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公开(公告)号:US20170115223A1
公开(公告)日:2017-04-27
申请号:US15129287
申请日:2015-03-18
Applicant: Hitachi High-Technologies Corporation
Inventor: Motohiro YAMAZAKI , Yuichiro OTA , Satoshi TAKAHASHI , Yoshitaka KODAMA
IPC: G01N21/64 , G01N27/447
CPC classification number: G01N21/6456 , G01J3/0208 , G01J3/4406 , G01N27/447 , G01N27/44721 , G01N2021/6417 , G01N2021/6471 , G01N2201/06113
Abstract: During analysis of samples of unknown concentration, situations frequently occur in which the dynamic range is insufficient, necessitating reanalysis. Accordingly, a fluorescence spectrometer which splits a single object image into multiple images having different fluorescent intensity by means of image splitting elements, and simultaneously detects the plurality of images obtained thereby in different regions within the same detection plane, is proposed.
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公开(公告)号:US20200209273A1
公开(公告)日:2020-07-02
申请号:US16646622
申请日:2018-11-29
Inventor: Yuichiro OTA , Takaaki HAGIWARA , Yoshihiro YAMASHITA , Koshin HAMASAKI , Michaela WINDFUHR , Heike GUGGEMOS , Johannes STOECKEL , Guenter ZIEGLER , Michael KUEHNL
IPC: G01N35/10
Abstract: The object of the invention is to provide an automatic analysis apparatus capable of setting a dispensing mechanism for measuring dispensing accuracy and a dispensing volume, and capable of performing dispensing accuracy measurement without absorbance measurement. Regarding a dispensing accuracy, a dispensing mechanism to be measured is designated. Parameters including a dispensing volume and the like are input. A dispensing operation of the input dispensing volume is automatically performed for each designated dispensing mechanism. A reaction vessel contains, for example, a reagent of the input dispensing volume which has been dispensed by the designated dispensing mechanism. By measuring a weight of the reagent in the reaction vessel, or the like, it is possible to measure the dispensing accuracy of the designated dispensing mechanism.
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公开(公告)号:US20170362634A1
公开(公告)日:2017-12-21
申请号:US15533087
申请日:2014-12-26
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Yuichiro OTA , Tomohiro SHOJI , Toru YOKOYAMA , Masatoshi NARAHARA
Abstract: The substrate 100 for use in the analysis of a nucleic acid according to the present invention has multiple analysis areas 12 which are partitioned on a substrate 10, and enables the measurement of the analysis areas 12 while interchanging the analysis areas 12 in turn, said substrate 100 being characterized in that each of the analysis areas 12 consists of an adsorption part 13 onto which a DNA fragment or a carrier having the DNA fragment carried thereon can be adsorbed and a non-adsorption part 14 which is a part outside of the adsorption part 13, and the non-adsorption part 14 has, formed on at least a part thereof, a marker part 15 that has a specified shape and helps to identify the positions of the analysis areas 12.
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