公开(公告)号：US20130279652A1

公开(公告)日：2013-10-24

申请号：US13837381

申请日：2013-03-15

Applicant: HITACHI, LTD.

Inventor： Akira NAMBU ,  Kazuhiro UEDA ,  Tsuyoshi YAMAMOTO ,  Hideaki KOIZUMI ,  Tomihiro HASHIZUME

IPC: G01N23/083

CPC classification number: G01N23/083

Abstract: Provided is a measuring apparatus which is capable of measuring the distribution of a specific element in a specimen by soft X rays in a state where there is no effect by a staining agent and the like even though the specimen is composed of living single cells or cell aggregates living as they are, extracted in vitro from an organism. A measuring apparatus using soft X rays includes a connection part which is connected with a soft X ray beam line, a mechanism which light-collects a spot size of soft X rays into a micro beam, and a low vacuum vessel having a measurement chamber in which a specimen is disposed.

Abstract translation: 提供了一种测量装置，其能够通过软X射线在不影响染色剂等的状态下测量试样中的特定元素的分布，即使该试样由活细胞或细胞组成 生物体积聚集体，从生物体外提取。 使用软X射线的测量装置包括与软X射线束线连接的连接部分，将微X射线的光斑尺寸聚集成微光束的机构，以及具有测量室的低真空容器 一个样本被放置。

公开(公告)号：US20170004952A1

公开(公告)日：2017-01-05

申请号：US15038879

申请日：2013-12-05

Applicant: HITACHI, LTD.

Inventor： Takeshi NAKAYAMA ,  Tomihiro HASHIZUME ,  Akira SUGAWARA

IPC: H01J37/18 ,  H01J37/285 ,  H01J37/20

CPC classification number: H01J37/185 ,  G01N23/2204 ,  H01J37/20 ,  H01J37/285 ,  H01J2237/184 ,  H01J2237/204

Abstract: Sample transferring can be securely and easily performed between an FIB device, an electron microscope, and an atom probe device, and atom probe analysis can be performed to a material that easily alters due to atmospheric exposure. A sample holder that holds a sample (12) is provided with an atmosphere-isolation mechanism that prevents the sample from altering due to the atmospheric exposure upon the sample transferring between the devices. There is provided a structure enabling of attaching and detaching a housing (21) of a sample holder leading end of a part of the atmosphere-isolation mechanism in an analytical vacuum device, such as the atom probe device.

Abstract translation: 可以在FIB器件，电子显微镜和原子探针器件之间可靠且容易地进行样品转印，并且可以对由于大气暴露而容易改变的材料进行原子探针分析。 保持样品（12）的样品保持器设置有气氛隔离机构，其防止样品在样品转移之间由于大气暴露而改变。 提供了一种能够在诸如原子探针装置的分析真空装置中附接和分离气氛隔离机构的一部分的样品架前端的壳体（21）的结构。

公开(公告)号：US20170343580A1

公开(公告)日：2017-11-30

申请号：US15533535

申请日：2014-12-24

Applicant: HITACHI, LTD.

Inventor： Sanato NAGATA ,  Tomihiro HASHIZUME ,  Akira NAMBU ,  Hideaki KOIZUMI

IPC: G01Q30/20 ,  G01Q30/14

CPC classification number: G01Q30/20 ,  G01Q30/14 ,  G01Q60/18 ,  G01Q60/24

Abstract: This sample holder for a scanning probe microscope is constituted of (1) a container that retains a liquid and (2) a flat-plate-shaped upper cover that covers an upper opening of the container and that has a narrow slit above the position where a sample is placed. In the upper cover, the slit has a slit width with which a thin film of the liquid is formed over the upper surface of the sample when the liquid fills the space between the container and the upper cover. The thin film of the liquid has a film thickness smaller than the distance between the upper surface of the sample and the upper cover.