from an apparatus to be diagnosed according to the present invention is characterized by being provided with an accumulation device which accumulates sensor data, operation data, or control data, obtained from the apparatus to be diagnosed, while accumulating time information, an algorithm accumulation unit which accumulates algorithms for recognizing behavior of the apparatus to be diagnosed, a behavior recognition unit which recognizes behavior of the apparatus to be diagnosed by use a recognition algorithm, and a specification unit which specifies a behavioral item to be recognized, wherein: a behavior recognition algorithm corresponding to the specified behavioral item to be recognized is selected from the algorithm accumulation unit; sensor data, operation data, or control data to be used by the behavior recognition algorithm is selected from the accumulation device; the start and end times of a selected behavior are recognized by the behavior recognition unit; and the recognized start and end times are associated with time information about data accumulated in the accumulation device, which accumulates sensor data, operation data, or control data, obtained from the apparatus to be diagnosed, while accumulating time information.

    Abstract translation: 根据本发明的用于待诊断装置的时间序列数据的分析装置的特征在于具有累积装置,其累积从待诊断装置获得的传感器数据,操作数据或控制数据,同时累积时间 信息,积累用于识别要诊断的装置的行为的算法的算法累积单元,识别通过使用识别算法来诊断的装置的行为的行为识别单元,以及指定要识别的行为项目的指定单元 其中:从所述算法累积单元中选择与要识别的所述规定行为项目对应的行为识别算法; 从累积装置中选择要由行为识别算法使用的传感器数据,操作数据或控制数据; 所选行为的开始和结束时间由行为识别单元识别; 并且所识别的开始和结束时间与累积设备中累积的数据的时间信息相关联,所述累积设备累积从要诊断的设备获得的传感器数据,操作数据或控制数据,同时累积时间信息。

    Diagnostic Device and Diagnostic Method for Rotary Machine

    公开(公告)号:US20190003928A1

    公开(公告)日:2019-01-03

    申请号:US16075070

    申请日:2016-03-08

    Applicant: Hitachi, Ltd.

    Abstract: A rotary machine diagnostic device has a current acquisition unit that acquires current from a sensor, which measures the driving current of a rotary machine driving a machine to be driven; a sampling unit that performs sampling of the acquired driving current; a frequency range conversion unit that converts data concerning the time range subjected to sampling into a frequency range; a sideband detection unit that sets the driving current as a carrier wave in the frequency range, and detects, as a sideband, the spectrum appearing on each side of the carrier wave subjected to amplitude modulation; and an abnormality detection unit that detects whether or not there are abnormalities in the rotary machine and the machine to be driven on the basis of the difference in frequency between the sideband frequency detected by the sideband detection unit and the frequency of the carrier wave.

    Equipment Life Diagnostic Device
    10.
    发明申请

    公开(公告)号:US20180224840A1

    公开(公告)日:2018-08-09

    申请号:US15747624

    申请日:2015-09-24

    Applicant: Hitachi, Ltd.

    Abstract: Provided is an equipment life diagnostic device which assists in estimating operating conditions that are factors in determining the remaining life of equipment. This equipment life diagnostic device is provided with: an actual life consumption calculation unit which calculates the actual life consumption of equipment when the equipment is operating; an assumed life consumption setting unit which sets an assumed life consumption on the basis of the useful life of the equipment; a comparison unit which compares the actual life consumption calculated by the actual life consumption calculation unit with the assumed life consumption set by the assumed life consumption setting unit; and an output unit which, on the basis of the comparison result obtained from the comparison unit, displays information relating to the amount by which the actual life consumption is greater or less than the assumed life consumption.

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